Fault diagnostic system incorporating behavior models

• US 4,766,595 A
• Filed: 11/26/1986
• Issued: 08/23/1988
• Est. Priority Date: 11/26/1986
• Status: Expired due to Fees

• Current Assignee: Alliedsignal Inc. (Honeywell International Inc.)
• Original Assignee: Alliedsignal Inc. (Honeywell International Inc.)
• Inventors: Gollomp, Bernard P.
• Primary Examiner(s): Smith, Jerry
• Assistant Examiner(s): BEAUSOLIEL JR, ROBERT W
• Application Number:
  US06/935,651
• Time in Patent Office: 636 Days
• Field of Search: 371/15, 371/16, 371/17, 371/18, 371/20, 371/23, 371/29, 324/73 R, 324/73 At, 364/200 MS File, 364/900 MS File
• US Class Current: 714/33
• CPC Class Codes: G01R 31/3183 Generation of test inputs, e.g. test vectors, patterns or sequences
• CPC Class Codes: G06F 11/2257 using expert systems
• CPC Class Codes: G06F 11/261 by simulating additional hardware, e.g. fault simulation

Abstract

A fault diagnostic system for a unit under test is disclosed which features behavior models for incorporating design knowledge of the unit under test into the system so as to implement a specification-based diagnostic approach while reducing the number of diagnostic tests. The arrangement is such that the featured diagnostic capabilities can be used with automatic test equipment or test instrumentation, and may be used to provide test programs for the automatic test equipment.

Claims

1. A fault diagnostic system for a unit under test, characterized by:

a plurality of model data bases for modeling and providing unit under test behavior data including first model data bases for modeling and providing unit under test parts connectivity data, second model data bases for modeling and providing unit under test parts attributes data, and third model data bases for modeling and providing unit under test behavior, failure modes and effects analysis, and functional data;

means bidirectionally connected to the plurality of model data bases for receiving the data therefrom and for converting the received data into a predetermined context and format, and for transmitting the converted data to the plurality of model data bases;

a model bididrectionally connected to the converting means and receiving the converted data therefrom for modeling and providing failure modes and effects analysis data and for transmitting said data to the converting means;

means bidirectionally connected to the converting means and to the failure modes and effects analysis data means and receiving the converted data and the failure modes and effects analysis data for providing modifying data, and for transmitting the modifying data to the converting means and to the failure modes and effects analysis data means; and

means bidirectionally connected to the converting means and to the modifying data means and receiving the converted data and the modifying data for modeling both good and faulty performance of the unit under test and for providing corresponding data, and for transmitting the corresponding data to the converting means and to the modifying data means.

2. A system as described by claim 1, further characterized by:

means bidirectionally connected to the modifying data means and to one of the plurality of model data bases for receiving the modifying data and the unit under test behavior data from the one of the model data bases for modelling and providing other unit under test behavior data, and for transmitting said other unit under test behavior data to the modifying data means and to the one of the model data bases.

3. A system as described by claim 2, further characterized by:

means bidirectionally connected to the means for modelling and providing other unit under test behavior data for receiving said data for providing test program data, and for transmitting said test program data to the means for modelling and providing other unit under test behavior data;

means bidirectionally connected to the test programs data means for receiving the test program data therefrom for providing an automatic test equipment program, with the test program data means being responsive to the automatic test equipment program; and

automatic test equipment bidirectionally connected to the automatic test equipment program means and to the unit under test for providing data for testing said unit under test and for transmitting said data to the automatic test equipment means, and said unit under test responding to the testing data for transmitting data to the automatic test equipment.

4. A system as described by claim 3, further characterized by:

6. A system as described by claim 4, further characterized by:

memory means bidirectionally connected to the test execution data means and to the test parameter means for receiving and storing the test execution data and for transmitting the stored data to the test execution means, and for transmitting the stored data to the test parameter means and for receiving the test parameters therefrom.

8. A system as described by claim 6, further characterized by:

man/machine interface means bidirectionally connected to the test explanation data means and to the test parameter means for interacting with the data from the test explanation means and with the test parameters from the test parameter means, and for providing first and second data commensurate with said interaction, and transmitting the first data to the test parameter means and transmitting the second data to the test explanation means.

10. A system as described by claim 2, wherein the one of the model data bases is characterized by:

model data bases for modeling and providing unit under test behavior, failure modes and effects analysis, and functional data.

5. means bidirectionally connected to the means for modeling and providing other unit under test behavior data for receiving said unit under test behavior data for providing test execution data, and for transmitting said test execution data to the means for modeling and providing other unit under test behavior data;

means bidirectionally connected to the test execution data means for receiving said test execution data for providing test parameters, and for transmitting said test parameters to the test execution data means; and

test instrumentation bidirectionally connected to the test execution data means and to the unit under test for providing data for testing said unit commensurate with said test parameters and for transmitting said data to the test execution means, and said unit under test responding to the testing data for transmitting data to the test instrumentation.

7. A system as described by claim 5, further characterized by:

means bidirectionally connected to the test parameter means and to the memory means, and receiving the test parameters from the test parameter means and the data stored by the memory means for providing test explanation data, and transmitting the test explanation data to the test parameter means, and transmitting said test explanation data to the memory means for accessing said memory means.

9. A system as described by claim 7, further characterized by:

the memory means connected to the converting means for feeding back the stored test execution data to the converting means.