×

Calibrated automatic test system

  • US 4,724,378 A
  • Filed: 07/22/1986
  • Issued: 02/09/1988
  • Est. Priority Date: 07/22/1986
  • Status: Expired due to Term
First Claim
Patent Images

1. An automatic test system for testing an electronic device comprising:

  • a. a programmable test station for generating test function digital codes;

    b. a test head having;

    a plurality of output pin means for connection to a device disposed to be tested; and

    a plurality of CMOS integrated circuit means, a different one of which is coupled to each of said plurality of output pin means, each for providing test signals to a different pin of said device under test;

    c. external calibration means selectively connectable to each of said output pin means of said test head for receiving said test signals and for deriving therefrom error correction factors for calibrating each of said CMOS integrated circuit means; and

    d. error correction memory means for storing said error correction factors therein and for altering said test function digital codes from said test station with said error correction factors to produce intermediate signals which cause the correct test signal to be applied to each output pin when said intermediate signals are each applied to said plurality of CMOS integrated circuit means.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×