Probe body for an electrical measurement system

• US 4,758,779 A
• Filed: 04/07/1986
• Issued: 07/19/1988
• Est. Priority Date: 04/07/1986
• Status: Expired due to Term

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Thong, Tran
• Primary Examiner(s): NOT, DEFINED
• Assistant Examiner(s): Mueller, Robert W.
• Application Number:
  US06/848,548
• Time in Patent Office: 834 Days
• Field of Search: 324/72.5, 324/74, 324/130, 324/133, 324/158 P, 324/475, 73/1 R
• US Class Current: 324/72.5
• CPC Class Codes: G01R 31/3177 Testing of logic operation, e.g. by logic analysers
• CPC Class Codes: G01R 31/31926 Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
• CPC Class Codes: G01R 35/005 Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence
• CPC Class Codes: G06F 11/25 Testing of logic operation, e.g. by logic analysers

Abstract

A probe body for a measurement system comprises a probe-tip terminal for connection by way of a probe tip to a test point, a cable port for connection by way of at least one cable to a measurement instrument, probe circuitry, a function generator, and a switch. In a first state of the switch, the input terminal of the probe circuitry is connected to the probe-tip terminal and in a second state of the switch the input terminal of the probe circuitry is connected to the function generator. When the switch is in the second state, the function generator may be used to impress a signal having a predetermined waveform on the probe circuitry.

Claims

1. A probe body having a first probe-tip terminal for connection by way of a probe tip to a test point, a second probe-tip terminal for connection to a stimulus probe, and a cable port for connection by way of at least one cable to a measurement instrument, and comprising:

probe circuitry having an output terminal connected to the cable port and also having an input terminal,

a function generator, and

switch means having a first state in which the input terminal of the probe circuitry is connected to the first probe-tip terminal, a second state in which the input terminal of the probe circuitry is connected to the function generator, so that when the switch means are in the second state the function generator may be used to impress a signal having a predetermined waveform on the probe circuitry, and a third state in which the input terminal of the probe circuitry is connected to the first probe-tip terminal and the function generator is connected to the second probe-tip terminal.

2. A probe body according to claim 1, wherein the function generator includes a read-only memory and a clock generator for clocking the contents out of the read-only memory.

3. A probe body according to claim 2, wherein the clock generator is a phase-locked loop operative to oscillate in synchronism with an externally-applied master clock and to continue oscillation after removal of the master clock.

4. A measurement system comprising a measurement instrument, a probe body having a first probe-tip terminal for connection by way of a probe tip to a test point, a second probe-tip terminal for connection to a stimulus probe, and a cable port, and a probe cable for connecting the cable port of the probe body to the measurement instrument, the probe body comprising:

probe circuitry having an output terminal connected to the cable port and also having an input terminal,

a function generator, and

switch means having a first state in which the input terminal of the probe circuitry is connected to the first probe-tip terminal, a second state in which the input terminal of the probe circuitry is connected to the function generator, so that when the switch means are in the second state the function generator may be used to impress a signal having a predetermined waveform on the probe circuitry, and a third state in which the input terminal of the probe circuitry is connected to the first probe-tip terminal and the function generator is connected to the second probe-tip terminal.

5. A measurement system according to claim 4, wherein the measurement instrument includes a master clock generator that can be connected to the function generator of the probe body over the probe cable, and wherein the function generator comprises a local clock generator for receiving the master clock generated by the master clock generator and generating a local clock that is synchronized with the master clock, and a read-only memory connected to receive the local clock and generate a predetermined sequence of digital data values.

6. A measurement system according to claim 5, wherein the probe body further comprises a digital-to-analog converter connected to receive the predetermined sequence of digital data values generated by the read-only memory.

7. A measurement system according to claim 5, wherein the local clock generator comprises a phase-locked loop.

8. A measurement system according to claim 5, wherein the measurement instrument includes means for applying the master clock to the local clock generator in intermittent fashion, and the local clock generator comprises a phaselocked loop which oscillates in synchronism with the master clock when the master clock is applied to the local clock generator and continues oscillation after the master clock ceases to be applied to the local clock generator.

