Clock signal generating circuit for dynamic type semiconductor memory device

• US 4,739,502 A
• Filed: 08/07/1986
• Issued: 04/19/1988
• Est. Priority Date: 08/14/1985
• Status: Expired due to Fees

• Current Assignee: Fujitsu Limited
• Original Assignee: Fujitsu Limited
• Inventors: Nozaki, Shigeki
• Primary Examiner(s): Fears, Terrell W.
• Application Number:
  US06/894,148
• Time in Patent Office: 621 Days
• Field of Search: 365/154, 365/189, 365/230, 365/182, 365/233
• US Class Current: 365/233.1
• CPC Class Codes: G11C 11/4076 Timing circuits for regeneration management G11C11/406
• CPC Class Codes: G11C 8/18 Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals

Abstract

A clock signal generating circuit for a dynamic type semiconductor memory device including an input voltage level control unit for converting a transistor-transistor-logic (TTL) drive level to a metal-oxide-semiconductor (MOS) drive level during transmission of an address strobe signal; an address buffer control unit for generating an address signal and an inverted address signal in response to a trailing edge of the address strobe signal, a clock signal generating unit for generating a clock signal used for a word line selection and an input signal for a next stage in response to a low level of the address strobe signal, and an inhibiting unit for inhibiting a drive of the word line by the clock signal when the address strobe signal is at high level in the timing of a leading edge of the clock signal.

Claims

1. A clock signal generating circuit for a dynamic type semiconductor memory device comprising:

an input voltage level control means for converting a transistor-transistor-logic (TTL) drive level to a metal-oxide-semiconductor (MOS) drive level during transmission of an address strobe signal,

an address buffer control means for generating an address signal and an inverted address signal in response to a trailing edge of the address strobe signal,

a clock signal generating means for generating a clock signal used for a word line selection and an input signal for a next stage in response to a low level of the address strobe signal, and

an inhibiting means for inhibiting a drive of the word line by the clock signal when the address strobe signal is at high level in the timing of a leading edge of the clock signal.

2. A clock signal generating circuit as claimed in claim 1, wherein said inhibition means comprises an inverter for inverting the address strobe signal, and an AND gate for outputting a word line selection signal based on both high levels of the clock signal and the inverted address strobe signal.

3. A clock signal generating circuit as claimed in claim 1, wherein said inhibiting means comprises a time out unit for treating the high level of the address strobe signal as the low level of the address strobe signal during a predetermined period, and an AND gate for outputting the word line selection signal based on high levels of both the clock signal and inverted time out signal.

4. A clock signal generating circuit as claimed in claim 1, wherein said inhibiting means comprises a time out unit for treating the high level of the address strobe signal as the low level of the address strobe signal during a predetermined period, an AND gate for outputting the word line selection signal based on high levels of both the clock signal and the inverted time out signal, and an inverter for inverting the address strobe signal.

5. A clock signal generating circuit as claimed in claim 4, wherein said word line selection signal from the AND gate is fed back to the time out circuit.

6. A clock signal generating circuit as claimed in claim 1, wherein said active restore signal is fed back to the inhibiting means.