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Near infrared measuring instrument with sample holder

  • US 4,692,620 A
  • Filed: 05/31/1985
  • Issued: 09/08/1987
  • Est. Priority Date: 05/31/1985
  • Status: Expired due to Term
First Claim
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1. A near infrared measuring instrument for measuring a constituent of a material, the instrument being of the type having a source of near infrared radiation, a detector for near infrared radiation, a means for holding a sample between the source and the detector, and means for data processing connected to the detector to read the detector and measure a constituent in a sample of the material by the amount of near infrared radiation transmitted through the sample, with the improvements comprising:

  • (a) means for providing a plurality of different predetermined uniform thicknesses of samples to be measured, comprising at least one cuvette for holding a sample between the source and the detector, the cuvette having opposing faces with at least a portion thereof being transparent to near infrared radiation, the cuvette providing at least one predetermined uniform thickness between the source and the detector in order to hold a predetermined uniform thickness of sample,(b) means for moving the cuvette relative to the near infrared radiation source and the detector and for stepwise placing a plurality of locations of the radiation-transparent portion of the cuvette and the at least one predetermined uniform thickness of sample into relative stationary alignment between the source and the detector,(c) means for reading the detector when the cuvette is stationary, and(d) means in the cuvette for measuring the temperature of the sample.

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