Torsion type magnetic field measurement device

• US 4,680,544 A
• Filed: 03/06/1984
• Issued: 07/14/1987
• Est. Priority Date: 03/07/1983
• Status: Expired due to Term

• Current Assignee: Centre Electronique Horloger SA
• Original Assignee: Centre Electronique Horloger SA
• Inventors: Rudolf, Felix
• Primary Examiner(s): Karlsen, Ernest F.
• Assistant Examiner(s): Snow, Walter E.
• Application Number:
  US06/586,815
• Time in Patent Office: 1,225 Days
• Field of Search: 324/244, 324/256, 324/257, 324/258, 324/259, 324/260, 324/261, 324/224, 324/226
• US Class Current: 324/259
• CPC Class Codes: G01R 33/028 Electrodynamic magnetometers

Abstract

A device sensitive to a magnetic field (B) comprising a flap attached to a support by torsion hinges and a conductor. The conductor carries a current I and thus generates under the effect of a magnetic field a force which tends to cause the flap to turn about its hinge axis. The measurement of this rotation or of the compensation required to nullify the effect of the magnetic field (B) constitutes a measure of this magnetic field. Embodiments are disclosed having multi-turn conductors or ferromagnetic coatings instead of conductors on the flaps.

Claims

1. A miniature magnetic-field sensitive device comprising a flap;

a support;

first and second torsion hinges on opposite sides of said flap to attach said flap to said support and defining a hinge axis of rotation for said flap;

a ferromagnetic coating on said flap and magnetized in a direction perpendicular to said axis; and

means on said support for creating a polarization field in the plane of said flap and perpendicular to its hinge axis of rotation, said polarization field magnetizing the ferromagnetic coating.

2. A device according to claim 1, wherein the flap has a symmetrical shape with respect to its hinge axis.

3. A device according to claim 1 wherein the means for creating a polarization field comprise at least one conductive stripe for carrying an electric current, said conductive stripe being disposed on the ferromagnetic coating of the flap so as to magnetize the coating in the plane of the flap and perpendicular to its hinge axis.

4. A device according to claim 3 wherein the conductive stripe forms a plurality of turns.

5. A magnetic field measuring instrument including a magnetic-field-sensitive device according to claim 3 and first means for delivering a signal representing the force generated on the flap by an external magnetic field, wherein said first means comprises:

(a) a conductive stripe situated on a fixed plate opposite the flap; and

(b) means for passing through the conductive stripe a current such that the magnetic field produced compensates the effect of the external magnetic field to be measured, the value of said current constituting a measure of the magnetic field to be measured.

6. A magnetic field measuring instrument including a magnetic-field-sensitive device according to claim 3 and first means for delivering a signal representing the force generated on the flap by a magnetic field, wherein said first means comprise:

(a) at least one electrode which is disposed opposite the flap substantially parallel to its rest position, said electrode constituting a first capacitor plate;

(b) second means forming a second capacitor plate on the flap; and

(c) a circuit connected to the first and second capacitor plates for measuring the variation in the capacitance of the capacitor.

7. A device according to claim 1 wherein the means for creating a polarization field comprise:

(a) a second ferromagnetic coating, said ferromagnetic coating being deposited on the support forming a magnetic circuit with the ferromagnetic coating of the flap; and

(b) at least one conductive turn for carrying an electric current, said conductive turn linking the second ferromagnetic coating to the ferromagnetic coating of the flap, said second ferromagnetic coating creating a polarization field in the ferromagnetic coating of the flap.

8. A magnetic field measuring instrument including a magnetic-field-sensitive device according to claim 7 and first means for delivering a signal representing the force generated on the flap by an external magnetic field, wherein said first means comprise:

(a) a conductive strip situated on a fixed plate opposite the flap; and

(b) means for passing through the conductive strip a current such that the magnetic field produced compensates the effect of the external magnetic field to be measured, the value of said current constituting a measure of the magnetic field to be measured.

9. A magnetic field measuring instrument including a magnetic-field-sensitive device according to claim 7 and first means for delivering a signal representing the force generated on the flap by a magnetic field, wherein said first means comprise:

(a) at least one electrode which is disposed opposite the flap substantially parallel to its rest position, said electrode constituting a first capacitor plate;

(b) second means forming a second capacitor plate on the flap; and

(c) a circuit connected to the first and second capacitor plates for measuring the variation in the capacitance of the capacitor.

10. A magnetic field measuring instrument including a magnetic-field-sensitive device according to claim 1 and first means for delivering a signal representing the force generated on the flap by a magnetic field, wherein said first means comprises:

(a) at least one electrode which is disposed opposite the flap substantially parallel to its rest position, said electrode constituting a first capacitor plate;

(b) second means forming a second capacitor plate on the flap; and

(c) a circuit connected to the first and second capacitor plates for measuring the variation in the capacitance of the capacitor.

11. A measuring instrument according to claim 10, wherein the device is implemented in a silicon substrate and the flap is doped in such manner as to constitute the second capacitor plate.

12. A measuring instrument according to claim 10, wherein the device is implemented in a silicon substrate and the measuring circuit is integrated on the silicon substrate.

13. A magnetic field measuring instrument including a magnetic-field-sensitive device according to claim 1 and first means for delivering a signal representing the force generated on the flap an external magnetic field, wherein the first means comprise:

(a) a conductive stripe situated on a fixed plate oposite the flap; and

(b) means for passing through the conductive stripe a current such that the magnetic field produced compensates the effect of the external magnetic field to be measured, the value of said current constituting a measure of the magnetic field to be measured.

14. A magnetic field measuring instrument including a magnetic-field-sensitive device according to claim 1 and first means for delivering a signal representing the force generated on the flap by a magnetic field wherein the first means comprise at least one first electrode provided on said flap and at least one second electrode fixed relative to said support and means for applying between said at least one first and second electrodes a voltage such that the electric field produced by this voltage generates on the flap a force which compensates the effect of the magnetic field to be measured, the value of the applied voltage constituting a measure of the magnetic field to be measured.

15. A measuring instrument according to claim 14, wherein the flap has a symmetrical shape with respect to its hinge axis of rotation and wherein said at least one second electrode comprises two electrodes disposed on a plate fixed to the support and opposite the ends of the flap.

16. A measuring instrument according to claim 14 wherein said at least one second electrode comprises two electrodes located on opposite sides of the flap.