Test management system to acquire, process and display test data

• US 4,748,573 A
• Filed: 06/28/1985
• Issued: 05/31/1988
• Est. Priority Date: 06/28/1985
• Status: Expired due to Fees

• Current Assignee: Kinetic Systems Incorporated (Kinetics Holding GmbH)
• Original Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Inventors: Schowe, Lester F., Koppelberger, Laurence V., Sarandrea, Bryan M., Richards, Andrew E., Schaten, Philip, Dalal, Samir K.
• Primary Examiner(s): Gruber, Felix D.
• Application Number:
  US06/749,837
• Time in Patent Office: 1,068 Days
• Field of Search: 364/200, 364/900, 364/550, 364/551, 364/442, 364/582
• US Class Current: 702/108
• CPC Class Codes: G05B 19/042 using digital processors G05B19/05 takes precedence
• CPC Class Codes: G05B 2219/2612 Data acquisition interface

Abstract

A test management system acquires, processes and displays test data. A control processor operating system operates independently of a disk file server operating system to control the operation. The test data is received from any analog signal lines which are sampled at predetermined rates and digitized or received as digital data. The digital data is collected and stored in a random access memory. A control processor analyzes the data and displays the analyzed data on a monitor. The digital data and analyzed data may be stored on disk. The digitized data may be sampled to determine if predetermined limits are exceeded and control signals may be sent back to the originating signal generator indicating corrective action.

Claims

1. (Amended) A test management system for acquiring, processing and displaying test data comprising:

signal conditioner process means for sampling a plurality of analog signals, having means for converting each sample of said plurality of analog signals to normalized digital data signals and having means for storing said normalized digital data signals;

collecting process means coupled to said signal conditioner process means and having addressing means for addressing said storing means and receiving said normalized digital data signals, said collecting process means further having memory means for storing said normalized digital data signals;

file server means coupled to said collecting process means for storing said normalized digital data signals received from said memory means;

system master means coupled to said file server means and said collecting process means and having means for analyzing said normalized digital data signals received from said memory means and said file server means, said system master means further having real time data reduction means coupled to said test control means and said collecting process means for receiving said normalized digital data signals from said collecting process means for checking against predetermined limits and generating limit violation signals if said predetermined limits are exceeded; and

graphics means responsive to said system master means for displaying the result of analyzing said normalized digital data signals.

2. (Amended) The test management system of claim 1 wherein said system master means further comprises:

foreground event handler means coupled to said test control means and said real time data reduction means and responsive to data signals from said collecting process means indicating a status change to generate status change signals or responsive to said limit violation signals for generating said status change signals indicative of an out of limit condition.

3. The test management system of claim 2 wherein said system master means further comprises:

background event handler means coupled to said test control means and said foreground event handler means and responsive to said status change signals for sending the status change information to graphics means for display.

4. The test management system of claim 3 wherein said system master means further comprises:

background controller means coupled to said test control means and said collecting process means for receiving data snapshots of said normalized digital data signals for performing said analyzing and generating analyzed data signals.

5. The test management system of claim 4 wherein said system master means further comprises:

analysis controller means coupled to said background controller means and responsive to said analyzed data signals for generating display signals.

6. The test management system of claim 5 wherein said system master means further comprises:

operator interface controller means coupled to said test control means, said background controller means and said analysis controller means for receiving said analyzed data signals for display on a monitor or a printer.

7. The test management system of claim 6 wherein said file server means comprises:

high speed data means coupled to said collecting process means for receiving said normalized digital data signals from said memory means and generating disk data signals and coupled to said real time data reduction means for receiving derived channel signals indicative of combining the normalized digital data signals of a plurality of analog signal channels and generating said disk data signals.

8. The test management system of claim 7 wherein said file server means comprises:

disk start means coupled to said high speed data means and generating write request control signals for storing said disk data signals.

9. The test management system of claim 8 wherein said file server means comprises:

operating system means coupled to said system master means for receiving file I/O request signals for generating read request control signals for reading said disk data signals.

10. The test management system of claim 1 wherein said converting means is an analog to digital converter.

11. The test management system of claim 1 wherein said memory means is control logic.

12. The test management system of claim 1 wherein said collecting process means includes a sequencer and a collect processor.

13. The test management system of claim 1 wherein said memory means includes a global memory.

14. The test management system of claim 1 wherein said file server means includes a disk drive.

15. The test management system of claim 1 wherein said system master means includes a control processor.

16. (Amended) A test management system which acquires and analyzes digital data obtained by sampling analog signals and digital signals received from a plurality of input channels and includes two operating systems operating independently of each other, said test management system comprising:

global memory means for storing control information and said digital data;

system master operating system means coupled to said global memory means and responsive to said control information and said digital data for verifying the configuration of said system, testing said digital data in accordance with said control information for limit violations and analyzing test samples of said digital data in accordance with said control information, in order to initiate a predetermined action; and

file server operating system means coupled to said global memory means and said system master operating system means for storing said digital data received from said global memory means, and storing header information received from said system master operating system means.

17. The test management system of claim 16 wherein said system master operating system means comprises:

first memory means for storing a first set of instructions representative of the functions of a system master operating system; and

first microprocessor means coupled to said first memory means and said global memory means for executing said first set of instructions which process said digital data received from said global memory.

18. The test management system of claim 17 wherein said file server operating system means comprises:

second memory means for storing a second set of instructions representative of the functions of a file server operating system; and

second microprocessor means coupled to said second memory means and said global memory means for executing said second set of instructions which transfer said digital data between said global memory and a disk drive.