Semiconductor memory having multiple level storage structure
First Claim
1. A semiconductor memory having multiple level storage structure at least comprising a memory array including a plurality of memory cells respectively having at least one storage capacitor, an address selecting means which designates location of each memory cell, data lines which transfer data through connections to said memory cells and data writing and reading means being connected to said data lines, said memory further comprisinga means for sequentially applying, on time series basis, different voltages of at least three levels or more to said memory cells,at least a data judging means, a first transfer gate provided between said judging means and data lines and a bias charge supplying means provided between said first transfer gate and the judging means, as said data reading means, anda column register providing at least two or more storage cells which temporarily store said judged data.
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Abstract
In a semiconductor memory includes a memory array consisting of a plurality of memory cells respectively having at least one storage capacitor, an addressing circuit which designates location of each memory cell, data lines which transmit data connected to said memory cells and data writing and reading circuits connected to said data lines. The semiconductor memory has a multiple level storage structure. In particular, the memory includes an arrangement for sequentially applying, on a time series basis, different voltages of at least 3 levels or more to the gate of a switching MOS transistor of said memory cells, a bias charge supplying means as said data reading circuit and a column register providing at least two or more storage cells which temporarily store said data.
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28 Claims
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1. A semiconductor memory having multiple level storage structure at least comprising a memory array including a plurality of memory cells respectively having at least one storage capacitor, an address selecting means which designates location of each memory cell, data lines which transfer data through connections to said memory cells and data writing and reading means being connected to said data lines, said memory further comprising
a means for sequentially applying, on time series basis, different voltages of at least three levels or more to said memory cells, at least a data judging means, a first transfer gate provided between said judging means and data lines and a bias charge supplying means provided between said first transfer gate and the judging means, as said data reading means, and a column register providing at least two or more storage cells which temporarily store said judged data.
Specification