Temperature detecting device, microwave cooking apparatus using the same, and data correcting method thereof

• US 4,751,356 A
• Filed: 01/06/1987
• Issued: 06/14/1988
• Est. Priority Date: 01/17/1986
• Status: Expired due to Fees

• Current Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Original Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: Watanabe, Fumio, Fukuda, Norisuke
• Primary Examiner(s): PASCHALL, MARK H
• Application Number:
  US07/000,764
• Time in Patent Office: 525 Days
• Field of Search: 219/10.55 B, 219/506, 219/502, 219/497, 219/494, 219/499, 219/501, 356/328, 356/319, 356/334, 356/43-45, 356/316, 250/338, 250/349, 250/350, 250/351, 350/331 R, 374/122, 374/132, 374/121
• US Class Current: 219/711
• CPC Class Codes: G01J 5/0044 Furnaces, ovens, kilns G01J5/0007, G01J5/004 take precedence
• CPC Class Codes: G01J 5/026 Control of working procedures of a pyrometer, other than calibration; Bandwidth calculation; Gain control
• CPC Class Codes: G01J 5/0804 Shutters
• CPC Class Codes: G01J 5/0805 Means for chopping radiation
• CPC Class Codes: H05B 6/6455 the sensors being infrared detectors

Abstract

A temperature detecting device detects infrared rays from an object to be measured and determines the temperature of the object based on the detection result. To avoid the influence of contamination adhered to the infrared ray incident surface of an infrared ray detecting unit, a correction coefficient for the detection result of the infrared ray detecting unit is determined before actual temperature detecting starts. For this purpose, the infrared rays fed from the object into the infrared ray detecting unit are interrupted by a shutter device. The infrared ray detecting unit detects the infrared rays fed from the shutter device through the infrared ray incident surface, and it outputs a first detection value corresponding to the shutter temperature. A shutter temperature detecting element directly detects the actual temperature of the shutter device, and it outputs a second detection value corresponding to the actual temperature of the shutter device. The correction coefficient is determined by comparing the second detection value from the shutter temperature detecting element with the first detection value from the infrared ray detecting unit. Subsequently detected temperatures are then corrected by this correction coefficient.

Claims

1. A temperature detecting device for measuring the temperature of an object from infrared rays emitted by the object, comprising:

shutter means for interrupting the path of infrared rays from the object;

infrared ray detecting means, having an infrared ray permeable surface subject to contamination by deposits of foreign substances, for receiving infrared rays through the infrared ray permeable surface along the path, and for generating a first output corresponding to the intensity of the infrared rays from the object and a second output corresponding to the intensity of infrared rays from the shutter means when the path is interrupted;

shutter temperature detecting means for directly detecting the actual temperature of the shutter means and for generating a shutter temperature signal; and

correction means for modifying the first output of the infrared ray detecting means in response to the shutter temperature signal and the second output to thereby compensate for improper readings of the intensity of infrared rays from said object.

2. A temperature detecting device according to claim 1, wherein the correction means includes comparison means for comparing the shutter temperature signal with the second output and for generating a correction signal for modifying the first output.

3. A temperature detecting device according to claim 2, said correction means further including actual temperature calculating means for generating a temperature value corresponding to the actual temperature of the object based on the first output and the correction signal.

4. A temperature detecting device according to claim 1, wherein the infrared ray detecting means includes a thermopile whose thermoelectromotive force varies in response to the intensity of infrared rays from the object.

5. A temperature detecting device according to claim 4, wherein the shutter temperature detecting means includes a thermistor whose resistance value varies in response to the temperature change of the shutter means.

6. A temperature detecting device according to claim 1, wherein the infrared ray detecting means includes a thermistor bolometer whose resistance value varies in response to the intensity of infrared rays from the object.

7. A temperature detecting device according to claim 1, wherein the shutter means includes a shutter and a solenoid for driving the shutter.

8. A microwave cooking apparatus comprising:

means for supplying microwaves to food to be cooked;

a temperature detecting device including;

shutter means for interrupting the path of infrared rays from the food,

infrared ray detecting means, having an infrared ray permeable surface subject to contamination by deposits of foreign substances, for receiving infrared rays through the infrared ray permeable surface along the path, and for generating a first output corresponding to the intensity of infrared rays from the food and a second output corresponding to the intensity of infrared rays from the shutter means when the path is interrupted,

shutter temperature detecting means for directly detecting the actual temperature of the shutter means and for generating a shutter temperature signal,

comparison means for comparing the shutter temperature signal with the second output and for generating a correction signal, and

temperature determining means for generating a temperature value corresponding to the actual temperature of the food based on the first output and the correction signal, said first output being corrected by said correction signal to generate said temperature value, thereby compensating for improper readings of the intensity of infrared rays from said object; and

cooking completion means for controlling the cooking completion when the temperature value from the temperature determining means is more than a predetermined temperature value.

9. A method for correcting a detection value from an infrared ray detector having a shutter and a shutter temperature detector, comprising the steps of:

activating the shutter to prevent the infrared ray detector from receiving infrared rays from an object to be measured;

detecting the intensity of infrared rays from the shutter using the infrared ray detector;

outputting a first detection value, corresponding to the intensity of infrared rays emitted by the shutter, from the infrared ray detector;

detecting the actual temperature of the shutter using the shutter temperature detector;

outputting a second detection value, corresponding to the actual temperature of the shutter, from the shutter temperature detector;

determining a correction value by comparing the first detection value from the infrared ray detector with the second detection value from the shutter temperature detector;

deactivating the shutter to allow the infrared ray detector to receive infrared rays directly from the object;

detecting the intensity of infrared rays from the object using the infrared ray detector;

outputting a third detection value corresponding to the temperature of the object detected by the infrared ray detector; and

modifying the third detection value of the infrared ray detector in response to the second detection value and the correction value to thereby compensate for improper readings of the intensity of infrared rays from said object being measured.