Free space microscope digitizing aid

• US 4,686,639 A
• Filed: 02/07/1985
• Issued: 08/11/1987
• Est. Priority Date: 02/07/1985
• Status: Expired due to Fees

• Current Assignee: Rockwell International Corporation
• Original Assignee: Rockwell International Corporation
• Inventors: Johnson, Charles A., Young, Jerald A.
• Primary Examiner(s): Gruber, Felix D.
• Assistant Examiner(s): Juffernbruch, Daniel W.
• Application Number:
  US06/699,285
• Time in Patent Office: 915 Days
• Field of Search: 364/559, 364/561, 364/562, 364/525, 364/191, 364/516, 367/99, 367/108, 367/124, 367/129, 356/375, 181/124, 358/101, 901/46, 901/47
• US Class Current: 702/152
• CPC Class Codes: H05K 13/0815 Controlling of component placement on the substrate during or after manufacturing
• CPC Class Codes: H05K 13/082 Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays

Abstract

There is disclosed an inspection system which allows the visual inspection of an item and the automatic recordation of the position of a defect or other inspection characteristic in the plane of inspection. In the visual inspection of an electronic circuit card, the card is inserted into a holder which maintains the card in a reference plane which is fixed relative to a plurality of sonic emitters. A microscope or other viewing device is fixed in a predetermined position on a support structure and includes cross hairs or other indicia to allow the visual identification of a particular point on an item that is to be visually inspected. A plurality of sonic receivers are coupled in predetermined positions on the support structure to receive sonic energy generated by the emitters. A manual control is coupled to initiate the production of sonic energy from the emitters while a digitizer and programmed microprocessor are coupled to receive signals from the sonic receivers in order to make a calculation of the position of each point visually observed on the inspection item. A complete history of the identified characteristics of an inspected item can be identified and stored with only simple movement of an item in the holder beneath the microscope to allow fast and easy visual inspection of a given item.

Claims

1. An inspection system comprising:

means for retaining an item to be inspected in a position to define a plane of inspection;

at least three sonic emitters coupled to said means for retaining in fixed relationship with respect thereto;

means for viewing a point on said item to be inspected;

means for energizing said sonic emitters to generate sonic energy;

at least three separate receivers for receiving sonic energy from said at least three sonic emitters;

means responsive to said means for energizing, said sonic emitters, and said receivers for defining a line of sight including said point of observation and for calculating the point of intersection of that line of sight with said plane defined by the item to be inspected to define the position of said point of intersection on said plane.

2. The system of claim 1 wherein said means for retaining includes a movable holding structure configured to define a first holding plane which retains an item such that it forms a plane of inspection parallel to said holding plane and defines a second plane perpendicular to said first plane, said at least three sonic emitters being mounted in said second plane.

3. The system of claim 2 wherein said first and second planes are orthogonal.

4. A method for inspecting an item comprising:

positioning an item to be inspected to define a plane of inspection;

positioning at least three sonic emitters in fixed relation with respect to said plane of inspection and movable therewith;

positioning at least three receivers in fixed relationship with respect to one another;

defining a line of sight intersecting said plane of inspection;

viewing said item at a point of intersection between said line of sight and said plane of inspection;

energizing said sonic emitters to produce sonic energy; and

receiving said emitted sonic energy at said at least three receivers; and

calculating the position of said point of intersection derived from said received sonic energy and representing the intersection of said line of sight with said plane of inspection.

5. The method of claim 4 wherein said step of defining a line of sight comprises:

viewing at least one sonic emitter at an upper position along said line of sight and calculating its position;

viewing said at least one sonic emitter along said line of sight at a lower position and calculating its position; and

calculating a line forming said line of sight interconnecting said upper and lower positions.

6. The method of claim 4 wherein said steps of receiving and calculating comprise:

receiving sonic energy representing the position of a known point on said item of inspection located at the intersection of said line of sight and said plane of inspection; and

calculating the position of any identified position of the intersection of said line of sight and said plane of inspection with respect to said known position.

7. The method of claim 4 further comprising maintaining said sonic emitters in a common plane perpendicular to said plane of inspection.

8. The method of claim 4 further comprising enclosing said sonic emitters and receivers within an enclosure shielded from temperature variations and air currents.

9. The method of claim 4 wherein said step of viewing comprises viewing said item through a microscope having cross hairs defining said point of viewing.