Modulated infrared source

• US 4,754,141 A
• Filed: 09/23/1986
• Issued: 06/28/1988
• Est. Priority Date: 08/22/1985
• Status: Expired due to Fees

• Current Assignee: Ralph M. Mindock
• Original Assignee: High Technology Sensors, Inc.
• Inventors: Mindock, Ralph M.
• Primary Examiner(s): Howell, Janice A.
• Assistant Examiner(s): Hannaher, Constantine
• Application Number:
  US06/910,553
• Time in Patent Office: 644 Days
• Field of Search: 250/338 GA, 250/341, 250/343, 250/493.1, 250/495.1, 250/503.1, 250/504 R, 250/552, 357/17, 357/19, 357/58, 372/25, 372/50
• US Class Current: 250/343
• CPC Class Codes: H01L 33/0004 Devices characterised by their operation

Abstract

A solid state infrared source is disclosed which is capable of modulation of the intensity of broadband infrared radiation. A silicon semiconductor body is provided with doped regions which have high emissivity for infrared and an intrinsic region which has low emissivity and low absorption for the infrared. The device is heated and maintained at a temperature of about 500°K to effect the infrared radiation from the doped regions. Modulation is effected by controlling the presence of carriers in the intrinsic region, so as to modify the broadband infrared radiation. The modulating carriers may be due to optical modulation or they may be injected electrically. In either case, the heating may be effected by an external device or the doped regions may also provide a heating PIN diode structure which is forward biased in controlled fashion to attain the desired temperature. With electrical modulation, the doped regions provide at least a modulating PIN diode structure which is periodically forward biased to control the presence of carriers in the intrinsic region which modify the emission of infrared radiation from this region. With optical modulation, carriers are created in the semiconductor by subjecting it to a source of light. The device is useful for providing an IR source in many applications including a component in an electro-optical system for gas spectroscopy.

Claims

1. A radiation-emitting semiconductor device capable of modulation, having radiation-inducing means which thermally conditions the device to emit detectable broadband radiation at a substantially uniform intensity, and modulating means for influencing said device internally thereof to vary the intensity of said broadband radiation which is emitted.

2. A radiation-emitting semiconductor device capable of modulation as defined in claim 1 wherein said radiation-inducing means heats said semiconductor device to a substantially uniform, predetermined temperature at which broadband infrared radiation encompassing a desired frequency spectrum is emitted.

3. A radiation-emitting semiconductor device as defined in claim 2 wherein said radiation-inducing means comprises a heating device disposed externally of the semiconductor device.

4. A radiation-emitting semiconductor device as defined in claim 3 wherein said heating device includes an integrated circuit having resistive means formed therein.

5. A radiation-emitting semiconductor device as defined in claim 4 wherein said integrated circuit includes temperature sensing means.

6. A radiation-emitting semiconductor device as defined in claim 3 wherein said heating device comprises a diode structure.

7. A radiation-emitting semiconductor device as defined in claim 2 wherein said radiation-inducing means comprises a heating device monolithically formed with said semiconductor device.

8. A radiation-emitting semiconductor device as defined in claim 7 wherein said heating device comprises a diode structure.

9. A radiation-emitting semiconductor device as defined in claim 7 wherein said heating device includes an integrated circuit having resistive means formed therein.

10. A radiation-emitting semiconductor device as defined in claim 9 wherein said integrated circuit includes temperature sensing means.

11. A radiation-emitting semiconductor device capable of modulation as defined in claim 2 wherein said modulating means controls the presence of carriers within said device.

12. A radiation-emitting semiconductor device capable of modulation as defined in claim 1 wherein said modulating means controls the presence of carriers within said device.

13. A radiation-emitting semiconductor device as defined in claim 12 wherein said modulating means controls the presence of carriers optically.

14. A radiation-emitting semiconductor device as defined in claim 12 wherein said modulating means controls the presence of carriers electrically.

15. A radiation-emitting semiconductor device capable of modulation, comprising the combination of:

a semiconductor body having a surface of high emissivity with respect to radiation of a wavelength of interest;

means for heating said body to a desired temperature at which it thermally emits broadband radiation from said surface at a desired intensity and encompassing the wavelength of interest;

means for causing said radiation of the wavelength of interest to follow a path within said body so as to be emitted therefrom with the desired intensity; and

modulating means for controllably injecting carriers into the body to intercept said path so as to modulate the intensity of said broadband radiation emitted from said surface.