9. A measurement system according to claim 5, wherein the function generator includes a read-only memory and a clock generator for clocking the contents out of the read-only memory.

10. A measurement system according to claim 9, wherein the clock generator is a phase-locked loop operative to oscillate in synchronism with an externally-applied master clock and to continue oscillation after removal of the master clock.

11. A probe body having a probe-tip terminal for connection by way of a probe tip to a test point, and a cable port for connection by way of at least one cable to a measurement instrument, and comprising:

probe circuitry having an output terminal connected to the cable port and also having an input terminal,

a function generator which comprises a non-volatile memory and a local clock generator for clocking the contents out of the non-volatile memory, the local clock generator being operative to operate in synchronism with an externally-applied master clock and to continue operation after removal of the master clock, and

switch means having a first state in which the input terminal of the probe circuitry is connected to the probe-tip terminal and a second state in which the input terminal of the probe circuitry is connected to the function generator, so that when the switch means are in the second state the function generator may be used to impress a signal having a predetermined waveform on the probe circuitry.

12. A probe body according to claim 11, wherein the local clock generator is a phase-locked loop.

13. A probe body according to claim 11, wherein the non-volatile memory is a read-only memory.

14. A measurement system comprising a measurement instrument including a master clock generator, and also comprising a probe body having a probe-tip terminal for connection by way of a probe tip to a test point and also having a cable port, and a probe cable for connecting the cable port of the probe body to the measurement instrument, the probe body comprising:

probe circuitry having an output terminal connected to the cable port and also having an input terminal,

a function generator which comprises a local clock generator for receiving over the probe cable the master clcok generated by the master clock generator and generating a local clock that is synchronized with the master clock, and a non-volatile memory connected to receive the local clock and generate a predetermined sequence of digital data values, and

switch means having a first state in which the input terminal of the probe circuitry is connected to the probe-tip terminal and a second state in which the input terminal of the probe circuitry is connected to the function generator, so that when the switch means are in the second state the function generator may be used to impress a signal having a predetermined waveform on the probe circuitry.

15. A measurement system according to claim 14, wherein the probe body further comprises a digital-to-analog converter connected to receive the predetermined sequence of digital data values generated by the non-volatile memory.

16. A measurement system according to claim 14, wherein the local clock generator is a phase-locked loop.

17. A probe body according to claim 14, wherein the non-volatile memory is a read-only memory.

18. A measurement system according to claim 14, which the probe body has a second probe-tip terminal for connection to a stimulus probe, and the switch means have a third state in which the input terminal of the probe circuitry is connected to the first-mentioned probe-tip terminal and the function generator is connected to the second probe-tip terminal.

19. A measurement system according to claim 14, wherein the measurement instrument includes means for applying the master clock to the local clock generator in intermittent fashion, and the local clock generator comprises a phase-locked loop which oscillates in synchronism with the master clock when the master clock is applied to the local clock generator and continues oscillation after the master clock ceases to be applied to the local clock generator.

20. A measurement system comprising a measurement instrument, a probe body having a probe-tip terminal for connection by way of a probe-tip to a test point and also having a cable port, and a probe cable for connecting the cable port of the probe body to the measurement instrument, a probe body comprising:

probe circuitry having an output terminal connected to the cable port and also having an input terminal,

a function generator which comprises a non-volatle memory and a local clock generator for clocking the contents out of the non-volatile memory, the local clock generator being operative to oscillate in synchronism with an externally-applied master clock and to continue oscillation after removal of the master clock, and

switch means having a first state in which the input terminal of the probe circuitry is connected to the probe terminal and a second state in which the input terminal of the probe circuitry is connected to the function generator, so that when the switch means are in the second state the function generator may be used to impress a signal having a predetermined waveform on the probe circuitry.

21. A measurement system according to claim 20, wherein the local clock generator is a phase-locked loop.

22. A probe body according to claim 20, wherein the non-volatile memory is a read-only memory.

23. A measurement system according to claim 20, which the probe body has a second probe-tip terminal for connection to a stimulus probe, and the switch means have a third state in which the input terminal of the probe circuitry is connected to the first-mentioned probe-tip terminal and the function generator is connected to the second probe-tip terminal.