Integrated force balanced accelerometer

• US 4,679,434 A
• Filed: 07/25/1985
• Issued: 07/14/1987
• Est. Priority Date: 07/25/1985
• Status: Expired due to Term

• Current Assignee: Litton Systems Incorporated A Corporation OFDE
• Original Assignee: Litton Systems Incorporated
• Inventors: Stewart, Robert E.
• Primary Examiner(s): Levy, Stewart J.
• Assistant Examiner(s): Chapman, Jr., John E.
• Application Number:
  US06/758,692
• Time in Patent Office: 719 Days
• Field of Search: 73/514, 73/516 R, 73/517 R, 73/517 B, 308/2 A
• US Class Current: 73/514.18
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/131 with electrostatic counterbalancing means
• CPC Class Codes: G01P 2015/0828 the mass being of the paddle type being suspended at one of its longitudinal ends
• CPC Class Codes: Y10T 403/54 Flexible member is joint component

Abstract

An accelerometer fabricated from a semiconductor substrate sandwiched between two non-conductive plates is shown having an inertial mass formed by etching the substrate. The mass is joined to the substrate by hinges having crossed blades to provide flexure in one direction and rigidity in other directions. The fabrication technique permits the integration of accelerometer servo and signal processing circuitry upon the same substrate in which the accelerometer mass is formed.

Claims

1. An integrated, force balanced accelerometer, comprising:

capacitance forming means having substantially parallel electrodes;

acceleration sensitive means flexibly mounted between said parallel electrodes in a neutral position;

said acceleration sensitive means formed within a substrate of semiconductor material by forming an opening therein that defines the periphery of said acceleration sensitive means in said substrate to define an inertial mass attached to said substrate by hinge means;

said hinge means, include crossed beam flexure blades formed within said semiconductor substrate;

means for applying a D.C. electrical potential across said parallel electrodes of said capacitance forming means to establish a bias field;

a means for generating A.C. electrical potentials between said acceleration sensitive means and said parallel electrodes, which potential change as said acceleration sensitive means undergoes a displacement from said neutral position; and

electronic means connected between said parallel electrodes of said capacitance forming means and said acceleration sensitive means to close an electrical servo loop therebetween, wherein motion of said acceleration sensitive means causes an output from said electronic means to return said acceleration sensitive means to said neutral position and represent the acceleration of said accelerometer.

2. An integrated, force balanced accelerometer, as claimed in claim 1, additionally comprising:

said acceleration sensitive means formed within said substrate of semiconductor material by doping said material to become conductive;

said capacitance forming means formed by a pair of insulated plates mounted on opposite sides of said semiconductor material and having electrically conductive pads disposed thereon adjacent said acceleration sensitive means.

3. An integrated, force balanced accelerometer, as claimed in claim 1, wherein:

said hinge means include a pair of hinges each having a pair of flexure blades attached to one end of said inertial sensitive mass to support said mass as a cantilevered mass.

4. An integrated, force balanced accelerometer, as claimed in claim 1 wherein:

said crossed beams flexure blades are formed by anisotropic etching of a single crystal that forms said semiconductor substrate.

5. An integrated, force balanced accelerometer, as claimed in claim 1, wherein:

said cross beam flexure blades include at least a pair of blades formed by off-set, V-shaped grooves within opposite surfaces of said semiconductor substrate, each blade arranged at an incline to the plane of said substrate, and at an opposite incline to the angle of the other blade of said pair to form said crossed beam flexure blades.

6. An accelerometer comprising:

a first planar substrate of semiconductor material having an opening therein that defines the periphery of an acceleration sensitive mass;

said acceleration sensitive mass connected to said semiconductor substrate by a plurality of crossed beam flexure blades formed within said substrate;

second and third planar substrates mounted on opposite sides of said first planar substrate each having a conductive surface adjacent said acceleration sensitive mass;

means for applying an electrical potential between said acceleration sensitive mass and said conductive surfaces on said second and third substrates.

7. An accelerometer, as claimed in claim 6, additionally comprising:

means formed within said semiconductor material for controlling the output signal of said accelerometer.

8. An accelerometer, as claimed in claim 6, wherein:

said crossed beam flexure blades provide for a cantilevered flexure in one direction and rigidity in all other directions.

9. An accelerometer, as claimed in claim 6, wherein:

said crossed beam flexure blades are formed in pairs, each blade formed by two V-shaped grooves in opposite surfaces of said semiconductor substrate which form a blade at an angle to the plane of said substrate, each blade of said pair being at an opposite angle to the other.

10. An accelerometer, as claimed in claim 6, wherein:

said acceleration sensitive mass has a waffle-like pattern to create a large surface area-to-mass ratio.

11. An accelerometer, as claimed in claim 6, wherein:

said second and third substrates are formed of nonconductive material.

12. In an accelerometer having a planar inertial mass formed in a plane of semiconductor material and at least one capacitance forming electrode parallel thereto, wherein the improvement comprises:

said inertial mass formed by an opening within said semiconductor plane that defines the periphery of said inertial mass; and

hinge means joining said semiconductor plane to said inertial mass including a plurality of crossed beam flexure blades formed in said semiconductor material.

13. In an accelerometer, as claimed in claim 12, additionally comprising:

said crossed beam flexure blades formed in pairs, each blade formed by two V-shaped grooves in opposite surfaces of said semiconductor plane which form a blade at an angle to said plane, each blade of said pair formed at an opposite angle from said other blade.