Current sensor adjustment and test apparatus

• US 4,692,697 A
• Filed: 07/29/1985
• Issued: 09/08/1987
• Est. Priority Date: 07/29/1985
• Status: Expired due to Fees

• Current Assignee: AG Communication Systems Corp. (Nokia Corporation)
• Original Assignee: GTE Communication Systems Corporation (Verizon Communications Inc.)
• Inventors: Bray, Bernard D.
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US06/760,228
• Time in Patent Office: 771 Days
• Field of Search: 324/158 R, 324/418, 324/424, 324/202, 324/205, 324/74, 364/571
• US Class Current: 324/756.05
• CPC Class Codes: G01R 35/00 Testing or calibrating of apparatus covered by the other groups of this subclass
• CPC Class Codes: G01R 35/005 Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence

Abstract

An apparatus for testing current sensors employing an electromagnetic coil and one or more Hall Effect switches including a microprocessor controlling a constant current source and visual and audio indicating circuits. A parameter input circuit is provided to permit an operator to select device types and to select test only, or adjustment and test sequences to be executed. The constant current source is adapted to apply a threshold, must-not-operate, and a must-operate current values to the electromagnetic coil. The visual and audio indicating circuits are adapted to provide messages, pass/fail indications, and audio signals signaling test success or failure results to an operator.

Claims

1. Apparatus for adjusting and checking a current sensor including a Hall Effect Switch and an electromagnetic coil for operating said switch, said apparatus comprising:

a microprocessor connected to said current sensor;

a constant current source;

a test power source including a ground terminal and a power terminal; and

said constant current source including a digital-to-analog converter connected to said microprocessor, an operational amplifier connected via a noninverting input to an output of said converter, a current pass transistor including a base terminal connected to an output of said operational amplifier and having a collector terminal connected to a first terminal of an electromagnetic coil of said current sensor under test, and at least one constant sensing element including a first terminal connected to an emitter terminal of said current pass transistor and also to an inverting input of said operational amplifier, said current element including a second terminal connected to said test power source ground terminal; and

said coil connected to said power source power terminal via a second terminal;

said constant current source, operated in response to said microprocessor to apply at least a first and a second current value to said coil, said coil generating magnetic flux of different levels in response to said first and said second current values, said Hall Effect switch transmitting a first output signal to said microprocessor in response to the presence of a magnetic flux within a first predetermined range, and in the alternative said Hall Effect switch operated to transmit a second output signal to said microprocessor in response to the presence of magnetic flux within a second predetermined range;

indicating means connected to said microprocessor, operated in response to said microprocessor receiving at least one of said output signals to provide an indication of the operation of said sensor.

2. An apparatus as claimed in claim 1, wherein:

said apparatus includes test fixture means, said test fixture means adapted to accept said current sensor and establish electrical connections thereto.

3. An apparatus as claimed in claim 2, wherein:

said test fixture means includes retaining means operated to a first position to permit insertion of said current sensor into said test fixture means and said retaining means further operated to a second position to retain said current sensor in position.

4. An apparatus as claimed in claim 3, wherein:

said test fixture means further includes a fixture closed detector connected to said microprocessor, said detector operated in response to positioning said retaining means in said first position and in the alternative, to said second position to indicate status of said first position and in the alternative, status of said second position to said microprocessor.

5. An apparatus as claimed in claim 2, wherein:

said current sensor under test includes at least one Hall Effect switch including an output, and said test fixture means includes at least one switch signal conditioning circuit connected between said switch output and said microprocessor, said signal conditioning circuit operated in response to output signals of said switch to transmit said output signals to said microprocessor while isolating said switch output from said microprocessor.

6. An apparatus as claimed in claim 4, wherein:

said apparatus further includes a start circuit including a latch connected to said detector, and a single pulse generator connected between an output of said latch and an interrupt input of said microprocessor, said detector operated in response to positioning said retaining means to said first position to operate said latch to a first state, said detector further operated in response to positioning said retaining means to said second position to operate said latch to a second state, and said single pulse generator operated in response to said latch second state to transmit an interrupt pulse to said microprocessor interrupt input.

