Methods and apparatus for detecting negative ions from a mass spectrometer

• US 4,766,312 A
• Filed: 05/15/1987
• Issued: 08/23/1988
• Est. Priority Date: 05/15/1987
• Status: Expired due to Fees

• Current Assignee: Perseptive Biosystems Incorporated (Ecovyst, Inc.)
• Original Assignee: Vestec Corp (Ecovyst, Inc.)
• Inventors: Vestal, Marvin L., Fergusson, Gordon J.
• Primary Examiner(s): Anderson, Bruce C.
• Assistant Examiner(s): Berman, Jack I.
• Application Number:
  US07/049,928
• Time in Patent Office: 466 Days
• Field of Search: 250/281, 250/292, 250/299, 250/283, 313/103 R, 328/227, 324/71.3
• US Class Current: 250/281
• CPC Class Codes: H01J 49/025 Detectors specially adapted to particle spectrometers data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29

Abstract

Improved methods and apparatus are disclosed for detecting negative ions and, more particularly, for detecting negative ions produced from a quadrupole mass spectrometer. By modulating the ion beam either at the ion source or within the ion focusing system, the output current from the electron multiplier detector is a pulsating current which is then capacitively or inductively coupled from a high direct current potential to ground level. Electronics operating at ground level are employed to correct the current signal distortion due to the capacitive or inductive coupling of the detector output current. The present invention enables substantially increased detector sensitivity to negative ions compared to prior art equipment, and does not require expensive and complex preamplifier circuitry. The techniques of the present invention allow both positive and negative ions to be detected utilizing the same basic equipment, thereby increasing equipment versatility and reducing costs.

Claims

1. An improved mass spectrometry system for analyzing the composition of a sample, including an ion source and focusing means for generating an ion beam having ions representative of the sample, a mass analyzer for scanning selected ions from the beam either at a specific atomic mass unit or over a range of atomic mass units, and an ion detector having an electron multiplier with an anode and cathode for receiving ions from the beam discharged from the mass analyzer and for providing a detector output signal indicative of the intensity of ions at a specific atomic mass unit and representative of the composition of the sample, the system further comprising:

power supply means for charging the cathode at a high negative potential to attract positive ions or at a high positive potential to attract negative ions while maintaining the anode at a positive potential relative to the cathode;

means for modulating the ion beam to the mass analyzer for producing a modulated ion beam to the detector and a modulated high-voltage output signal from the detector;

circuitry means for capacitively or inductively coupling the modulated high-voltage output signal to ground and providing a coupled output signal functionally related to the modulated high-voltage output signal;

sensing means for measuring distortion of the coupled output signal introduced by the capacitive or inductive coupling of the modulated high-voltage output signal to ground; and

signal modification means for correcting the coupled output signal in response to the measured coupled output signal distortion to provide a modified coupled output signal representative of the modulated high-voltage output signal and thus the composition of the sample.

2. An improved system as defined in claim 1, wherein the cathode of the electron multiplier is charged in the range of from +1kV to +4kV while the anode of the electron multiplier is maintained in the range of from +1kV to +3kV relative to the cathode.

3. An improved system as defined in claim 1, wherein the cathode of the electron multiplier is charged in the range of from-1kV to -5kV while the anode is maintained in the range of from +1kV to +3kV relative to the cathode.

4. An improved system as defined in claim 1, wherein the sensing means generates a correction signal as a function of a peak of the coupled output signal.

5. An improved system as defined in claim 4, wherein a decay time constant of the correction signal is less than a decay time constant of the coupled output signal.

6. An improved system as defined in claim 5, wherein the decay time constant of the correction signal is substantially equal to the decay time constant of the coupled output signal.

7. An improved system as defined in claim 1, wherein the circuitry means further comprises:

a current to voltage converter for converting a current value of the coupled output signal to a voltage output indicative of the current value; and

offsetting means for maintaining a constant voltage output in response to preselected low-level variations in the input current to the converter while the voltage output remains indicative of current values for coupled output signals representative of the composition of the sample.

