Stress and strain measuring apparatus and method

• US 4,668,086 A
• Filed: 05/20/1985
• Issued: 05/26/1987
• Est. Priority Date: 05/20/1985
• Status: Expired due to Term

• Current Assignee: Salomon Redner
• Original Assignee: Salomon Redner
• Inventors: Redner, Salomon
• Primary Examiner(s): NOT, DEFINED
• Assistant Examiner(s): Koren, Matthew W.
• Application Number:
  US06/736,175
• Time in Patent Office: 736 Days
• Field of Search: 356/367, 356/33, 356/35, 356/327
• US Class Current: 356/33
• CPC Class Codes: G01B 11/18 using photoelastic elements
• CPC Class Codes: G01L 1/241 by photoelastic stress analysis
• CPC Class Codes: G01N 21/23 Bi-refringence

Abstract

Relative retardation resulting from passage of polarized white light through a stressed transparent material is measured automatically, by dividing the emerging polychromatic light into plurality of component beams, each containing one wavelength (or color) only, transforming the light intensity carried by each component beam into an electrical signal, and using these electrical signals to measure the relative retardation, proportional to the stress in the transparent material.

Means are provided to compare the spectral distribution of the light intensity measured at several wavelengths to the calculated distribution using an assumed value of retardation. Iterative (repetitious) calculations are performed until the measured distribution and calculated, using assumed retardation, agree. The retardation yielding agreement with the measured distribution is the measured retardation reflecting the stress in the material.

Claims

1. Apparatus for measuring stress and strain induced birefringence in a light transmitting member, comprising:

a polychromatic light source emanating light;

a lens to direct said emanated polychromatic light in a beam;

a polarizer positioned to intercept said light beam and pass said light beam;

a first quarter-wave birefringent plate arranged to intercept said polarized light beam passed by said polarizer and passing said light beam through at least a portion of said member in which birefringence is to be measured;

a second quarter-wave birefringent plate arranged to intercept said light beam passed through said member in which birefringence is to be measured;

an analyzer consisting of a second polarizer adjacent said second quarter-wave birefringent plate and arranged to intercept said light beam passed by said second quarter-wave birefringent plate and pass it on;

means for splitting the polarized beam passed on by said analyzer into a plurality of component beams each of a different wavelength representative of a specific predetermined color;

photoelectric detector means positioned to receive each one of said component beams, said detector means providing a distinctive individual electrical signal output representative of each specific predetermined color received;

means for receiving each detector electrical output signal and for determining the amplitude thereof as representative of the intensity of light color detected and for storing each said intensity value; and

means for mathematically comparing said stored intensity values in a curve fitting manner against predetermined data for determining the measured retardation, stress and strain magnitude in said member.

2. The apparatus of claim 1 wherein said beam splitting means includes a filter.

3. The apparatus of claim 2 wherein said beam splitting means is a diffraction grating splitting said beam of light into individual component beams each being of a narrow bandwidth.

4. The apparatus of claim 3 also including a plurality of amplifiers each one positioned to receive one of said detector means individual output signals and to said signal amplified to said receiving and determining means.

5. The apparatus of claim 4 wherein said means for mathematically determining stress and strain magnitude includes a computer programmed to solve a system of equations entered thereinto.

6. The apparatus of claim 5 wherein said computer solves said system of equations by an iterative approach.

7. The apparatus of claim 1 wherein said beam splitting means includes an optical splitter simultaneously splitting said light beam into a plurality of component beams and wherein said detector means is an array of individual photo detectors positioned to receive, one each, each of said component beams and for simultaneously each providing an electrical output signal.

8. The apparatus of claim 1 wherein said beam splitting means includes an electrically operated variable wavelength transmitting filter, said variable filter comprising means for changing the selectively transmitted wavelength upon command of control signals obtained from said receiving and determining means, said variable filter being electrically connected to said receiving and determining means.

9. The apparatus of claim 1 wherein said light transmitting member is physically attached to an opaque member wherein stress and strain within said opaque member is transmitted into said light transmitting member.

10. A method of measuring stress magnitude in light transmitting member, comprising the steps of:

(a) providing a source of polychromatic light;

(b) focusing said polychromatic light through a first polarization and quarter wave birefringent plate;

(c) passing said polarized light through said light transmitting member;

(d) passing said light exiting said transmitting member through a second polarizing and quarter wave birefringent plate;

(e) splitting said light emerging from said second polarizing plate into a plurality of component light beams each of different wave lengths;

(f) detecting each said component light beams and providing an individual electrical signal proportional to said component beam intensity;

(g) electronically storing each electrical signal value as representative of each component beam; and

(h) using said stored values to calculate the value of the measured retardation by solving the following equation;

space="preserve" listing-type="equation">I.sub.λ

i =S.sub.λ

(Ii) sin.sup.2 (π

X/λ

i)

wherein X is the sought retardation value, S.sub.λ

is the known calibrating factor, and λ

i is the wavelength of light, in order to determine the value of retardation in the polarized light passing through the said member.