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Heating oven

  • US 4,695,707 A
  • Filed: 08/12/1985
  • Issued: 09/22/1987
  • Est. Priority Date: 10/06/1984
  • Status: Expired due to Fees
First Claim
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1. A heating oven for testing of semiconductors comprising:

  • a heating chamber for receiving a plurality of containers, said containers having a first portion for receiving semiconductors to be tested and a second portion containing test control apparatus for said semicondutors;

    the chamber having a wall in the form of a heat barrier, said heat barrier defining apertures at spaced intervals to allow independent passage therethrough of each of said containers between a first position in which the portion for receiving semiconductors is fully out of the chamber and a second position in which the portion for receiving semiconductors is fully in the heating chamber;

    wherein a portion of each said container intermediate said first and second portions porvides a closure which forms a heat barrier for a corresponding aperture in the second position of said container.

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