Accelerometer sensor with flat pendular structure

• US 4,663,972 A
• Filed: 03/06/1985
• Issued: 05/12/1987
• Est. Priority Date: 03/06/1984
• Status: Expired due to Term

• Current Assignee: Sextant Avionique
• Original Assignee: Societe Francaise D'Equipements Pour La Navigation Aerienne
• Inventors: Gerard, Marcillat
• Primary Examiner(s): Levy, Stewart J.
• Assistant Examiner(s): NOT, DEFINED
• Application Number:
  US06/708,923
• Time in Patent Office: 797 Days
• Field of Search: 73/517 R, 73/517 B, 73/514, 73/652, 73/, 73/654, 310/329, 338/46, 361/280
• US Class Current: 73/514.21
• CPC Class Codes: G01P 15/02 by making use of inertia forces using solid seismic massesG01P15/14 takes precedence
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/125 by capacitive pick-up
• CPC Class Codes: G01P 15/132 with electromagnetic counterbalancing means
• CPC Class Codes: G01P 2015/0828 the mass being of the paddle type being suspended at one of its longitudinal ends

Abstract

An accelerometer sensor comprising a flat pendular structure having a fixed part and a flat test body suspended from the fixed part by two parallel blades flexible in the plane of said test body, so as to be able to move in translation along a sensitive axis. Said test body extends at least partially into the space between said two flexible blades.

Claims

1. An accelerometer sensor comprising a flat pendular structure made from one and the same crystalline wafer, said structure having in a same plane, a flat fixed part, two parallel blades flexible in the said plane and delimiting therebetween a space, each of said blades having a first end portion fixedly connected to said fixed part, and a second end portion, said structure further comprising a flat test body connected to the second end portions of said blades so as to be suspended from the fixed part and to be able to move in translation in the same plane along a sensitive axis, ssid flat test body extending at least partially into said space, wherein said first end portions of the blades are located at a predetermined level and said test body extends in a zone located below said level, opposite to said second end portions of the blades.

2. An accelerometer sensor comprising a flat pendular structure made from one and the same crystalline wafer, said structure having in a same plane, a flat fixed part, two parallel blades flexible in the said plane and delimiting therebetween a space, each of said blades having a first end portion fixedly connected to said fixed part, and a second end portion, said structure further comprising a flat test body connected to the second end portions of said blades so as to be suspended from the fixed part and to be able to move in translation in the said plane along a sensitive axis, said flat test body extending at least partially into said space, wherein electric connections between the test body and the fixed part of the pendular structure are formed by metallizations formed on the thin faces of said flexible blades.

3. The accelerometer sensor as claimed in claim 2, wherein the center of gravity of the test body is situated in the space between said two flexible blades.

4. The accelerometer structure as claimed in claim 2, wherein said pendular structure is formed by micro-machining from a crystalline wafer.

5. The accelerometer sensor as claimed in claim 2, wherein said test body comprises at least one central recess.

6. The sensor as claimed in claim 2, wherein said test body comprises two parallel faces, said sensor comprising at least one lateral capacitive detector with at least a first capacitor plate carried by one of said faces and at least a second capacitor plate parallel to the first plate and at a small distance therefrom, said second plate being carried by a frame integral with said fixed part of the pendular structure.

7. The sensor as claimed in claim 6, wherein said test body comprises at least a pair of conducting areas forming two capacitor plates which cooperate with a parallel conducting area on said frame.

8. The sensor as claimed in claim 7, wherein said test body comprises a plurality of pairs of conducting areas connected in parallel and forming two square shaped circuits having projections which are intermingled and said pairs of conducting areas each cooperate with a corresponding conducting area on said frame.

9. The sensor as claimed in claim 2, wherein said test body comprises two parallel faces, one of said faces having metallizations which form a flat coil forming part of a return motor used for servo-controlling the sensor.

10. The sensor as claimed in claim 2, wherein said test body comprises two parallel faces having metallizations which form two respective flat coils, said two coils being mounted in series and connected to each other by at least one conducting element passing from one face to the other of said test body.

11. The sensor as claimed in claim 10, wherein said conducting element consists of a metallized hole or a metallized zone on the edge of said test body.

