Quantitative near-infrared measurement instrument for multiple measurements in both reflectance and transmission modes

• US 4,734,584 A
• Filed: 09/16/1986
• Issued: 03/29/1988
• Est. Priority Date: 09/16/1986
• Status: Expired due to Fees

• Current Assignee: Trebor Industries Incorporated (Brownie's Marine Group Incorporated)
• Original Assignee: Trebor Industries Incorporated (Brownie's Marine Group Incorporated)
• Inventors: Rosenthal, Robert D.
• Primary Examiner(s): Howell, Janice A.
• Assistant Examiner(s): NOT, DEFINED
• Application Number:
  US06/907,889
• Time in Patent Office: 560 Days
• Field of Search: 250/343, 250/344, 250/349, 250/428, 250/358.1, 356/437, 356/436, 356/440, 356/244, 356/73
• US Class Current: 250/343
• CPC Class Codes: B07C 2501/009 Sorting of fruit
• CPC Class Codes: G01N 2021/1742 either absorption or reflection
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/359 using near infrared light
• CPC Class Codes: G01N 21/474 Details of optical heads therefor, e.g. using optical fibres

Abstract

A near-infrared quantitative measurement instrument allows measurement in either reflectance or transmission modes depending upon a sample holder which is loaded in a sample chamber. The instrument has means for detecting in both the reflectance mode and the transmission mode, and the particular sample holder used determines in which mode the measurement is made.

Claims

1. An instrument for making quantitative measurements of a sample using near-infrared radiation and detectors therefor, the instrument being capable of making such measurements by either transmission through the sample or reflectance from the sample, the instrument comprising:

(a) a housing member,

(b) a sample chamber within the housing, the sample chamber having near-infrared transparent windows therein and being hollow and capable of accepting removable sample holders,

(c) a source of near-infrared radiation directed on an optical axis toward the sample chamber and normally passing through the NIR-transparent windows of the sample chamber,

(d) an NIR transmission detection means on the side of the sample chamber opposite the source of NIR radiation,

(e) an NIR reflectance detection means on the same side of the sample chamber as the source of NIR radiation,

(f) a first sample holder means for insertion into the sample chamber and adapted to hold and position a sample therein a condition specifically suited to the reflection of the NIR radiation from a surface thereof for the measurement of the magnitude of such reflection; and

(g) a second sample holder means for insertion into the sample chamber and adapted to allow transmission of the NIR radiation therethrough and to hold and position a sample therein in a condition specifically suited to the transmission of the NIR radiation through the sample and the measurement of the magnitude of such transmission.

2. An instrument as in claim 1 wherein the first sample holder means includes NIR-radiation-transparent windows on one side only so that NIR radiation will not pass through the chamber and will be reflected from the surface thereof, and the second sample holder means includes NIR-radiation-transparent windows on opposite sides thereof along the optical axis so that NIR radiation will pass through the sample holder.

3. An instrument as in claim 2 wherein all windows of the sample holders and sample chamber are near-infra-red quartz.

4. An instrument as in claim 3 further comprising wire mesh on a window in front of a silicon detector that passes most near-IR energy and yet absorbs most electro-magnetic energy that would interfere with the detector'"'"'s signal.

5. An instrument as in claim 2 further comprising means for moving at least one of sample holders within the sample chamber during measurement thereon.

6. An instrument as in claim 2 further comprising a reflectance standared for use with the NIR reflectance detection means.

7. An instrument as in claim 6 wherein the reflectance standard is moved by a sample holder moving means for alternately moving the reflectance standard or at least one of the sample holders onto the optical axis.