8. An improved negative ion detector means for a scanning mass spectrometry system for analyzing the composition of a sample, the system including an ion source for producing an ion beam having ions representative of the sample, a mass analyzer for scanning selected ions from the beam over a range of atomic mass units, and power supply means for maintaining a cathode of an electron multiplier of the detector at a high positive potential and an anode of the electron multiplier at a higher positive potential for attracting negative ions, the detector means being charged by the power supply means for receiving negative ions discharged from the mass analyzer and providing a high-voltage output signal over the range of atomic mass units for analyzing the composition of the sample, the improved negative ion detector means further comprising

10. An improved negative ion detector means as defined in claim 8, wherein the circuitry means capacitively couples the high-voltage output signal to ground potential.

11. An improved negative ion detector means as defined in claim 8, wherein the cathode of the electron multiplier is charged by the power supply means to the range of from +1kV to +4kV while the anode of the electron multiplier is maintained in the range of from +2kV to +5kV.

12. An improved negative ion detector means as defined in claim 8, wherein the sensing means generates a correction signal as a function of a peak of the coupled output signal.

13. An improved negative ion detector means as defined in claim 11, wherein a decay time constant of the correction signal is less than and substantially equal to a decay time constant of the coupled detector output signal.

15. A method as defined in claim 13, wherein the cathode of the electron multiplier is charged in the range of from +1kV to +4 kV while the anode of the electron multiplier is maintained in the range of from +2kV to +5kV.

16. A method as defined in claim 13, wherein the anode of the electron multiplier is maintained in the range of from -1kV to -4kV while the cathode is charged in the range of from -2kV to -5kV.

17. A method as defined in claim 13, wherein the step of measuring distortion of the coupled output signal comprises generating a correction signal as a function of a peak of the coupled output signal.

18. A method as defined in claim 16, wherein a selected decay time constant of the correction signal is less than a selected decay time constant of the coupled output signal.

19. A method as defined in claim 17, wherein the selected decay time constant of the correction signal is substantially equal to the selected decay time constant of the coupled output signal.

20. A method as defined in claim 13, wherein the modulated high-voltage output signal is capacitively coupled to ground.

21. A method as defined in claim 13, further comprising:

converting a current value of the coupled output signal to a voltage output indicative of the current value; and

maintaining a constant voltage output in response to preselected low-level variations in the current input while the voltage output remains indicative of current values for coupled output signals representative of the composition of the sample.

9. circuitry means for capacitively or inductively coupling the high-voltage output signal to ground potential and providing a coupled output signal functionally related to the high-voltage output signal;

sensing means for measuring distortion of the coupled output signal introduced by the capacitive or inductive coupling; and

correcting means for altering the coupled output signal in response to the measured coupled output signal distor- tion to provide a modified essentially ground-voltage coupled output signal representative of the high-voltage output signal.

14. In a mass spectrometry system for analyzing the composition of a sample, the system including an ion source for producing an ion beam having ions representative of the sample, a mass analyzer for scanning selected ions from the beam either at specific atomic mass unit or over a range of atomic mass units, and an ion detector having an electron multiplier with an anode and cathode for receiving ions from the beam discharged from the mass analyzer, an improved method of obtaining an output signal indicative of the intensity, of ions at a specific atomic mass unit and representative of the composition of the sample, the method comprising:

charging the cathode at a high negative potential to attract positive ions or at a high positive potential to attract negative ions while maintaining the anode at a positive potential relative to the cathode;

modulating the ion beam to the mass analyzer to produce a modulated ion beam to the detector and a modulated high-voltage output signal from the detector;

capacitively or inductively coupling the modulated high-voltage output signal to ground and providing a coupled output signal functionally related to the modulated high-voltage output signal;

measuring distortion of the coupled output signal introduced by the capacitive or inductive coupling of the modulated high-voltage output signal to ground; and

correcting the coupled output signal in response to the measured coupled output signal distortion to provide an essentially ground-voltage modified coupled output signal representative of the modulated high-voltage output signal.