Temperature measuring device

• US 4,669,872 A
• Filed: 10/15/1985
• Issued: 06/02/1987
• Est. Priority Date: 10/17/1984
• Status: Expired due to Fees

• Current Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Original Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Inventors: Ida, Yoshiaki
• Primary Examiner(s): LaRoche, Eugene R.
• Assistant Examiner(s): Pascal, Robert J.
• Application Number:
  US06/787,592
• Time in Patent Office: 595 Days
• Field of Search: 356/43, 356/435, 350/96.15, 350/96.16, 374/131, 374/132, 374/161, 374/162
• US Class Current: 356/43
• CPC Class Codes: G01K 11/12 using changes in colour, translucency or reflectance

Abstract

An optical type temperature measuring device which provides an accurate output in spite of temperature variations of the sensor or degradation of the characteristics of the sensor over time. The device includes a light source, a spectroscope, and a temperature sensor made of a material having one end coupled through a first optical guide to the light source and the other end coupled through another optical guide to the spectroscope. The output of the spectroscope is converted to an electrical signal, which is subsequently detected with plural different comparison levels to obtain higher end values of the absorption wavelength ranges of the sensor at the respective reference levels. These higher end values are then processed to obtain a rising point of a temperature dependent light absorption characteristic curve of the temperature sensor.

Claims

1. A temperature measuring device comprising:

a light source;

a spectroscope;

means for defining an optical path comprising optical fiber means;

a temperature sensor of a material having temperature dependant light absorption characteristics, said temperature sensor having one end coupled through a first portion of said optical path to said light source and the other end to coupled through a second portion of said optical path to said spectroscope;

first means for converting an optical output of said spectroscope into an electrical signal;

second means for detecting said electrical signal with a plurality of different reference levels corresponding to different amounts of light passed through said temperature sensor to obtain wavelength values in absorption wavelength ranges of said temperature sensor, each of said wavelength values corresponding to a respective one of said reference levels; and

third means for processing said wavelength values to obtain on a temperature dependent light absorption characteristic curve of said temperature sensor a shortest wavelength of light that said sensor passes.

2. The temperature measuring device as claimed in claim 1, wherein said second means has two reference levels and said third means comprises means for determining said shortest wavelength from said wavelength values in the absorption wavelength ranges of said temperature sensor according to a linear approximation of said temperature dependent light absorption characteristic curve.

3. The temperature measuring device as claimed in claim 1, further comprising fourth means for intensity modulating said light source, and fifth means for a.c. coupling said output of said spectroscope to said second means.

4. The temperature mesuring device as claimed in claim 3, wherein said fourth means comprises means for driving said light source pulsedly at a predetermined frequency.