16. A radiation-emitting semiconductor device as defined in claim 15 wherein said modulating means injects carriers in said body which attain thermal equilibrium.

17. A radiation-emitting semiconductor device as defined in claim 16 wherein said modulating means optically injects said carriers.

18. A radiation-emitting semiconductor device as defined in claim 16 wherein said modulating means electrically injects said carriers.

19. An infrared-emitting semiconductor device capable of modulation comprising the combination of:

a semiconductor having a region which emits infrared radiation when heated and another region which has low emissivity and absorption of said infrared radiation and means for heating said semiconductor to a predetermined temperature so that a desired intensity of infrared radiation is emitted therefrom; and

modulating means for controllably injecting carriers into said semiconductor to vary the intensity of the infrared radiation emitted therefrom.

20. An infrared-emitting semiconductor device as defined in claim 19 wherein said modulating means controls the presence of carriers within said another region.

21. An infrared-emitting semiconductor device as defined in claim 20 wherein said modulating means optically creates carriers in said another region.

22. An infrared-emitting semiconductor device as defined in claim 20 wherein said modulating means electrically injects carriers into said another region.

23. A broadband radiation-emitting semiconductor device capable of modulation and comprising the combination of:

a body of radiation-emissive semiconductor material and means for maintaining the temperature of the body at a desired temperature at which it thermally emits radiation over a broad band of frequencies encompassing a wavelength of interest; and

modulating means for variably injecting carriers into said semiconductor body correspondingly to control the emittance therefrom of said broadband radiation encompassing the wavelength of interest.

24. A radiation-emitting semiconductor device capable of modulation as defined in claim 23 wherein said modulating means introduces carriers within said semiconductor body which attain thermal equilibrium therewithin.

25. A radiation-emitting semiconductor device as defined in claim 24 wherein said modulating means optically creates carriers in the device.

26. A radiation-emitting semiconductor device as defined in claim 24 wherein said modulating means electrically injects carriers into said device.

27. A radiation-emitting semiconductor device capable of modulation, comprising the combination of:

a semiconductor having an intrinsic region as well as p- and n-regions and providing a surface of said intrinsic region from which unmodulated broadband radiation containing a wavelength of interest may be thermally emitted and means for controlling the temperature of the device to emit the unmodulated broadband radiation from said surface; and

modulating means for periodically injecting carriers into said semiconductor to modulate the emittance of said radiation of the wavelength of interest from said surface.

28. A semiconductor device as defined in claim 27 wherein said modulating means controls the presence of carriers within said device which attain thermal equilibrium therewithin.

29. A semiconductor device as defined in claim 28 wherein said modulating means optically creates carriers in said device.

30. A semiconductor device as defined in claim 28 wherein modulating means electrically injects carriers into said device.

31. A semiconductor device as defined in claim 27 wherein said surface of the intrinsic region is of an area relative to the areas of the doped regions of the body of not greater than 1/5 so that the device approximates a black body radiator.

32. In a semiconductor device, the combination of:

a semiconductor body having a surface which exhibits high emissivity of radiation in a desired spectrum;

means for controlling the temperature of the body to emit said radiation in the desired spectrum from said surface through said body; and

means for periodically injecting carriers within the semiconductor body to modulate the emitted radiation.

33. In a semiconductor device as defined in claim 32 wherein said modulating means controls the presence of carriers in said body which attain thermal equilibrium therewithin.

34. In a semiconductor device as defined in claim 33 wherein said modulating means optically creates said carriers.

35. In a semiconductor device as defined in claim 33 wherein said modulating means electrically injects said carriers.

36. In combination with a semiconductor device having a doped region which displays a temperature-dependent emissivity for infrared radiation and another region which is of low emissivity and absorption for infrared radiation, means for controlling the temperature of said device to produce said infrared radiation from said doped region, and means for modulating the absorption coefficient of said infrared radiation within said another region to modulate the intensity of the infrared radiation emitted by said device.

37. A device as defined in claim 36 wherein the ratio of exposed surface of said another region to the exposed surface of said doped region is not greater than 1/5 so that the device approaches a black body radiator.

38. A modulated infrared source comprising the combination of a body of semiconductor material having at least one diffused portion having high emissivity for infrared radiation and a further portion having low emissivity and low absorption for the infrared radiation, and means for controlling the temperature of the body to emit infrared radiation at a selected intensity;

and modulating means for periodically creating carriers in said body to control emittance of said infrared radiation from said body.

