Relay multiplexing for circuit testers

• US 4,724,379 A
• Filed: 06/26/1987
• Issued: 02/09/1988
• Est. Priority Date: 03/14/1984
• Status: Expired due to Fees

• Current Assignee: Teradyne Incorporated
• Original Assignee: Teradyne Incorporated
• Inventors: Hoffman, Mark S.
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US07/067,159
• Time in Patent Office: 228 Days
• Field of Search: 324/73 R, 324/73 AT, 324/73 PC, 324/158 F, 371/15, 371/16, 371/20
• US Class Current: 307/115
• CPC Class Codes: G01R 31/2808 Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards probe, multiprobe, probe manipulator or probe fixture G01R1/067
• CPC Class Codes: H04M 3/26 with means for applying test signals or for measuring

Abstract

Relay multiplexer circuitry for making a limited number of test channels connectable to a large number of test pins through relays connected to selected test channel nodes and test pin nodes, each test pin node being connectable to a unique combination of test channel nodes within a group of pin nodes, channel nodes and relays, the number of pin nodes connectable to each channel node being substantially uniform within a group to efficiently use channels to reduce the possibility of conflict.

Claims

1. Relay multiplexer circuitry for selectively connecting channels of a tester to selected test pins electrically connected to nodes of a circuit under test, said pins being larger in number than said channels, said circuitry comprising

channel nodes connected to said channels,

pin nodes connected to said pins, and

relays wired for selectively making at least some of said pin nodes connectable to at least two said channels each so as to connect a said pin node to a said channel node when said relay is closed and not connect a said pin node to a said channel when said relay is open,

at least some of said pin nodes, channel nodes and relays being wired so as to be organized in a group such that each said pin node of said group is connectable through single said relays to a unique combination of said channel nodes within said group and is not connectable through single said relays to other said channel nodes within said group, the number of pin nodes P in said group being greater than the number of channel nodes C in said group,

said unique combinations of channel nodes in said group including less than the fully combinatorial set of combinations,

the number of pins connectable to each said channel in said group being substantially uniform to efficiently use the channels so as to reduce the possibility of conflict.

2. The circuitry of claim 1 wherein the number of pin nodes connectable to each channel node does not vary by more than one in said group.

3. The circuitry of claim 2 wherein the number of pin nodes connectable to each channel node is the same.

4. The circuitry of claim 1 wherein there are two channels per pin.

5. Relay multiplexer circuitry for selectively connecting channels of a tester to selected test pins electrically connected to nodes of a circuit under test, said pins being larger in number than said channels, said circuitry comprising

channel nodes connected to said channels,

pin nodes connected to said pins, and

relays wires for selectively making at least some of said pin nodes connectable to at least two said channels each so as to connect a said pin node to a said channel node when said relay is closed and not connect a said pin node to a said channel node when said relay is open,

at least some of said pin nodes, channel nodes and relays being wired so as to be organized in a first group such that each said pin node of said first group is connectable through single said relays to a unique combination of said channel nodes within said first group and is not connectable through single said relays to other said channel nodes within said group, the number of pin nodes P in said first group being greater than the number of channel nodes C in said first group.

at least some of said pin nodes, channel nodes and relays being organized in a second group, the number of pins connectable to each said channel in said second group being substantially uniform to efficiently use the channels so as to reduce the possibility of conflict.

6. The circuitry of claim 5 wherein said unique combinations of channel nodes in said first group are fully combinatorial.

7. The circuitry of claim 6 wherein the number of pin nodes of said second group connectable to each channel node of said second group does not vary by more than one in said second group.

8. The circuitry of claim 7 wherein the number of pin nodes of said second group connectable to each channel node of said second group is the same.

9. The circuitry of claim 5 wherein there are two channels per pin.