Clocked comparator

• US 4,649,293 A
• Filed: 10/31/1985
• Issued: 03/10/1987
• Est. Priority Date: 11/09/1984
• Status: Expired due to Fees

• Current Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Ducourant, Thierry
• Primary Examiner(s): Zazworsky, John
• Application Number:
  US06/793,607
• Time in Patent Office: 495 Days
• Field of Search: 307/350, 307/355, 307/362, 307/530, 307/272 A, 307/291, 307/279, 307/261, 340/347 AD, 340/347 M
• US Class Current: 327/77
• CPC Class Codes: H03K 3/356034 the input circuit having a differential configuration
• CPC Class Codes: H03K 3/3562 of the master-slave type

Abstract

A clocked comparator comprising a comparison stage, for comparing an analog input voltage V_IN with an analog reference voltage V_REF and for supplying. An intermediate signal V_M and its complement V_M, an amplifier stage amplifies the logic states of the intermediate signal. A first and a second latching stage are coupled to the comparison stage and the amplifier stage respectively, for generating and storing the logic states determined by the signals from the comparison stage and the amplifier stage. Each latching stage comprises a differential transistor pair having a common terminal connected to ground. A further differential transistor pair is arranged in parallel with the last-mentioned transistor pair and is controlled by a clock signal C for the first latching stage and by its complement C for the second latching stage. The comparison stage and the amplifier stage are also controlled by the clock signal C and the latching stages are each coupled to the comparison stage and the amplifier stage respectively by means of load resistors. Useful in a digital/analog converter equipped with enhancement-type gallium-arsenide field-effect transistors.

Claims

1. A clocked voltage comparator formed by means of transistors which each have a control electrode, a first main electrode and a second main electrode, said comparator comprising:

a comparison stage for comparing an analog input voltage (V_IN) with an analog reference voltage (V_REF) and deriving an intermediate signal (V_M) and its complement (V_M), which stage comprises two transistors coupled as a differential pair, the input voltage and the reference voltage being applied to respective control electrodes of said transistors, whose first main electrodes are connected to a common terminal for applying a bias current and whose second main electrodes are each coupled to a first d.c. supply terminal via a load and supply the intermediate signal and its complement respectively;

a latching stage coupled to the comparison stage for generating logic states in conformity with the output signals from the comparison stage, said latching stage comprising two transistors coupled together as a second differential pair forming a bistable latch, the signals received from branches of the comparison stage being applied to respective control electrodes of said latching-stage transistors, whose first main electrodes are connected to a common terminal and whose second main electrodes are cross-coupled to the control electrodes of the transistors of the second differential pair to form outputs of said latching stage, characterized in that;

the terminal to which the first differential pair is connected is coupled to a second d.c. supply terminal via a current-source transistor,

the terminal to which the second differential pair is connected is directly connected to the potential on the second d.c. supply terminal,

the second differential pair is coupled to a third differential pair comprising two transistors coupled in parallel with the transistors of the second differential pair, and means for applying a clock signal to the control electrodes of the transistors of said third differential pair.

2. A comparator as claimed in claim 1, wherein the second main electrodes of the transistors of the first differential pair are each coupled to respective control electrodes of the transistors of the second differential pair via respective coupling resistors.

3. A comparator as claimed in claim 1 wherein the current-source transistor of the first differential pair is controlled by the clock signal.

4. A comparator as claimed in claim 1 wherein the current-source transistor of the first differential pair conducts continuously because it is controlled by the potential of a third d.c. supply voltage.

5. A comparator as claimed in claim 1, wherein the load is resistive.

6. A comparator as claimed in claim 1, wherein an inverter/follower stage is connected to each of the outputs of the first latching stage.

7. A comparator as claimed in claim 6, wherein each inverter/follower stage comprises a first transistor operating as an inverter, whose control electrode receives one of the output signals from the latching stage, whose first main electrode is connected to the second d.c. supply terminal, and whose second main electrode is connected to the first d.c. supply terminal via a resistive load, the output signal of the inverter appearing on the second main electrode of said first transistor, and a second transistor operating as a follower, whose control electrode receives the signal from the inverter, whose first main electrode is connected to the second d.c. supply terminal via a resistor, and whose second main electrode is connected to the first d.c. supply terminal, the output signal of each inverter/follower stage appearing on the first main electrode of the follower transistor.

8. A comparator as claimed in claim 7, wherein digital signals from the combination of the comparison stage and latching stage are available at the outputs of the inverter/follower stages connected to the output of the first latching stage.

9. A comparator as claimed in claim 1 wherein the transistors are enhancement-type gallium-arsenide field-effect transistors.

10. A comparator arrangement comprising a comparator as claimed in claim 1 wherein the arrangement further comprises a second comparator of the same structure as the first comparator, in which second comparator

the comparison stage constitutes an amplifier stage which serves to amplify the logic states of a digital signal and its complement received from the first comparator,

the latching stage, which is coupled to the amplifier stage, stores the logic states determined by signals from the amplifier stage, and

the control electrodes of the transistors of the third differential pair of the second comparator receive a complementary clock signal.

11. A comparator as claimed in claim 10, wherein the current-source transistor of the first differential pair of the second comparator is controlled by the complementary clock signal.

12. A comparator arrangement as claimed in claim 10, wherein the current-source transistor of the first differential pair of the second comparator is controlled by the potential of a third d.c. supply.

13. An analog-to-digital converter for obtaining an n-bit digital output signal, wherein the analog-to-digital converter comprises 2ⁿ parallel-connected clocked comparators as claimed in claim 1 and in that the analog input signal to be converted is applied to one input of each comparator and a different reference voltage is applied to the other input of each comparator, the outputs of the comparators being connected to an encoding device whose output supplies the n-bit digital output signal.