39. A device as defined in claim 38 wherein said further region is an intrinsic region.

40. A device as defined in claim 39 wherein said modulating carriers are injected electrically.

41. A device as defined in claim 39 wherein said modulating carriers are created optically.

42. A solid state infrared source comprising a slab of intrinsic silicon material having doped p- and n-regions on at least its opposite side surfaces so as to expose a minor surface of the intrinsic silicon material, said intrinsic silicon material having low emissivity and low absorption for infrared radiation and said doped regions having high emissivity for the infrared radiation, the combined areas of said doped regions being at least five times larger than said minor surface, means for controlling the temperature of said slab so as to cause broadband infrared radiation to exit through said minor surface, and means for periodically controlling the presence of carriers in said intrinsic silicon material to modulate the infrared radiation from said minor surface.

43. A solid state infrared source comprising a slab of intrinsic silicon material having doped regions covering a major portion of the surface of the slab so as to expose a minor surface of the intrinsic silicon material, said intrinsic silicon material having low emissivity and low absorption for infrared radiation and said doped regions having high emissivity for the infrared radiation, means for heating said slab to a temperature sufficient to cause broadband infrared radiation to exit through said minor surface, and means for periodically controlling the presence of carriers in said intrinsic silicon material correspondingly to modulate the intensity of the broadband infrared radiation from said minor surface.

44. A solid state infrared source comprising a slab of intrinsic silicon material having doped regions covering a portion of the surface of the slab so as to expose a surface of the intrinsic silicon material, said intrinsic silicon material having low emissivity and low absorption for infrared radiation whereas said doped regions are of high emissivity for the infrared radiation, means for heating said slab to a temperature sufficient to cause infrared radiation to exit through said surface of the intrinsic region, and means for periodically controlling the presence of carriers in said intrinsic silicon material correspondingly to modulate the intensity of broadband infrared radiation from said minor surface.

45. A solid state infrared source comprising a slab of intrinsic silicon material presenting opposite side surfaces and circumscribing edge surfaces, said body having doped p- and n-regions on at least its opposite side surfaces so as to expose a minor surface of the intrinsic silicon material, said doped regions defining at least one modulating PIN diode structure, said intrinsic silicon material having low emissivity and low absorption for infrared radiation and said doped regions having high emissivity for the infrared radiation, means for controlling the temperature of the slab to produce broadband infrared radiation which exits through said minor surface, and means for periodically forward biassing said PIN diode structure to control the presence of carriers in said intrinsic silicon material correspondingly to modulate the intensity of the infrared radiation emitted from said minor surface.

46. A solid state infrared source as defined in claim 45 wherein said said minor surface is formed on one of said opposite side surfaces and is surrounded by a doped region, the other side surface in register with said minor surface being etched away and coated with reflective material to reflect the infrared radiation to exit through said minor surface.

47. A solid state infrared source as defined in claim 46 wherein said circumscribing edge surfaces are doped and the combined areas of the doped regions being at least five times larger than the area of said minor surface.

48. A solid state infrared source as defined in claim 47 wherein said slab is circular.

49. A solid state infrared source as defined in claim 47 wherein said slab is rectangular.

50. A solid state infrared source as defined in claim 45 wherein said means for heating comprises a second PIN diode structure formed by said doped regions and means for forward biassing said second PIN diode structure to maintain the slab at a temperature of about 500°

K.

51. A solid state infrared source as defined in claim 45 wherein said circumscribing edge surfaces constitute said minor surface and including reflector means surrounding said circumscribing edge surfaces to reflect the infrared radiation, said means for heating comprising resistive heating means bonded to one of said opposite side surfaces for maintaining the temperature of said slab at about 500°

K.

52. A solid state infrared source as defined in claim 51 wherein said slab is circular.

53. A solid state infrared source as defined in claim 51 wherein said slab is rectangular.

54. In a gas analysis device including the combination of a solid state infrared source comprising a body of semiconductor material having a doped region and another region which is relatively undoped, means for maintaining said body at a temperature of about 500°

K. so that it emits broadband infrared radiation at a desired intensity from said relatively undoped region thereof, means for periodically varying the presence of carriers in said undoped region of the body correspondingly to modulate the intensity of the infrared radiation emitted from said relatively undoped region, detecting means for detecting infrared radiation and disposed in spaced relation to said source, and means defining an optical path between said source and said detector means through ambient atmosphere for analysis of gas contained in the ambient atmosphere.