Vehicle performance analyzer

• US 4,694,687 A
• Filed: 04/17/1986
• Issued: 09/22/1987
• Est. Priority Date: 04/17/1986
• Status: Expired due to Term

• Current Assignee: Minnetonka Warehouse Supply Incorporated
• Original Assignee: Vericom Corporation
• Inventors: Bonin, Wayne A., Teder, Rein S., McCumber, Roger D.
• Primary Examiner(s): MYRACLE, JERRY
• Application Number:
  US06/853,236
• Time in Patent Office: 523 Days
• Field of Search: 73/116, 73/517 R, 73/178 T, 364/426
• US Class Current: 73/114.24
• CPC Class Codes: G01P 1/127 for acceleration values
• CPC Class Codes: G01P 15/125 by capacitive pick-up

Abstract

A capacitive accelerometer system for detecting changes in G-forces and for producing a digital count value proportional to such changes. An oscillator-driven capacitive transducer of a unique design produces a voltage variation whose amplitude and frequency characteristics are a function of the direction and magnitude of the applied G-forces. The transducer itself comprises a pair of spaced-apart parallel plates disposed on opposite sides of a beam-supported movable plate which responds to changes in acceleration forces. The modulated signal is then demodulated and applied by a semiconductor switch actuated by a pulse from a microprocessor to a voltage-controlled current source. The current source varies the discharge rate of a precision capacitor. When the voltage on the capacitor drops to a predetermined threshold, an interrupt signal is presented to the microprocessor which had been counting one microsecond pulses from its internal clock during the period between the actuation of the semiconductor switch and the generation of the interrupt. The count is then inversely proportional to the shift in capacitance of the transducer which, in turn, is proportional to the G-forces applied to it.

Claims

1. A vehicle performance analyzer, comprising:

(a) electrical transducer means for sensing acceleration and deceleration forces and producing electrical signals proportional to said forces;

(b) pulse producing means coupled to said transducer means for converting said electrical signals into a pulse whose width is proportional to said acceleration and deceleration forces;

(c) microprocessor means, including counting means, coupled in controlling relation to said pulse producing means for converting the pulse from said pulse producing means into a digital quantity;

(d) manually operable switch means coupled to said microprocessor means for entering commands into said microprocessor means for directing the nature of the computations to be performed using said digital quantity as an operand; and

(e) display means for visually indicating results of said computations.

2. A vehicle performance analyzer, comprising:

(a) an electrical transducer means including a first stationary metallic member and a second metallic plate supported in parallel, spaced relation relative to said stationary plate for movement toward and away from said stationary plate when subject to acceleration and deceleration forces having a component in a direction normal to the plane of said plate for producing electrical signals proportional to said forces;

(b) pulse producing means coupled to said transducer means for converting said electrical signals into a pulse whose width is proportional to said acceleration and deceleration forces;

(c) microprocessor means, including counting means, coupled in controlling relation to said pulse producing means for converting the pulse from said pulse producing means into a digital quantity;

(d) manually operable switch means coupled to said microprocessor means for entering commands into said microprocessor means for directing the nature of the computations to be performed using said digital quantity as an operand; and

(e) display means for visually indicating results of said computations.

3. The performance analyzer as in claim 2 wherein said transducer means includes a first planar substrate having a pattern of metallization on each major surface thereof;

a second planar metallic substrate having a pattern of slits extending therethrough for flexibly supporting a generally planar mass segment;

a third planar substrate having a pattern of metallization of each major surface thereof; and

fourth and fifth planar substrates, each having a central opening therethrough, the opening being larger than the size of said mass segment, said first, second, third, fourth and fifth substrates being laminated in stacked relation with said fourth and fifth planar substrates being disposed on opposite sides of said second substrate.

4. A performance as in claim 2 and further including an oscillator for applying an alternating current carrier signal between said stationary plate and said movable plate, said alternating current carrier signal being amplitude modulated by movement of said movable plate.

5. A performance analyzer as in claim 4 and further including a synchronous demodulator coupled to said oscillator and operative to receive said amplitude modulated alternating current signal for producing a direct current voltage in accordance with the modulation envelope.

6. The performance analyzer as in claim 5 wherein said pulse producing means comprises:

a timing capacitor;

a source of reference voltage;

semiconductor switching means for selectively coupling said source of reference voltage to said timing capacitor;

a precision current source connected to receive said direct current voltage produced by said synchronous demodulator as a controlling signal and connected in circuit with said timing capacitor whereby the discharge time of said timing capacitor is varied in accordance with said controlling signal.

7. The performanc analyzer as in claim 6 wherein said microprocessor means control the on/off state of said semiconductor switching means.

8. The performance analyzer as in claim 7 and further including comparator means coupled to said timing capacitor for producing an output signal when the voltage on said timing capacitor drops below a predetermined threshold;

and means for supplying said output signal from said comparator means to said microprocessor.