Real-time radial shear interferometer

• US 4,653,921 A
• Filed: 09/09/1985
• Issued: 03/31/1987
• Est. Priority Date: 09/09/1985
• Status: Expired due to Fees

• Current Assignee: Lockheed Martin Space Operations Company (Martin Marietta Corporation)
• Original Assignee: Lockheed Martin Space Operations Company (Martin Marietta Corporation)
• Inventors: Kwon, Osuk Y.
• Primary Examiner(s): LaRoche, Eugene R.
• Assistant Examiner(s): Mottola, Steven J.
• Application Number:
  US06/773,908
• Time in Patent Office: 568 Days
• Field of Search: 356/345, 356/352, 356/353, 356/354, 356/355, 356/356
• US Class Current: 356/521
• CPC Class Codes: G01J 9/0215 by shearing interferometric methods

Abstract

A real-time radial shear interferometer for monitoring the quality of the wavefront of an optical beam comprises (with reference to FIG. 3) a pair of beamsplitters (40, 45) and a pair of beam-folding mirrors (44, 46) arranged in Mach-Zehnder format. An afocal telescope (41) and a diffraction grating (30) cause a transmitted component of the beam to be separated into a plurality of diffraction maxima, and an afocal telescope (47) and a diffraction grating (31) cause a reflected component of the beam to be separated into a plurality of diffraction maxima. Diffraction beams formed from the transmitted component of the beam are combined with corresponding diffraction beams formed from the reflected component of the beam to produce a zeroth-order interferogram and positive and negative first-order interferograms. It is shown by Fourier analysis that a phase shift inherently occurs between the zeroth-order interferogram and the positive and negative first-order interferograms produced by optical interference between corresponding zeroth-order and positive and negative first-order diffraction beams.

Claims

1. An apparatus for measuring wavefront phase of an optical beam, said apparatus comprising:

(a) means for splitting said beam into a first component and a second component, said first component propagating along a first optical path and said second component propagating along a second optical path;

(b) diffraction grating means positioned in said first and second optical paths to produce a plurality of spatially separated diffraction beams corresponding to maxima of particular diffraction orders for each of said first and second components;

(c) means for combining diffraction beams for said first component with corresponding diffraction beams for said second component, thereby producing;

(i) a zeroth-order interferogram from combined diffraction beams of zeroth order for said first and second components,

(ii) an interferogram of a specified higher order from combined diffraction beams of positive order of said specified higher order for said first and second components, and

(iii) an interferogram of said specified higher order from combined diffraction beams of negative order of said specified higher order for said first and second components,

said interferograms being produced simultaneously and being spatially separated from each other; and

(d) detector means for simultaneously measuring intensity variations in each of said interferograms.

2. The apparatus of claim 1 wherein said means for combining said diffraction beams produces a zeroth-order interferogram, a positive first-order interferogram and a negative first-order interferogram, said negative first-order interferogram being out of phase by 180°

from said positive first-order interferogram.

3. A radial shear interferometer comprising:

(a) first and second beamsplitters and first and second mirrors disposed in Mach-Zehnder format, said first beamsplitter and said first mirror defining a first arm of said interferometer, said second beamsplitter and said second mirror defining a second arm of said interferometer, said first beamsplitter dividing an input beam into a transmitted component propagated along said first arm of said interferometer and a reflected component propagated along said second arm of said interferometer;

(b) a first afocal telescope disposed in said first arm of said interferometer, and a second afocal telescope disposed in said second arm of said interferometer, said first and second afocal telescopes having different magnification ratios;

(c) a first diffraction grating disposed in said first arm of said interferometer to produce a plurality of spatially separated diffraction beams corresponding to maxima of particular diffraction orders for said transmitted component of said input beam, and a second diffraction grating disposed in said second arm of said interferometer to produce a plurality of spatially separated diffraction beams corresponding to maxima of particular diffraction orders for said reflected component of said input beam, said diffraction beams of said transmitted component being combined by said second beamsplitter with said diffraction beams of said reflected component to produce;

(i) a zeroth-order interferogram from combined diffraction beams of zeroth order for said transmitted and reflected components,

(ii) an interferogram of a specified higher order from combined diffraction beams of positive order of said specified higher order for said transmitted and reflected components, and

(iii) an interferogram of said specified higher order from combined diffraction beams of negative order of said specified higher order for said transmitted and reflected components,

said interferograms being produced simultaneously and being spatially separated from each other; and

(d) detector means for simultaneously measuring intensity variations in each of said interferograms.

4. The interferometer of claim 3 wherein each of said first and second diffraction gratings has a grating period such as to produce a phase shift of π

/2 between said interferogram of positive higher order and said zeroth-order interferogram where said positive higher order is positive first order, and to produce a phase shift of -π

/2 between said interferogram of negative higher order and said zeroth-order interferogram where said negative higher order is negative first order.