Ultrasonic flaw detecting system

• US 4,742,713 A
• Filed: 03/02/1987
• Issued: 05/10/1988
• Est. Priority Date: 06/01/1984
• Status: Expired due to Fees

• Current Assignee: Omron Tateisi Electronics Co. (Omron Corporation)
• Original Assignee: Omron Tateisi Electronics Co. (Omron Corporation)
• Inventors: Abe, Akira, Ishida, Isamu, Katsumata, Kaneyoshi
• Primary Examiner(s): Tokar, Michael J.
• Assistant Examiner(s): Arana, Louis M.
• Application Number:
  US07/021,576
• Time in Patent Office: 435 Days
• Field of Search: 73/620, 73/618, 73/621, 73/627, 73/629, 73/633, 364/507
• US Class Current: 73/620
• CPC Class Codes: B82Y 15/00 Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
• CPC Class Codes: G01N 29/265 by moving the sensor relative to a stationary material
• CPC Class Codes: G01N 29/30 Arrangements for calibrating or comparing, e.g. with standard objects

Abstract

An ultrasonic flaw detecting system comprises a manual scanning unit equipped with a probe and capable of producing a probe position data signal, an ultrasonic flaw detector for transmitting an ultrasonic signal to the probe and producing flaw detection data on the basis of a reflection echo signal as received, and a data collecting/recording unit for receiving the flaw detection data from the ultrasonic flaw detector and the probe position data from the manual scanning unit to record both data on an external recording medium, wherein the scanning unit, the ultrasonic flaw detector and the data collecting/recording unit constitute a portable flaw detection data collecting apparatus. The data stored on the external recording medium can be loaded in a data processing apparatus installed at a predetermined location independent of the portable flaw detection data collecting apparatus to be thereby automatically processed for obtaining various information of flaw possibly present within an object to be tested. Due to the provision of the manually manipulatable scanning unit, the scanning operation for searching flaws can be effected in a flexible manner when compared with the conventional autonatic scanning unit, whereby flaw detection can be accomplished with an improved accuracy and high reliability.

Claims

1. A method of locating a flaw position in a weld line of a material to be tested with an ultrasonic scanning unit comprising the steps of:

placing said scanning unit having a probe over said material to be tested at a random angle relative to said weld line, said probe producing probe position data including data of displacements of said probe along an X-axis and a Y-axis and a rotational angle of Θ

axis;

aligning a beam index P of said probe with a first reference point A on said weld line of said material to be tested, and reading positional coordinates of said first reference point A in an X and Y coordinate system;

aligning said beam index P of said probe with a second reference point B lying on said weld line a given distance from said first reference point A, and reading the positional coordinates of said second reference point B in said X and Y coordinate system;

transmitting an ultrasonic signal from an ultrasonic flaw detector to said probe and producing flaw detection data on the basis of a reflection echo signal fed back from said probe;

receiving said flaw detection data from said ultrasonic flaw detector and said probe position data from said scanning unit and recording both of said data on an external recording medium; and

processing said data recorded on said external recording medium to locate the flaw position in said weld line of said material to be tested.

2. A method of locating a flaw position in a weld line of a material to be tested according to claim 1 wherein an angle α

at which said scanning unit is disposed relative to said weld line is determined on the basis of the positional coordinates of said first and second reference points A and B, positional coordinates N(X₁, Y₁) of the beam index of said probe relative to said weld line at a position where a flaw is detected are determined on the basis of said angle α

, a linear distance L on a plane between the beam index of said probe and the position Q of the detected flaw is determined on the basis of a preset beam angle φ

of said probe and a beam path length to said flaw, and positional coordinates (X₂, Y₂) of said flaw relative to said weld line is determined in accordance with

space="preserve" listing-type="equation">X.sub.2 =L sin (Θ

-α

)+(Y.sub.O -X.sub.O ·

tan α

)·

sin α

+X.sub.O /cos α

space="preserve" listing-type="equation">Y.sub.2 =(Y.sub.O -X.sub.O ·

tan α

)·

cos α

-L cos (Θ

-α

)

wherein (X_O, Y_O) represent coordinates of the probe of said scanning unit at the position of said flaw in said X and Y-coordinate system.

3. A method of locating a flaw position in a weld line of a material to be tested according to claim 1 wherein an angle α

at which said scanning unit is disposed relative to said weld line is determined on the basis of the positional coordinates of said first and second reference points A and B, positional coordinates N₁ (X₃, Y₃) of the beam index of said probe relative to said weld line at a position where a flaw is detected are determined on the basis of said angle α

, a linear distance L on a plane between the beam index of said probe and the position Q of the detected flaw is determined on the basis of a preset beam angle φ

of said probe and a beam path length to said flaw, and positional coordinates (X₄, Y₄) of said flaw relative to said weld line are determined in accordance with ##EQU2## where Z represents a distance between the beam index of said probe and a center of rotation of said probe, and β

represents inclination of a line interconnecting the beam index of said probe and said center of rotation relative to said scanning unit, and (X₁, Y₁) represent positional coordinates of said center of rotation of said probe relative to sid scanning unit.

4. A method of locating a flaw position in a weld line of a material to be tested according to claim 1 further comprising the step of displaying digitally said probe position data and the flaw data only in a flaw detection operating mode and otherwise displaying digitally the probe position data.

5. A method of locating a flaw position in a weld line of a material to be tested according to claim 1 wherein the flaw data falling within a predetermined reference range is sampled, which data is supplied from the ultrasonic flaw detector connected to the scanning unit for scanning a test surface of the material under test and at the same time the probe position data supplied from said scanning unit is sampled, both data being stored temporarily and compared, respectively, with the corresponding data sampled precedingly, and wherein in case any one of differences resulting from said comparisons exceeds a predetermined value, the data sampled currently are stored in a memory incorporated in said flaw detection data collecting/recording unit and subsequently transferred to an external storage medium as the raw flaw detection data.

6. A method of locating a flaw position in a weld line of a material to be tested according to claim 1, said flaw data including echo height data and beam path length data, wherein when said echo height data lies within a predetermined voltage level range and when said beam path length data is not zero, said flaw data is sampled.

7. A method of locating a flaw position in a weld line of a material to be tested according to claim 1, wherein said probe position data is of the displacement along the X-axis, displacement along the Y-axis and angle of rotation of the Θ

-axis.

8. A method of locating a flaw position in a weld line of a material to be tested according to claim 1, wherein when differences between the probe position data and beam path length data sampled currently and the corresponding data sampled precedingly do not exceed associated predetermined values, respectively, and when the echo data sampled currently is of higher significance than the echo data sampled precedingly, only the currently sampled echo data is stored by replacing the echo data sampled precedingly.