Tri-level resist process for fine resolution photolithography

• US 4,732,841 A
• Filed: 03/24/1986
• Issued: 03/22/1988
• Est. Priority Date: 03/24/1986
• Status: Expired due to Term

• Current Assignee: National Semiconductor Corporation (Texas Instruments, Inc.)
• Original Assignee: Fairchild Semiconductor Corporation (ON Semiconductor Corporation)
• Inventors: Radigan, Kenneth J.
• Primary Examiner(s): Bowers, Jr., Charles L.
• Application Number:
  US06/843,340
• Time in Patent Office: 729 Days
• Field of Search: 430/311, 430/312, 430/313, 430/314, 430/323, 430/324, 430/325, 430/322
• US Class Current: 430/311
• CPC Class Codes: G03F 7/094 Multilayer resist systems, e.g. planarising layers

Abstract

A multilayer photoresist system for defining very small features on a semiconductor substrate relies on forming a planarization layer directly over the substrate. An image transfer layer is formed over the planarization layer, and a photoresist imaging layer formed over the image transfer layer. The image transfer layer comprises an organic or inorganic resin which has been cured in a non-oxidated plasma. It has been found that such a curing technique provides a particularly smooth and defect-free image transfer layer. Very thin photoresist imaging layers may thus be formed over the image transfer layer, allowing very high lithographic resolution in the imaging layer. The resulting high resolution openings may then be transferred downward to the image transfer layer and planarization layer by etching, allowing the formation of very small geometries on the substrate surface.

Claims

1. A method for defining very small features on a semiconductor substrate, said method comprising:

forming a planarizing layer on the substrate to a thickness sufficient to planarize topographic features on the substrate;

forming an image transfer layer over the planarizing layer, by applying a curable liquid silicone resin over the substrate;

curing the image transfer layer in a non-oxidizing plasma;

forming an imaging layer over the cured image transfer layer, said layer being a photoresist and having a thickness below 0.5 μ

m;

patterning the imaging layer by photolithography;

transferring the pattern in the imaging layer to the image transfer layer;

transferring the pattern in the image transfer layer to the planarizing layer; and

defining features on the substrate based on the pattern in the planarizing layer.

2. A method as in claim 1, wherein the planarizing layer is an oven-cured organic resin applied by spinning.

3. A method as in claim 2, wherein the organic resin is a positive photoresist.

4. A method as in claim 1, wherein the silicone resin is a linear or cross-linked polydialkylsiloxane.

5. A method as in claim 1, wherein the image transfer layer is cured in a barrel-type plasma reactor at a pressure below about 5 Torr.

6. A method as in claim 5, wherein the non-oxidizing plasma is selected from the group consisting of nitrogen, argon, and helium plasmas.

7. A method as in claim 1, wherein the imaging layer is a positive photoresist.

8. A method as in claim 1, wherein the features formed on the substrate are metallization lines.

9. A method as in claim 1, wherein the metallization lines have a width below about 1 μ

m.

10. A method as in claim 1, wherein the silicone resin is applied as a liquid by spinning.