Solid-state imager defect corrector

• US 4,739,495 A
• Filed: 09/25/1985
• Issued: 04/19/1988
• Est. Priority Date: 09/25/1985
• Status: Expired due to Fees

• Current Assignee: RCA Corporation (General Electric Company)
• Original Assignee: RCA Corporation (General Electric Company)
• Inventors: Levine, Peter A.
• Primary Examiner(s): Gruber, Felix D.
• Application Number:
  US06/779,862
• Time in Patent Office: 937 Days
• Field of Search: 364/571, 364/521, 358/163, 358/167, 358/212, 358/213
• US Class Current: 348/247
• CPC Class Codes: H04N 25/68 applied to defects

Abstract

A defect corrector for a solid-state imager having a number of defective pixels less than the total number of pixels in the imager in which only defect correction signals associated with the defective pixels are generated. The defect correction signals are then combined with photoresponse signals from the corresponding defective pixels, so as to provide a defect compensated photoresponse signal for each of the defective pixels.

Claims

1. Imaging apparatus, comprising:

solid state imaging means including an array of photosensitive elements for providing image-representative signal including nonimage-representative signal components, said photosensitive elements include a certain group of member elements, less in number than the total number of photosensitive elements in said array, having nonimage-representative signal component amplitudes which deviate by at least a given amount from a reference level;

means providing a pluarlity of element location signals which identify the locations in said array of members of said certain group of photosensitive elements;

means providing respective correction signals for member photosensitive elements in said certain group, said correction signals having an amplitude related to the deviation of the nonimage-representative signal components from said reference level;

means responsive to said image-representative signals and said element location signals for combining respective ones of said correction signals with corresponding image-representative signals identified by said element location signals in a manner to provide an output signal compensated for the deviation of said nonimage-representative signal components of said certain group of photosensitive elements; and

means responsive to said nonimage-representative signal components of said array and said element location signals for periodically updating the amplitude of said correction signals.

2. The imaging apparatus according to claim 1 wherein:

said means for providing said correction signals includes a reprogrammable memory means having an information input and said correction signal updating means includes a correction signal generator coupled between an output of said solid state imaging means and the said information input of said memory means.

3. The imaging apparatus according to claim 2 wherein:

said memory means is a digital memory, analog-to-digital converter means coupled between said correction signal generator and said memory information input, and digital-to-analog converter means coupled between an output of said memory means and said signal combining means.

4. The imaging apparatus according to claim 3, in which the nonimage-representative elements of said certain group are widely spaced about said array, wherein said memory and said analog-to-digital converter means have operating times on the order of two orders of magnitude slower than an imaging apparatus in which said elements of said certain group are closely spaced.

5. The imaging apparatus according to claim 2 wherein:

said correction signal generator includes means for providing respective correction signal outputs representative of the difference between the magnitude of the nonimage-representative signal component of given ones of the photosensitive elements of said certain group and the average magnitude of the nonimage-representative signal components of the other photosensitive elements of said array.

6. The imaging apparatus according to claim 5 wherein:

said means providing correction signal outputs includes a signal difference circuit having first and second inputs and an output coupled to said memory means, respective first and second signal sampling means coupled to said first and second inputs of said difference circuit, and one of said signal sampling means including filter means for providing an average of the nonimage-representative components of photosensitive elements preceding a given one of said certain group of photosensitive elements.

7. The imaging apparatus according to claim 1 wherein:

said means for updating said correction signals includes means for preventing light from being received by the photosensitive elements of said array.

8. Apparatus according to claim 1 wherein:

each one of said nonimage-representative signal component amplitudes of said certain group of photosensitive elements has an amplitude level which deviates from an average amplitude level of nonimage-representative signal components from other photosensitive elements in said array; and

respective ones of said correction signals have an amplitude level representative of said respective deviations.

9. Apparatus according to claim 8 wherein:

said nonimage-representative signal components substantially comprise a photosensitive element dark current response; and

said average amplitude level corresponds to the average amplitude of the dark current response of photosensitive elements which neighbor photosensitive elements of said certain group.

10. Apparatus according to claim 1 wherein:

said combining means subtracts said correction signal from said imager-representative signal for each photosensitive element of said certain group.

11. Apparatus according to claim 1 wherein said combining means comprises:

a difference circuit having a first input responsive to the output of said imaging means; and

a gate having an input coupled to receive said correction signals, an output coupled to a second input of said difference circuit and a control input coupled to receive said element location signals for selectively controlling the conduction of said gate.

12. Apparatus according to claim 1 further including:

means for providing a temperature signal identifying the present temperature of said imaging means; and

said means for sequentially providing said correction signal is responsive to said temperature signal for causing said correction signals to vary in accordance with variations in the present temperature of said imaging means.

13. Apparatus according to claim 1 wherein said means for providing said element location signals comprises:

a location memory having data stored therein representative of the location of said photosensitive elements in said group;

reading means coupled to said location memory for causing the data corresponding to respective photosensitive elements to be sequentially read out;

a source of at least one clock signal coupled to said imaging means for causing said imaging means to sequentially supply samples corresponding to respective photosensitive elements of said array from which said image-representative signal is derived;

counter means responsive to said clock signal for operating synchronously with said imaging means so as to provide signals representing the locations of the photosensitive elements corresponding to the sequentially supplied samples; and

a comparator responsive to said data read out from said location memory and said location representative signals from said counter means for developing said element location signals when said data read out from said location memory and one of said location representative signals correspond to the same photosensitive element, said reading means being coupled to said comparator and being responsive to the generation of said element location signals for incrementing said sequential readout of said location memory.