Apparatus for determining the position of surface defects of a test objects with respect to an edge thereof

• US 4,761,610 A
• Filed: 10/08/1986
• Issued: 08/02/1988
• Est. Priority Date: 10/18/1985
• Status: Expired due to Fees

• Current Assignee: Asea Aktiebolag (ABB Limited), Tornbloms Kvalitetskontroll AB Swedish Corporation
• Original Assignee: ASEA AB & Tornbloms Kvalitetskontroll AB
• Inventors: Svegander, Lennart, Tornblom, Bengt
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): EDMONDS, WARREN
• Application Number:
  US06/917,067
• Time in Patent Office: 664 Days
• Field of Search: 324/207, 324/208, 324/226, 324/227, 324/234, 324/236, 324/239-243, 324/260-262, 324/224, 324/237, 901/9, 901/46, 901/49, 901/50
• US Class Current: 324/227
• CPC Class Codes: G01B 7/023 for measuring distance between sensor and object G01B7/082 and G01B7/102 take precedence
• CPC Class Codes: G01N 27/9013 Arrangements for scanning

Abstract

Apparatus for determining the location of surface defects on a test piece of electrically conductive material by scanning the surface with at least one sensor arrangement comprising proximity sensors based on eddy current induction. The test piece may be moveable, e.g. advanced, in relation to the holder arrangement which is arranged to move the sensor arrangement in a sweeping or scanning movement from one side of the test piece to the other. The position of the edge of the test piece, is determined successively, e.g. for each scan cycle and the location of detected cracks is calculated with a starting point from the detected edge position.

Claims

1. Apparatus for examining the surface of an electrically conductive test piece for determining the location of surface defects, comprising:

at least one sensor including at least one proximity sensor, said one sensor operating with eddy current induction for producing signals in response to the detection of surface defects;

a holder supporting and moving said at least one sensor in a scanning movement from side to side over said surface;

means for receiving and processing said signals;

means for determining the position of said at least one sensor in space;

means responsive to said at least one proximity sensor for determining the position of at least one edge of the test piece at the point where said at least one sensor travels over said edge for each scan in a first direction over said surface; and

calculating means responsive to said means for receiving and processing and said means for determining for calculating at least one of the position and orientation of a surface defect relative to the latest determined position of said at least one edge.

2. Apparatus according to claim 1, wherein said holder moves said at least one sensor from one side of the test piece to the other in a scanning movement;

and in that at least one of the sensors is held in motion, so that said at least one sensor executes movement at greater speed, independent of the scanning movement, and movement in a direction different to said scanning movement.

3. Apparatus according to claim 1 for examining the surface of a test piece which is advanced in a direction substantially transverse to the direction of movement of said holder means for determining the position of the test piece receives a passing signal when at least one of the leading edge and rear edge of the test piece passes a predetermined position;

further comprising a speedometer measures the speed of the test piece and feeds the measuring signal to the means for determining the position of the test piece, said means calculating the mutual position at that time of the test piece, on the basis of the obtained applied signals.

4. Apparatus according to claim 3, wherein for each scan of said at least one sensor transversely across the test piece a part measurement of the movement of the test piece in the forward direction is carried out from the time at which said at least one sensor leaves the one side of the test piece and moves towards the other side thereof;

and when said at least one sensor has reached said other side and said at least one sensor bas been brought to a stationary state, this stationary state is maintained until the partial measurement indicates that the test piece has been moved through a pre-determined distance, whereafter said at least one sensor is caused to scan in the opposite direction and partial measurement of the movement of the test piece is recommenced.

5. Apparatus according to claim 1, further comprising a proximity sensor supported by said holder and responsive to a change in the signal of said means for determining the position of said at least one sensor of a character indicating a transition from measurement of the test piece and essentially empty space or vice-versa indicating that said at least one sensor has moved outwardly or inwardly over an edge of said test piece.

6. Apparatus according to claim 5, wherein said means for determining the position of the test piece obtains a signal based on a signal obtained from a moving sensor in said at least one sensor.

7. Apparatus according to claim 5, wherein means for determining the position of the test piece obtains a signal based on a signal from a stationary sensor.

8. Apparatus according to claim 5, wherein upon the occurrence of of said change in signal said means for determining the position determines the position of the sensor and initiates a check procedure to ascertain whether the sensor is located within an area in which an edge of the test piece can probably be found.

9. Apparatus according to claim 5, wherein when obtaining an edge indicating signal which indicates a transition from measuring against the test piece to measuring against essentially empty space, the means for determining the position of the test piece produces a signal which indicates that outward movement of the holder shall be stopped, either directly or after a given delay subsequent to receiving the edge indicating signal.