Device for testing high-pressure lamps and components used therewith

• US 4,730,163 A
• Filed: 03/13/1985
• Issued: 03/08/1988
• Est. Priority Date: 03/13/1985
• Status: Expired due to Fees

• Current Assignee: LJM Electronic Devices Corporation
• Original Assignee: LJM Electronic Devices Corporation
• Inventors: Santos, Luis S.
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): BURNS, WILLIAM
• Application Number:
  US06/711,474
• Time in Patent Office: 1,091 Days
• Field of Search: 315/307, 324/133, 324/403, 324/408, 324/410, 324/414, 340/641, 340/642, 340/653
• US Class Current: 324/414
• CPC Class Codes: G01R 31/245 Testing of gas discharge tubes
• CPC Class Codes: G01R 31/44 Testing lamps

Abstract

A circuit for testing high-pressure lamps and components used therewith includes standard components which form a conventional high-pressure lamp circuit. The components can be replaced by components under test. Circuits are provided to prevent damage to the device as a result of malfunctions or of normal operation of the components. Provisions are made for measuring efficiency of various lamp systems.

Claims

1. A portable test device for use in dynamic testing of circuit components of a high-pressure ionized vapor luminaire, such as a sodium vapor lamp, said circuit components including a photoelectronic switch, a tank circuit, a ballast, a voltage multiplier starter circuit, and a said high-pressure ionized vapor luminaire, said test device including:

a first test section incorporating a selectively replaceable photoelectronic switch, said photoelectronic switch being substitutable by said photoelectronic switch of said circuit components, said first test section including means for indicating the extent of operability of a said photoelectronic switch inserted into said first test section;

a second test section connected in parallel with said first test section and incorporating a selectively replaceable tank circuit device, said selectively replaceable tank circuit device being substitutable by said tank circuit device of said circuit components, and, said second test section including means for indicating the extent of operability of a said tank circuit device inserted into said second test section;

a third test section connected in series relation with said second test section, said third test section incorporating one of a plurality of selectively replaceable ballast circuits, said ballast of said circuit components being substitutable for said one selectively replaceable ballast circuit, and, means for indicating the extent of operability of said selected ballast circuit inserted into said third test section;

a fourth test section connected in parallel with said third test section and incorporating a selectively replaceable voltage multiplier starter circuit, said voltage multiplier starter circuit being replaceable by said voltage multiplier starter circuit of said circuit components, and, means for indicating the extent of operability of the selected voltage multiplier starter circuit inserted into said fourth test section;

a fifth test section connected in parallel with said fourth test section, and incorporating a selectively replaceable high-pressure ionized vapor luminaire, said luminaire being replaceable by said luminaire of said circuit components, said fifth test section including a device connected in parallel with said voltage multiplier starter circuit, for giving an audible warning of excessive voltage developed by said voltage multiplier starter circuit.

whereby, any one of said circuit components of said luminaire can be selectively inserted into said test device in combination with any other component of said luminaire in order to prove out the respective circuit components of said luminaire, each said circuit component being replaceable in said test device by a standard component of determined characteristics and known operability.

2. The test device of claim 1, further including a step-down transformer interposed in a power supply line to said device.