Edge interference filter for optical communication transmission in wavelength-division multiplex
First Claim
1. In an edge interference filter for optical communication transmission in wavelength-division multiplex, said filter comprising a layer sequence arranged between adjacent outer media, said layer sequence being composed of alternately arranged layers with high index of refraction and layers with low index of refraction wherein the two outer layers of the layer sequence adjacent to the outer media are layers of the high index of refraction, the improvements comprising said layer sequence being composed of a total of 23 alternate layers, each of the high index of refraction layers being composed of a material having an index of refraction of 2.08±
- 0.05, each of the low index refraction layers being composed of a material having an index of refraction of 1.45±
0.05, the individual layers have an optical layer thickness standardized at 1/4 wavelength of an attenuation band center wavelength of 1260 nm at a 20°
angle of incidence with the thickness of the layers having an allowable deviation of at most 2%, said layers having the following thicknesses, the first and twenty-third layers having a thickness of 1.146 of the standardized thickness, the second and twenty-second layers having a layer thickness of 0.909 of the standardized thickness, the third and twenty-first layers having a layer thickness of 1.039 of the standardized thickness, the fourth and twentieth layers having a layer thickness of 0.932 of the standardized thickness and the remaining fifth through nineteenth layers having a constant thickness of one standardized thickness.
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Abstract
An edge interference filter transmitting short-wave for great interchannel spacing of about 200 nm given an attenuation band wavelength of about 1300 nm. The filter is composed of a layer sequence of a total of 23 alternately high and low refractive index layers wherein the high index of refraction layers have an index of refraction of 2.08 and the low index of refraction layers have an index of approximately 1.45, the effective optical layer thickness of the individual layers is standardized to a 20° angle of incidence and to 1/4 wavelength of the attenuation band center wavelength of 1260 nm with to layers 1 and 23 having a thickness of 1.146, layers 2 and 22 having a thickness of 0.909, layers 3 and 21 having a thickness of 1.039, layers 4 and 20 having a thickness of 0.932 and layers 5-19 having a thickness of 1.
30 Citations
1 Claim
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1. In an edge interference filter for optical communication transmission in wavelength-division multiplex, said filter comprising a layer sequence arranged between adjacent outer media, said layer sequence being composed of alternately arranged layers with high index of refraction and layers with low index of refraction wherein the two outer layers of the layer sequence adjacent to the outer media are layers of the high index of refraction, the improvements comprising said layer sequence being composed of a total of 23 alternate layers, each of the high index of refraction layers being composed of a material having an index of refraction of 2.08±
- 0.05, each of the low index refraction layers being composed of a material having an index of refraction of 1.45±
0.05, the individual layers have an optical layer thickness standardized at 1/4 wavelength of an attenuation band center wavelength of 1260 nm at a 20°
angle of incidence with the thickness of the layers having an allowable deviation of at most 2%, said layers having the following thicknesses, the first and twenty-third layers having a thickness of 1.146 of the standardized thickness, the second and twenty-second layers having a layer thickness of 0.909 of the standardized thickness, the third and twenty-first layers having a layer thickness of 1.039 of the standardized thickness, the fourth and twentieth layers having a layer thickness of 0.932 of the standardized thickness and the remaining fifth through nineteenth layers having a constant thickness of one standardized thickness.
- 0.05, each of the low index refraction layers being composed of a material having an index of refraction of 1.45±
Specification
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- Resources
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Current AssigneeSiemens AG
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Original AssigneeSiemens AG
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InventorsMahlein, Hans F.
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Primary Examiner(s)NOT, DEFINED
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Assistant Examiner(s)Lerner, Martin
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Application NumberUS06/906,212Time in Patent Office529 DaysField of Search350/1.1, 350/1.6, 350/164, 350/166US Class Current359/588CPC Class CodesG02B 5/285 comprising deposited thin s...
