Method and apparatus for detection of surface defects of hot metal body

• US 4,759,072 A
• Filed: 05/06/1987
• Issued: 07/19/1988
• Est. Priority Date: 02/28/1984
• Status: Expired due to Fees

• Current Assignee: Futec, Inc., Kawasaki Steel Corporation (JFE Holdings Incorporated)
• Original Assignee: Futec, Inc., Kawasaki Steel Corporation (JFE Holdings Incorporated)
• Inventors: Yamane, Hirosato, Hanafusa, Hideyuki
• Primary Examiner(s): Boudreau, Leo H.
• Assistant Examiner(s): Couso, Jose L.
• Application Number:
  US07/048,477
• Time in Patent Office: 440 Days
• Field of Search: 250/330, 250/342, 250/358.1, 250/359.1, 250/578, 356/51, 356/72, 356/237, 358/93, 358/101, 358/106, 358/107, 358/113, 382/8, 382/17, 382/22, 382/54
• US Class Current: 382/152
• CPC Class Codes: G01N 21/89 in moving material, e.g. running paper or textiles G01N21/90, G01N21/91, G01N21/94 take precedence
• CPC Class Codes: G01N 25/72 Investigating presence of flaws

Abstract

In detecting surface defects of a hot metal body, e.g. hot-rolled steel sheet, by using a first video signal derived from radiation spontaneously radiated from a target area of the hot metal surface and a second video signal derived from external light projected on and reflected from the same target area of the hot metal surface, the rate of false detection by the influence of noise signals attributed to metal oxide present on the hot metal surface is greatly reduced by converting the first and second video signals respectively into first and second binary signals, synchronously feeding the first and second binary signals to an AND circuit and detecting the locations of such defects based on the output of the AND circuit. Preferably near-infrared region of the radiation is used in producing the first video signal and visible light as the external light.

Claims

1. A method of detecting surface defects of a hot metal body, comprising the steps of:

producing a first video signal by optical to electrical conversion of a selected region of radiation wavelength spontaneously radiated from a target area of a surface of the hot metal body by using a first image pickup means;

producing a second video signal by optical to electrical conversion of external light projected on and reflected at a selected wavelength region from said target area of the hot metal surface by using a second image pickup means, said external light wavelength region being not interferential with said selected region of said radiation;

converting said first and second video signals respectively into first and second binary signals each of which assumes a logical "1" state when it implies the presence of a surface defect in said target region of the hot metal surface;

making an AND treatment of said first and second binary signals in a synchronous state to thereby produce a third binary signal which indicates the presence of a defect on said hot metal body without the substantive presence of noise signals from said first and second video signals; and

detecting the locations of such surface defect in said target area of the hot metal body based on said third binary signal.

2. A method according to claim 1, wherein said selected region of said radiation is a near-infrared region of the spectrum not shorter than 700 nm in wavelength, said external light being visible light, having a wavelength in the range from about 400 nm to about 600 nm.

3. A method according to claim 1, wherein said first and second video signals are produced simultaneously.

4. A method according to claim 1, wherein one of said first and second video signals is produced after producing the other.

5. A method according to claim 1, wherein said hot metal body is a hot-worked steel body.

6. An apparatus for detection of surface defects of a hot metal body, comprising:

first image pickup means for receiving a selected region of radiation spontaneously radiated at a selected wavelength region from a target area of a surface of the hot metal body and converting the received radiation into a first video signal;

projector means for projecting external light which is not interferential with said selected wavelength region of the radiation from said target area of the hot metal surface;

second image pickup means for receiving said external light reflected from said target area of the hot metal surface at a selected wavelength and converting the received light into a second video signal;

binary signal producing means for converting said first and second video signals respectively into simultaneously existing first and second binary signals each of which assumes a logical "1" state when it implies the presence of a surface defect in said target area of the hot metal surface;

an AND circuit to which said first and second binary signals are synchronously input to produce a third binary signal substantially free of noise signals contained in said first and second binary signals; and

means of detecting the presence or absence of any surface defect in said target area of the hot metal surface based on the output of said AND circuit.

7. An apparatus according to claim 6, wherein said selected region of said radiation is in the near-infrared region of the spectrum not shorter than 700 nm in wavelength, said external light being visible light having a wavelength in the range from about 400 nm to about 600 nm.

8. An apparatus according to claim 7, wherein said projector means comprises a mercury lamp.

9. An apparatus according to claim 6, wherein said first and second image pickup means are so arranged as to produce one of said first and second video signals after producing the other video signal, the apparatus further comprising memory means for storing the binary signal produced from said one of said first and second video signals, and synchronizing means for controlling said memory means such that said first and second binary signals are synchronously input to said AND circuit.

10. An apparatus according to claim 7, further comprising an optical lens system arranged so as to collect both said radiation radiated from said target area and said external light reflected from said target area, a light separating means for separating light passed through said lens system into a first portion which is near-infrared region of the spectrum and a second portion which is visible region of the spectrum and directing said first and second portions toward said first and second image pickup means, respectively, a near-infrared transmitting filter which is provided to said first image pickup means and cuts off visible region of the spectrum and an infrared absorbing filter which is provided to said second image pickup means and transmits visible region of the spectrum.

11. An apparatus according to claim 10, wherein said light separating means comprises a cold-mirror.

12. An apparatus according to claim 10, wherein said light separating means comprises a cold-filter.

13. An apparatus according to claim 6, wherein each of said first and second image pickup means comprises a linear array image sensor.