Interferometric optical path difference scanners and FT spectrophotometers incorporating them

• US 4,684,255 A
• Filed: 07/29/1985
• Issued: 08/04/1987
• Est. Priority Date: 08/09/1984
• Status: Expired due to Term

• Current Assignee: Perkin-Elmer Limited Post Office Lane Beaconsfield Buckinghamshire England
• Original Assignee: Perkinelmer Incorporated
• Inventors: Ford, Michael A.
• Primary Examiner(s): Willis, Davis L.
• Assistant Examiner(s): Koren, Matthew W.
• Application Number:
  US06/760,013
• Time in Patent Office: 736 Days
• Field of Search: 356/346
• US Class Current: 356/455
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes
• CPC Class Codes: G02B 27/108 for sampling a portion of a beam or combining a small beam in a larger one, e.g. wherein the area ratio or power ratio of the divided beams significantly differs from unity, without spectral selectivity
• CPC Class Codes: G02B 27/143 using macroscopically faceted or segmented reflective surfaces
• CPC Class Codes: G02B 27/144 using partially transparent surfaces without spectral selectivity G02B27/147 takes precedence

Abstract

In an interferometric apparatus the path of the output beam of a rotary Optical Path Difference scanning assembly leading to an electrically responsive detector is maintained substantially fixed in space for any scan angle within predetermined limits, thus obviating a serious drawback of a prior art proposal wherein the output beam translates significantly over the detector face with changes in scan angle, with the result that the detector output is vitiated by totally spurious variations of the energy reaching it.

In one embodiment, the scanning assembly comprises a beam splitter having a semi-reflective layer the output face of which cooperates with the face of an output mirror normal thereto, the axis of rotation being substantially coincident with the line of intersection between the prolongation planes of the two faces. A Fourier Transform spectrophotometer embodying the assembly is also described.

Claims

1. Interferometric apparatus comprising:

(a) a rotary O.P.D. scanning assembly mounting a mirror pair formed by a beam splitter and a folding mirror, said beam splitter having a semi-reflective beam-splitting layer one face of which is the optical input surface in accurately parallel face-to-face relationship with said folding mirror and the other the output surface;

(b) two stationary reversing mirrors co-operating with said mirror pair for defining two interferometric arms, each arm receiving one of the two beams resulting from the splitting of an input beam by the beam splitter, for rotationally scanning successive O.P.D. values between the two beams up to a predetermined maximum, and for recombining the beams at said output surface so that they emerge therefrom as a single beam directed along an output path;

(c) an output mirror mounted at right angles to the output surface of said beam splitting layer, said output mirror being borne by the scanning assembly and positioned to receive the output beam; and

(d) pivotal means arranged to ensure that the scanning assembly rotates around an axis substantially coincident with the line of intersection of the prolongation planes of the semi-reflective beam-splitting layer and the face of the output mirror, respectively.

2. Apparatus as claimed in claim 1, wherein the beam splitter has an effective area of generally circular configuration and said apparatus further comprises optical beam control means for projecting onto said input surface an input beam the cross-sectional area of which is an ellipse, the minor axis of the ellipse being chosen so that the distance separating the intercepts of the minor axis extremities with the input surface at two opposite predetermined angular travel limits of the scanning assembly is close to the length of the major axis and at the same time the said cross-sectional area is adequate to provide the desired optical throughput of the apparatus.

3. Apparatus as claimed in claim 2, wherein said apparatus includes a source of light for producing said input beam and the optical beam control means comprise image forming means and a baffle which are located between the source and the beam splitter, the baffle having an elliptical aperture the major and minor axes of which together with the optical arrangement of the image forming means are such that the major and minor axes of the largest projection of said aperture on the semi-transparent layer are approximately equal to the desired major and minor axes, respectively, of the ellipse.

4. Apparatus as claimed in claim 1, wherein the O.P.D. scanning assembly is a pivoted integral casting supporting in predetermined spaced relation the folding mirror, the beam splitter and the output mirror.

5. Apparatus as claimed in claim 4, including a housing in the form of another integral casting wherein the O.P.D. scanning assembly is pivotally mounted, the two stationary reversing mirrors being fixed to said housing.

6. Apparatus as claimed in claim 5, wherein in the operative attitude of the apparatus the axis of rotation of the O.P.D. scanning assembly is generally vertically oriented, said axis spanning an upper and a lower pivotal connection between the two castings, the upper connection comprising a cylindrical member fixed to one casting radially biassed into a V-shaped bearing provided in a member fixed to the other casting.

7. Apparatus as claimed in claim 6, wherein the lower pivotal connection is of the type wherein by virtue of its own weight the pivoted casting creates a centralizing force component restraining all radial movement thereof as mechanical wear takes place.

8. Apparatus as claimed in claim 1, including a base plate and a housing for said O.P.D. scanning assembly resiliently mounted on said base plate.

9. Apparatus as claimed in claim 8, wherein a photosensitive device is attached to the base plate for receiving the output beam from the output mirror.

10. Apparatus as claimed in claim 1, wherein the semi-reflective layer is held between two rigid supports transparent to the input beam and having identical optical characteristics.

11. Apparatus as claimed in claim 1, wherein the semi-reflective layer is supported on a thin taut film transparent to the input beam.

12. Apparatus as claimed in claim 1, wherein the semi-reflective layer is a specular foraminous structure, which is semi-reflective by virtue of the lack of reflection from the open spaces in said structure.

13. Apparatus as claimed in claim 12, wherein said structure is self-supporting.

14. Apparatus as claimed in claim 12, wherein said structure is supported on a transparent taut film.

15. Apparatus as claimed in claim 14, wherein said structure is in the form of a layer vacuum evaporated on said film.

16. Apparatus as claimed in claim 1, wherein said apparatus is an FT spectrophotometer including a Michelson-type interferometer and a detector for receiving the output beam and transducing the optical interferograms conveyed by said beam into an electrical representation.

17. Apparatus as claimed in claim 16, comprising;

a reference interferometer, incorporated within the Michelson-type interferometer, having a laser source for providing a narrow, plane-polarized, monochromatic beam;

means for directing the laser beam through the O.P.D. scanning assembly along a path shared with the input beam, split beams and output beam up to and including a portion of the output path emerging from the output mirror;

means for diverting the laser beam past the output mirror into a path distinct from the remainder of the output path leading to the detector;

means for circularly polarizing the laser beam and thus producing two optical interferograms of the laser beam 90 degrees apart;

a two-channel photoelectric transducer for transducing the said optical interferograms, one in each channel, into corresponding electrical sine waves 90 electrical degrees apart keyed to the angular travel of the scanning assembly;

means for utilizing the sine waves for controlling the acquisition timing of data points from the detector output representing an analytical interferogram; and

means for performing the Fourier Transform of the analytical interferogram and thus producing an electrical representation of the spectrum of a sample under analysis.