7. An apparatus as claimed in claim 1, wherein:

said constant current sensing element includes a first resistor and a second resistor each connected via a different first terminal to said pass transistor emitter terminal, and said constant current source includes a range select circuit connected to said microprocessor and connected between a second terminal of each of said first and said second resistors and said power source ground terminal, said range select circuit operated in response to a first select signal from said microprocessor to connect said first resistor to said ground terminal and disconnect said second resistor from said ground terminal and in the alternative, said range select circuit operated in response to a second select signal from said microprocessor to disconnect said first resistor from said ground terminal and to connect said second resistor to said ground terminal.

8. An apparatus as claimed in claim 7, wherein:

said range select circuit includes a relay including an operate coil connected to said microprocessor, a set of break contacts connected between said first resistor second terminal and said power source ground terminal and a set of make contacts connected between said second resistor second terminal and said power source ground terminal.

9. An apparatus as claimed in claim 1, wherein:

said indicating means includes a visual indicating circuit and an audio indicating circuit, each connected to said microprocessor.

10. An apparatus as claimed in claim 9, wherein:

said audio indicating circuit includes a audible sounder

11. An apparatus as claimed in claim 9, wherein:

said visual indicating circuit includes a message display circuit connected to said microprocessor, said message display circuit operated to generate instructional and advisory messages.

12. An apparatus as claimed in claim 11, wherein:

said message display circuit includes a message display panel connected to said microprocessor and a segment driver connected between said microprocessor and said message display panel.

13. An apparatus as claimed in claim 9, wherein:

said visual indicating circuit includes a pass/fail indicating circuit connected to said microprocessor, said pass/fail indicating circuit operated to a first state in response to a microprocessor successful test signal and in the alternative, said pass/fail indicating circuit operated to a second state in response to a microprocessor test failure signal.

14. An apparatus as claimed in claim 13, wherein:

said pass/fail indicating circuit includes an all-tests-pass indicating light-emitting diode and a test failure indicating light-emitting diode.

15. An apparatus as claimed in claim 1, wherein:

said apparatus includes a microprocessor reset circuit connected to said microprocessor, said reset circuit operated to generate a reset pulse to a reset input of said microprocessor to thereby reset said microprocessor.

16. An apparatus as claimed in claim 15, wherein:

said reset circuit includes a reset signal generator including an output connected to said microprocessor reset input.

17. An apparatus as claimed in claim 16, wherein:

said reset circuit includes a manual circuit including a grounding switch and said reset signal generator includes an AND gate connected between said single pulse generator output and said microprocessor, said manual circuit grounding switch including a connection to a second input of said AND gate.

18. An apparatus as claimed in claim 17, wherein:

said reset circuit includes a power up circuit including a capacitor connected between ground and a third input of said AND gate.

19. An apparatus as claimed in claim 1, wherein:

said apparatus includes a test select circuit including a three position grounding switch including a first and a second connection to a first and a second sensing input of said microprocessor, respectively;

said test select circuit switch operated to a first position to ground said first microprocessor sensing input, said switch operated to a second position to leave ungrounded both of said microprocessor inputs, and said switch operated to a third position to ground said second microprocessor sensing input.

20. An apparatus as claimed in claim 1, wherein:

said apparatus includes a device select circuit including a three position grounding switch including a first and a second connection to a first and a second sensing input of said microprocessor, respectively;

said test select circuit switch operated to a first position to ground said first microprocessor sensing input, said switch operated to a second position to leave ungrounded both of said microprocessor inputs, and said switch operated to a third position to ground said second microprocessor sensing input.

21. An apparatus as claimed in claim 16, wherein:

said apparatus includes a test fixture means including a current sensor retaining means and a fixture closed detector, said apparatus further including a start circuit including a fixture closed latch connected to said detector, said apparatus still further including a reset single pulse generator disable circuit including an OR gate and a NAND gate, said OR gate including a first and a second input connected to said microprocessor and an output connected to a second input of said NAND gate, said NAND gate including an output connected to an input of said reset single pulse generator and a first input connected to said fixture closed latch output;

said detector operated in response to closing said test fixture to operate said latch to a set state and thereby generate a signal to said NAND gate to disable said reset single pulse generator while said test fixture is closed, and said detector further operated in response to opening of said test fixture to operate said latch to a reset state and thereby generate a signal to said NAND gate to enable and activate said reset single pulse generator to generate a reset pulse to reset said microprocessor.