High-density electronic modules--process and product

• US 4,706,166 A
• Filed: 04/25/1986
• Issued: 11/10/1987
• Est. Priority Date: 04/25/1986
• Status: Expired due to Term

• Current Assignee: Aprolase Development Co LLC (Intellectual Ventures LLC)
• Original Assignee: Irvine Sensors Corp.
• Inventors: Go, Tiong C.
• Primary Examiner(s): Envall, Jr., Roy N.
• Application Number:
  US06/856,835
• Time in Patent Office: 564 Days
• Field of Search: 361/387, 361/403, 361/400, 361/392, 361/393, 361/386, 361/388, 357/75, 250/578
• US Class Current: 361/771
• CPC Class Codes: H01L 2225/06517 Bump or bump-like direct electrical connections from device to substrate
• CPC Class Codes: H01L 2225/06527 Special adaptation of electrical connections, e.g. rewiring, engineering changes, pressure contacts, layout
• CPC Class Codes: H01L 2225/06551 Conductive connections on the side of the device
• CPC Class Codes: H01L 2225/06582 Housing for the assembly, e.g. chip scale package [CSP]
• CPC Class Codes: H01L 25/0657 Stacked arrangements of devices
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
• CPC Class Codes: H05K 5/0091 Housing specially adapted for small components for resistors H01C; for capacitors H01G; for integrated circuits H01L23/00

Abstract

A high-density electronic module is disclosed, which is suitable for use as a DRAM, SRAM, ROM, logic unit, arithmetic unit, etc. It is formed by stacking integrated-circuit chips, each of which carries integrated circuitry. The chips are glued together, with their leads along one edge, so that all the leads of the stack are exposed on an access plane. Bonding bumps are formed at appropriate points on the access plane. A supporting substrate, formed of a light transparent material, such as silicon, is provided with suitable circuitry and bonding bumps on its face. A layer of insulation is applied to either the access plane or the substrate face, preferably the latter. The bonding bumps on the insulation-carrying surface are formed after the insulation has been applied. The substrated face is placed on the access plane of the stack, their bonding bumps are microscopically aligned, and then bonded together under heat and/or pressure. A layer of thermally conductive (but electrically non-conductive) adhesive material is inserted between the substrate and stack. The substrate and stack combination is then placed and wire bonded in a protective container having leads extending therethrough for external connection.

Claims

1. A method for fabricating a module containing high-density electronic circuitry, comprising:

providing a plurality of integrated circuit chips, each having a multiplicity of closely-spaced electrical leads at an access side thereof;

stacking and bonding the integrated circuit chips in a structure having an access plane which includes the access sides of the stacked chips, on which plane there is a two-dimensional array of closely-spaced electrical leads;

forming on the access plane, in electrical contact with the leads a plurality of conductive lines and a plurality of conductive terminals;

providing a substrate adapted to support the stacked chips and having printed thereon circuitry including a plurality of conductive lines and a plurality of conductive terminals;

the conductive terminals on the access plane being located in precise matched relationship with the conductive terminals on the substrate;

covering either the substrate or the access plane with a layer of insulation having openings therethrough matched to the conductive terminals thereon;

depositing electrically conducting bonding bumps on the conductive terminals of both the access plane and the substrate;

aligning the bonding bumps on the substrate with those on the access plane; and

using heat and/or pressure to bond the aligned bonding bumps together, thereby providing a plurality of spaced electrical connections between the access plane and the substrate.

2. The method of claim 1 wherein the substrate is transparent to certain radiation wavelengths, and alignment of the bonding bumps on the access plane with those on the substrate is accomplished by directing such radiation through the side of the substrate opposite its circuit-carrying side.

3. The method of claim 1 wherein the space remaining between the access plane and the substrate after the bump bonding process is filled with a thermally-conductive, electrically-non-conductive adhesive.

4. The method of claim 1 which also comprises:

providing a container inside which the bonded substrate and stacked chips are located, the container having electrical leads extending therethrough; and

electrically connecting electrical conductors on the substrate to the electrical leads extending through the container.

12. The method of claim 1 in which the bonding bumps on both the access plane and the substrate are formed of indium.

13. The method of claim 3 in which the bonding bumps on both the access plane and the substrate are formed of indium.

14. The method of claim 1 in which the bonding bumps on both the access plane surface and the substrate surface are deposited on their respective terminals by:

depositing a layer of photo-resist on the surface;

selectively exposing and developing the photo-resist to make it removable only at the terminals;

removing the photo-resist at the terminals;

depositing a layer of bonding-bump material covering the photo-resist layer and the exposed terminals; and

lifting the photo-resist off the surface in order to remove all of the bonding bump material except the bumps which contact the terminals.

5. A high-density electronic module comprising:

a plurality of IC chips, each having electrical leads extending to one side of the chip;

the chips being secured together to provide an integrated stack, in which all the electrical leads extend to a single two-dimensional access plane;

a supporting substrate which has electrical circuitry thereon, and which is adapted to provide a support for the stacked chips;

a first group of bonding bumps deposited on the access plane of the stack;

a second group of bonding bumps deposited on the substrate;

insulation on either the stack or the substrate which covers its surface except for the bonding bumps;

each bonding bump on the stack being bonded to a bonding bump on the substrate, thereby providing electrical contact between the stack and substrate at selected terminals.

6. The module of claim 5 which also comprises:

a layer of thermally-conducting adhesive material between the stack and the substrate except where the bonding bumps are in interengagement.

7. The module of claim 5 which also comprises:

a container which encloses the stack-substrate combination; and

electrical leads which are in contact with leads on the substrate, and which extend through the container to provide external terminals.

8. The module of claim 6 which also comprises:

a container which encloses the stack-substrate combination; and

electrical leads which are in contact with leads on the substrate, and which extend through the container to provide external terminals.

9. The module of claim 8 in which the container is formed of metal, and is insulated from the electrical leads which extend through it.

10. The module of claim 5 wherein the electronic circuitry provides:

circuitry on the substrate adapted to interconnect the chips in pairs, with no crossover of pair-interconnect leads;

two row access leads, each of which provides a common bus to half of the chips; and

column access leads, each of which provides a common bus to all of the chips.

11. The module of claim 10 in which the circuitry on the substrate comprises:

a first U-shaped line interconnecting the two end chips;

a second U-shaped line located inside the first line and interconnecting the two chips closest to the respective end chips;

one or more additional U-shaped lines each interconnecting the two chips closest to the chips of the previous line; and

a final line interconnecting the two chips which are adjacent to one another.

15. The module of claim 5 in which the bonding bumps on both the access plane and the substrate are formed of a highly ductile metal.

16. The module of claim 15 in which the bonding bump material is indium.

17. The module of claim 5 in which the stack of chips includes:

one or more spare chips which are available as redundant replacements for non-functioning chips.