Profile-measuring light probe using a change in reflection factor in the proximity of a critical angle of light

• US 4,743,770 A
• Filed: 09/22/1986
• Issued: 05/10/1988
• Est. Priority Date: 09/22/1986
• Status: Expired due to Term

• Current Assignee: Mitutoyo Mfg. Co., Ltd.
• Original Assignee: Mitutoyo Mfg. Co., Ltd.
• Inventors: Lee, Chia S.
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Allen, Stephone B.
• Application Number:
  US06/909,926
• Time in Patent Office: 596 Days
• Field of Search: 250/560, 250/561, 356/1, 356/4, 356/376, 356/380, 356/381
• US Class Current: 250/559.22
• CPC Class Codes: G01B 11/007 feeler heads therefor
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures

Abstract

A profile-measuring light probe includes: an illuminator for irradiating a fine spot of light on a subject to be measured; an objective lens for forming an image of the fine spot on an image plane; and a relay lens for converting the light from the fine spot into a generally parallel ray. Further, the light probe includes a window plate constituted by an entrance prism for taking in the generally parallel ray emitted from the relay lens; a flat glass for subjecting the taken-in ray to multiple internal reflections and transmitting the same, and an exit prism for outputting the ray thus transmitted to the outside. The light probe measures the distribution of light quantity of the light emitted from the window plate to thereby measure a profile of the subject to be measured. With the above-described arrangement, it becomes possible for the light probe to perform the measuring through the utilization of a change in reflection factor of a light inciding in the proximity of a critical angle without using a critical angle prism.

Claims

1. A profile-measuring light probe comprising:

irradiating means for irradiating a subject to be measured with a focussed spot of light at an angle of 90°

or less;

an objective lens for forming an image of the focussed spot in the proximity of an image plane, the objective lens defining an optical axis;

a relay lens having a focus on the image plane, for converting diffused light from the image of the focussed spot into a generally parallel ray;

a window plate including an entrance prism having an angle β

defined between a face of the prism parallel to the image plane and a face of the prism acutely inclined relative to the image plane, the entrance prism taking in a generally parallel ray emitted from relay lens;

a flat glass supported at an angle of inclination α

defined between an inclined face of the glass and the optical axis and having a refractive index n, for subjecting the taken-in generally parallel ray to multiple internal reflections and transmitting same; and

an exit prism for outputting the generally parallel ray thus transmitted to the outside, with said angles α and

β

being set to substantially satisfy the following relationship

space="preserve" listing-type="equation">α

≃

9°

- arcsin (1/n)

space="preserve" listing-type="equation">β

≃

arcsin (1/n); and

a position detector for receiving the generally parallel ray from said window plate, measuring the distribution of light quantity and outputting the measured result to the outside.

2. The light probe as set forth in claim 1, wherein between said objective lens and said image plane, there are provided a polarizing beamsplitter for reflecting and dividing a light of an S-polarized component normal to the plane of incidence and mainly transmitting through the window plate a light of a P-polarized component incorporated in the plane of incidence, and a coarse position sensing detector for measuring a position of an image formed by the light of the S-polarized component thus divided and outputting the measured results.

3. The light probe as set forth in claim 1, wherein, between said focussed spot of light and said image of the focussed spot, there is provided an interference filter for removing disturbing lights by selecting a light having a specific wavelength within a range of wavelengths of light emitted from said irradiating means.

4. The light probe as set forth in claim 1, wherein a pin-hole plate is provided on said image plane for removing disturbing lights by shielding lights that are diverted from said optical axis.

5. The light probe as set forth in claim 1, wherein said irradiating means is a combination of a laser diode with a focusing lens.

6. The light probe as set forth in claim 1, wherein the magnification of said objective lens is about 5 times or less.

7. The light probe as set forth in claim 1, wherein said relay lens is formed of a gradient index lens having a focal length shorter than the focal length of said objective lens.

8. The light probe as set forth in claim 1, wherein said position sensing detector is formed of a lateral effect photodiode.

9. The light probe as set forth in claim 1, wherein said position sensing detector is formed of a CCD or MOS line sensor.

10. The light probe as set forth in claim 2, wherein said position sensing detector is formed of a lateral effect photodiode.

11. The light probe as set forth in claim 2, wherein said position sensing detector is formed of a CCD or MOS line sensor.

12. The light probe of claim 1, including means for transmitting through the window plate a light of a P-polarized component incorporated in a plane of incidence.

13. A profile-measuring light probe comprising:

irradiating means for irradiating a focussed spot of light onto a subject to be measured;

an objective lens for gathering lights from said focussed spot and converting same into a parallel ray, the objective lens defining an optical axis;

a light transmitting member for transmitting a light from said objective lens through internal reflections within said light transmitting member;

polarization selecting means for transmitting a light of a P-polarized component incorporated in a plane of incidence through said light transmitting member; and

a photo-electric transducer element for receiving the light from said light transmitting member and transducing the light from said light transmitting member into an electric signal.

14. The light probe as set forth in claim 13, wherein said light transmitting member is formed of a prism having an angle β

defined between a first face of the prism perpendicular to the optical axis and a second face of the prism acutely inclined relative to the optical axis, the angle β

being in the proximity of a critical angle of said prism.

15. The light probe as set forth in claim 13, wherein said light transmitting member includes a flat glass supported in an inclined state at a predetermined angle defined between said optical axis and an inclined face of said glass and having light transmitted therethrough by internal reflections.

16. A coordinate measuring machine including a light probe for measuring a profile through the utilization of a change in reflection factor in the proximity of a critical angle of a light, wherein said light probe includes;

an objective lens for producing an image of a focussed spot of light;

a relay lens for converting light from said focussed spot into a generally parallel ray; and

a flat glass for subjecting said ray to multiple internal reflections.

17. The coordinate measuring machine of claim 16, wherein said light probe includes polarizing means for transmitting through the flat glass light of P-polarized component incorporated in a plane of incidence.