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Apparatus for determining the position of surface defects of a test objects with respect to an edge thereof

  • US 4,761,610 A
  • Filed: 10/08/1986
  • Issued: 08/02/1988
  • Est. Priority Date: 10/18/1985
  • Status: Expired due to Fees
First Claim
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1. Apparatus for examining the surface of an electrically conductive test piece for determining the location of surface defects, comprising:

  • at least one sensor including at least one proximity sensor, said one sensor operating with eddy current induction for producing signals in response to the detection of surface defects;

    a holder supporting and moving said at least one sensor in a scanning movement from side to side over said surface;

    means for receiving and processing said signals;

    means for determining the position of said at least one sensor in space;

    means responsive to said at least one proximity sensor for determining the position of at least one edge of the test piece at the point where said at least one sensor travels over said edge for each scan in a first direction over said surface; and

    calculating means responsive to said means for receiving and processing and said means for determining for calculating at least one of the position and orientation of a surface defect relative to the latest determined position of said at least one edge.

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