Multibeam measuring device

• US 4,699,514 A
• Filed: 10/23/1984
• Issued: 10/13/1987
• Est. Priority Date: 02/25/1983
• Status: Expired due to Term

• Current Assignee: Richard Distl, Ulrich Schmidt
• Original Assignee: Richard Distl, Ulrich Schmidt
• Inventors: Schmidt, Ulrich, Distl, Richard
• Primary Examiner(s): Rosenberger, R. A.
• Application Number:
  US06/668,276
• Time in Patent Office: 1,085 Days
• Field of Search: 356/367, 356/435, 356/364, 356/365, 356/366, 356/368, 356/369, 356/370
• US Class Current: 356/367
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G02B 27/1086 operating by diffraction only
• CPC Class Codes: G02B 27/144 using partially transparent surfaces without spectral selectivity G02B27/147 takes precedence

Abstract

Multibeam measuring device for the real time polarimetric analysis of samples (6), wherein a linearly polarized measuring beam (M) is separated after having traversed the sample (6) by means of a first separation blade (8), preferably a diffraction unit, into a reference beam (R) and at least one test beam (P). Photodiodes (10, 12) record the intensities of both partial beams between which a certain ratio is established, an analyzer (14) with fixed throughpass direction being inserted downstream of a photodiode (12). The intensity value of the test beam (P) which is standardized by the formation of the ratio as a function of the intensity of the reference beam (R) is inputted into a digital data processing unit (24). For the ratio formation, an analog-digital converter (22) is used and provided downstream of the digital data processing unit (24).

Claims

1. A multibeam measuring device for the polarimetric, real time analysis of a sampel (6), comprising

(a) means (4) for linearly polarizing a measuring beam (M) and passing said measuring beam (M) through the sample;

(b) a first beam separator means (8) for separating said measuring beam (M) into at least three partial beams representing the total radiation cross-section of the measuring beam (M), comprising at least a reference beam (R), a first test beam (P), and a second test beam (P);

(c) means for impinging the reference beam (R) upon a first photosensitive sensor (10), and for impinging the first test beam (P) upon a second photosensitive sensor (12), and for impinging the second test beam (P) upon a third photosensitive sensor (26);

(d) a first analyzer (14) interposed to receive the first test beam (P) ahead of the second photosensitive sensor (12), said first analyzer (14) having a direction of throughpass which is a preselected fixed orientation different from the orientation of said means (4) for linearly polarizing;

(e) a second analyzer (28) interposed to receive the second test beam (P) ahead of the third photosensitive sensor (26), said second analyzer (28) having a direction of through pass which is a preselected fixed orientation different from the orientation of said first analyzer (14);

(f) a measuring circuit having respective inputs connected to receive signals from said first, second and third photosensitive sensors (10, 12,

     26) and having means for developing signals representative of the respective polarimetric magnitude associated with said sample (6), including

(1) a respective first, second and third short term memory (16, 18,

     32), each connected to receive a signal from a respective first, second or third sensor (10, 12,

     26), and a first control circuit means for synchronizing the signals into each short term memory;

(2) at least one real time division circuit (22) connected to said short term memories, having means for forming at least one ratio signal by developing the ratio of the signals from the second to the first short term memory and/or the ratio of the signals from the third to the first short term memory;

(3) a second control circuit (30) connected to said real time division circuit (22) for selectively gating the at least one ratio signal to a second control circuit output, said second control circuit having at least one comparison stage and a controllable switching device connected to said second control circuit output, whereby the at least one comparison stage compares the intensities of the first and second test beams stored in the second and third short term memories after the said at least one ratio signal has been formed, by comparing the said at least one ratio signal with a preestablished upper intensity value Eo and a preestablished lower intensity value Eu, said at least one comparison stage developing an output signal for controlling the switching of the said at least one ratio signal to a data processor;

(4) a data processor (24) connected to the second control circuit (30) output, and having means for storing and outputting said at least one ratio signal in digital form.

2. The device of claim 1, wherein each of said short term memories (16, 18, 32) further comprise an analog sample and hold circuit.

3. The device of claim 1, wherein said at least one real time division circuit (22) further comprises an analog to digital (A/D) converter having at least two inputs.

4. The device of claim 3, wherein the A/D converter inputs further comprises a reference input (REF) and a measuring input (AIN) and the reference input is connected to a short term memory associated with the reference beam (R) and the measuring input is connected to a short term memory associated with a test beam (P,P).

5. The device of claim 3, further comprising an instrument amplifier disposed ahead of said A/D converter, said amplifier being programmable in amplication.

6. The device of claim 1, wherein said first beam separator means (8) further comprises a diffraction device.

7. The device of claim 6, wherein said diffraction device further comprises a phase screen.

8. The device of claim 7, wherein said phase screen further comprises a holographically produced screen with imaging characteristics.

9. The device of claim 7 or 8, wherein the phase screen further comprises a pass profile which is disposed symmetrically to said measuring beam (M).

10. The device of claim 1, wherein the first and second analyzers (14, 28) further comprise one analyzer having a throughpass direction angle of 22.5°

relative to the passthrough direction the means (4) for linearly polarizing, and the other analyzer having a throughpass direction angle of 45°

relative to said one analyzer.

11. The device of claim 1, further comprising means for expanding the measurement range to an amount greater than 180°

, comprising

(a) a second beam separator means (66) disposed ahead of said sample (6), having means for decoupling at least one sub-beam (N) from the measuring beam (M), and for passing said at least one sub-beam (N) through said sample over a path having a different length than the path of said measuring beam (M);

(b) means for dividing said at least one sub-beam (N) by said first beam separator means (8) into a reference beam (R_N) and at least one test beam (P_N, P_N);

(c) means for impinging the reference and test beams (R_N, P_N, P_N) upon further photosensitive sensors (10_N, 12_N, 26_N) respectively associated with each of the beams;

(d) a short term memory connected to each of the sensors (10_N, 12_N, 26_N); and

(e) means for processing in said data processor (24) values associated with the outputs of said sensors (10_N, 12_N, 26_N), including calculating rotational values associated with said sub-beams and combining the results thereof with calculated rotational values associated with the measuring beam (M).

12. The device of claim 1, further comprising a semiconductor laser means for generating said measuring beam (M).

13. The device of claim 1, further comprising a white light source means for generating said measuring beam (M), said white light source having acoustico-optical tunable filters having respective control inputs connected to said data processor (24).

14. The device of claim 1, further comprising at least one temperature controller means for controlling the temperature of at least one element, said temperature controller means including a Peltier element controllably driven by said data processor (24).