Measurement instruments with multiple operation levels

• US 4,763,117 A
• Filed: 05/26/1987
• Issued: 08/09/1988
• Est. Priority Date: 03/23/1983
• Status: Expired due to Term

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Moser, David B., Blattner, John D., Deleganes, Sam M.
• Primary Examiner(s): Weldon, Ulysses
• Application Number:
  US07/054,093
• Time in Patent Office: 441 Days
• Field of Search: 324/114, 324/115, 324/73 AT, 371/15-29, 364/73 R, 364/200, 364/900, 340/365 S, 340/712
• US Class Current: 345/156
• CPC Class Codes: G01R 13/20 Cathode-ray oscilloscopes

Abstract

A measurement instrument has a plurality of operation levels with different respective sets of operational functions associated therewith. Each operational function has at least two independently selectable characteristics related thereto. When an operation level of the instrument is selected, the instrument displays the characteristics related to each operational function associated with the selected operation level, and the operator is able to select one characteristic related to the or each operational function associated with the operation level. The characteristics related to at least one of the operational functions may each have a single value, e.g. relating to a mode of operation of the instrument. If one of the characteristics has a range of values, a value of that characteristic may be selected within the range.

Claims

1. A measurement instrument for processing an input signal comprising:

means for selecting one of a plurality of available operation levels for the measurement instrument, each of said available operation levels having a plurality of operational functions and each of said operational functions having at least two independently selectable characteristics, wherein the plurality of available operation levels include a higher level and a lower level, the set of operational functions associated with the lower level being a sub-set of the set of operational functions associated with the higher level;

means for displaying the characteristics related to each operational function associated with the selected operation level;

means for selecting from the displayed characteristics one characteristic related to each operational function associated with the selected operation level, the selected characteristics defining a plurality of parameters for processing the input signal; and

means operative when the lower level is selected for automatically placing operational functions associated with the higher level, but not with the lower level, in a default setting.

2. An instrument according to claim 1, wherein the characteristics related to at least one of the operational functions each have a single value.

3. An instrument according to claim 1, wherein at least one of the characteristics related to one of the operational functions has a range of values, and the instrument comprises means for selecting a value of said one characteristic within said range.

4. A measurement instrument having:

input means for receiving at least one information-bearing input signal;

processing means for processing the information borne by said information-bearing signal according to a plurality of selectable parameters;

output means for making the result of the processing means available externally of the processing means; and

user interface means for allowing a user of the instrument to select one of a plurality of available operation levels for the instrument, each operation level having a plurality of operational functions and each operational function having at least two independently selectable characteristics, for displaying to the user the characteristics related to each operational function associated with the selected operation level, and for allowing the user to select from the displayed characteristics one characteristic related to each operational function associated with the selected operation level, thereby defining the selectable parameters for the processing means, wherein the plurality of available operation levels include a higher level, an intermediate level and a lower level, the number of operational functions associated with the intermediate level being greater than the number of operational functions associated with the lower level and being less than the number of operational functions associated with the higher level, and wherein the processing means are operative when the lower level is selected to place functions associated with the intermediate or upper level, but not with the lower level, in a default setting, and when the intermediate level is selected to place operational functions associated with the upper level, but not the intermediate level, in a default setting.

5. An instrument according to claim 4, wherein the input means comprise probe means for connection to an electronic device under test for delivering said information-bearing signal to the processing means.

6. A method for processing an input signal comprising the steps of:

selecting one of a plurality of available operation levels for processing the input signal, each of said available operation levels having a plurality of operational functions and each of said operational functions having at least two independently selectable characteristics;

displaying the characteristics related to each operational function associated with the selected operation level;

selecting from the displayed characteristics one characteristic related to each operational function associated with the selected operation level, the selected characteristics defining a plurality of parameters for processing the input signal; and

automatically selecting the characteristics for operational functions not displayed for the selected operation level, the displaying step displaying the characteristics related to a sub-set of the operational functions associated with the selected operation level.