Method and apparatus for inspecting printed circuit board

• US 4,758,782 A
• Filed: 09/10/1986
• Issued: 07/19/1988
• Est. Priority Date: 09/11/1985
• Status: Expired due to Fees

• Current Assignee: KOWA Company Limited
• Original Assignee: KOWA Company Limited
• Inventors: Kobayashi, Kouji
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US06/905,922
• Time in Patent Office: 678 Days
• Field of Search: 324/73 PC, 324/73 R, 358/106, 382/8, 382/16, 382/34
• US Class Current: 382/148
• CPC Class Codes: G01N 2021/95638 for PCB's
• CPC Class Codes: G01N 21/956 Inspecting patterns on the surface of objects contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H01L22/10
• CPC Class Codes: G01N 21/95607 using a comparative method
• CPC Class Codes: G01R 31/2806 Apparatus therefor, e.g. test stations, drivers, analysers, conveyors G01R31/2805, G01R31/281, G01R31/2818 take precedence
• CPC Class Codes: G01R 31/309 of printed or hybrid circuits or circuit substrates

Abstract

Method and apparatus for inspecting a printed circuit board wherein scanned image data are digitized and analyzed according to a feature extraction method and a mutual comparison method. The result of both of the analysis methods is combined with predetermined conditions to control output devices including a CRT display or a marking device. The two complementary methods compensate each others drawbacks so that the reliability of inspection can be improved.

Claims

1. An apparatus for inspecting printed circuit boards to detect defective printed circuit patterns formed thereon, comprising:

a. image scanning means for scanning a printed circuit pattern of said printed circuit board to produce a pattern image in the form of a plurality of image data;

b. binary digitizing means for digitizing the image data of said printed circuit pattern to produce a plurality of corresponding binary image data;

c. first inspection processing means including,

extracting means for extracting local binary image data composed of a central bit image and peripheral bit images having a pre-determined bit configuration and being spaced apart from each other, from the binary image data generated by said binary digitizing means, and

detection means composed of a memory device for receiving said extracted local binary image data as an address input and outputting stored data indicating whether a defect exists or not in a pattern area from which said local binary image data is extracted;

d. second inspection processing means including,

converting means for converting the binary image data generated by said binary digitizing means into binary image data of lower resolution than that of the binary image data entered into said first detection means,

image data storage means for storing resolutionlowered binary image data of a master printed circuit board, which are scanned, digitized and converted in terms of the resolution by said scanning means, digitizing means and converting means,

enlarging and reducing means for enlarging and reducing the resolution-lowered binary image data of the master printed circuit board read out from said image data storage means, and

detection means for detecting defects of the printed circuit board to be inspected, by comparing the image data of the printed circuit board whose resolution is lowered by said converting means, with the enlarged and reduced master image data produced by said enlarged and reducing means; and

e. output processing means for combining detection results from said first and second detection means to produce output data which can be utilized in a predetermined output device.

2. An apparatus according to claim 1;

wherein said extracting means includes means for extracting local binary image data composed of a central bit image surrounded by peripheral bit images having a circular configuration.

3. An apparatus according to claim 1;

wherein said extracting means includes means for extracting local binary image data composed of a central bit image surrounded by peripheral bit images equi-angularly positioned around the central bit image.

4. An apparatus according to claim 1;

wherein the enlarging and reducing means includes means for producing an enlarged similar image effective to enable the detection means to detect a projection defect of the sample pattern.

5. An apparatus according to claim 1;

wherein the enlarging and reducing means includes means for producing a reduced similar image effective to enable the detection means to detect an indent defect of the sample pattern.