12. The sensor as claimed in claim 2, wherein said test body comprises two parallel faces, said sensor comprising a return motor having at least one flat coil metallized on one of the faces of said test body, said coil comprising at least two opposite rectilinear zones perpendicular to the sensitive axis of the sensor and a magnetic circuit comprising a first part formed by a permanent magnet associated with two pole pieces disposed respectively at right angles to said rectilinear zones of said coil, on a first side of the test body, and a second part consisting of a flux return armature situated on a second side of said test body opposite to the first side.

13. The sensor as claimed in claim 10, wherein one of the two parts of said magnetic circuit is fixed to a base supporting the pendular structure, whereas the other part is integral with a cover which is fixable on said base.

14. An accelerometer sensor comprising a flat pendular structure made from one and the same crystalline wafer, said structure having in a same plate, a flat fixed part, two parallel blades flexible in the said plane and delimiting therebetween a space, each of said blades having a first end portion fixedly connected to said fixed part, and a second end portion, said structure further comprising a flat test body connected to the second end portions of said blades so as to be suspended from the fixed part and to be able to move in translation in the said plane along a sensitive axis, said flat test body extending at least partially into said space, wherein said flat fixed part comprises at least a first edge zone which carries a first metallization and said flat test body comprises at least a second edge zone which carries a second metallization facing the first metallization, said first and second metallizations forming a capacitor whose capacity varies depending on the position of said test body, electric connections between said second metallization and the fixed part of the pendular structure being formed by metallizations provided on the thin faces of said flexible blades.

15. An accelerometer sensor comprising a flat pendular structure made from one and the same crystalline wafer, said structure having in a same plane, a flat fixed part, two parallel blades flexible in the said plane and delimiting therebetween a space, each of said blades having a first end portion fixedly connected to said fixed part, and a second end portion, said structure further comprising a flat test body connected to the second end portions of said blades so as to be suspended from the fixed part and to be able to move in translation in the said plane along a sensitive axis, said flat test body extending at least partially into said space, wherein the test body comprises at least one lateral extension extending above said second end portions of the blades, said lateral extension comprising at least one rectilinear metallized edge perpendicular to the sensitive axis of the pendular structure and the fixed part of said pendular structure comprising at least one metallized rectilinear edge parallel to the metallized edge of said test body and forming therewith a flat capacitor whose capacity varies depending on the position of said test body.

16. The sensor as claimed in claim 15, wherein said lateral extension of the test body comes back towards one of said first end portions.

17. An accelorometer sensor comprising a flat pendular structure made from one and the same crystalline wafer, said structure having in a same plane, a flat fixed part, two parallel blades flexible in the said plane and delimiting therebetween a space, each of said blades having a first end portion fixedly connected to said fixed part, and a second end portion, said structure further comprising a flat test body connected to the second end portions of said blades so as to be suspended from the fixed part and to the able to move in translation in the said plane along a sensitive axis, said flat test body extending at least partially into said space, wherein said test body comprises first and second lateral edges, the first at least of these lateral edges bearing a first metallization and said fixed part of said pendular structure comprises at least one wing which extends between said first lateral edge and a corresponding flexible blade, said wing having an edge facing said first lateral edge and bearing a second metallization, said first and second metallizations forming therewith a flat capacitor whose capacity varies depending on the position of said test body.

18. An accelerometer sensor comprising a flat pendular structure made from one and the same crystalline wafer, said structure having in a same plane, a flat fixed part, two parallel blades flexible in the said plane and delimiting therebetween a space, each of said blades having a first end portion fixedly connected to said fixed part, and a second end portion, said structure further comprising a flat test body connected to the second end portions of said blades so as to be suspended from the fixed part and to be able to move in translation in the said plane along a sensitive axis, said flat test body extending at least partially into said space, wherein said test body comprises a first inner longitudinal edge which presents a crenelated shape having first square projections separated from each other by first square notches, and the fixed part of the pendular structure presents a crenelated shape having second square projections separated from each other by second square notches, said first square projections engaging in said second square notches and said second square projections engaging in said first square notches, said first square projections having first and second lateral edge portions bearing metallizations and said second square projections having third and fourth lateral edge portions bearing metallizations, the metallizations of said first lateral edge portions forming with the metallizations of said fourth lateral edge portions a first plurality of capacitors and the metallizations of said second lateral edge portions forming with the metallizations of said third lateral portions a second plurality of capacitors.