Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out

• US 4,771,230 A
• Filed: 10/02/1986
• Issued: 09/13/1988
• Est. Priority Date: 10/02/1986
• Status: Expired due to Fees

• Current Assignee: Testamatic Incorporated
• Original Assignee: Testamatic Incorporated
• Inventors: Zeh, Robert M.
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): BURNS, WILLIAM
• Application Number:
  US06/914,308
• Time in Patent Office: 712 Days
• Field of Search: 324/51, 324/52, 324/54, 324/73 PC, 324/73 R, 324/72.5, 324/158 R, 324/158 F, 324/115, 324/990 R, 324/116, 324/123 R, 250/484.1 R, 365/116, 361/225, 361/230, 361/231
• US Class Current: 324/459
• CPC Class Codes: G01R 1/072 containing ionised gas
• CPC Class Codes: G01R 31/2805 Bare printed circuit boards
• CPC Class Codes: G01R 31/304 of printed or hybrid circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58

Abstract

A method and system for the electrical and electro-optical inspection and testing of unpopulated electronic printed circuit boards, ceramic substrates and other like items which have conductive pathways formed thereon, vias, through-connectors and other interconnected conducting surfaces. The item under test is placed within a sealable gastight chamber filled with an ionizable gaseous atmosphere, such as argon, at low pressure. An electro-luminescent gas plasma discharge is produced within the chamber between a grid placed either over or below the item under test by application of a positive polarity potential to the grid and selective application of a constant current negative potential to particular test points on the item to be tested via a computer controlled movable probe. In one embodiment of the invention, the resulting electro-luminescent gas plasma discharge resistance is measured and compared by a computer to a standard resistance value for the particular item under control at a particular setting of the movable probe as a measure of the conductivity characteristics of the item under test. Other embodiments of the invention, may also include computer controlled electro-optic scanning of the surfaces of the item under test by a scanning photometer detector. The output from the scanning photometer detector is supplied to a computer for comparison to a standard prestored in the computer from a previously tested good board or substrate. The two techniques may be combined in a single system which can inspect either one or both sides of a test circuit board or substrate.

Claims

1. An improved testing system employing gaseous discharge within a sealable substantially gastight chamber for the electrical testing of items such as printed circuit boards, and ceramic substrates and for continuity and other electrical conductivity characteristics, said chamber having a readily opened and closed access opening for placement of items under test therein, means for introducing a gaseous atmosphere capable of electro-luminescence at low pressures into the sealable chamber with an item to be tested in place, movable probe means disposed within the sealable chamber for coupling one terminal of a variably controlled constant current source of electric potential to desired test points located on the surface of an item under test, a grid-like array of conductive wires lying in the same plane within the sealable chamber and spaced-apart from the item under test, means for coupling a remaining opposite polarity potential terminal of said constant current source of electric potential to the grid-like array of conductive wires whereby electro-luminescent plasma is produced in the gaseous atmosphere within the sealable chamber around test points contacted by said probe means and around all conductive points on the item under test having electrical continuity therewith which are exposed to the gaseous atmosphere, and measuring means for measuring the voltage drop produced across the electro-luminescent plasma for respective settings of the movable probe for comparison to a standard and use as a measure of the continuity and other electrical conductivity characteristics of the item under test.

2. A testing system according to claim 1 wherein the grid-like array of conductive wires is comprised by a plurality of individual, spaced-apart, parallel, extremely fine exposed conductors whose conductive surfaces are directly contacted by the gasaous atmosphere with all of the conductors in the array lying within the same plane that is substantially parallel with a planar surface of an item under test and being maintained at substantially the same electrical potential and wherein each individual conductor in the array is connected in series electrical circuit relationship with at least one respective voltage limiting resistor that is physically located outside the sealable gastight chamber.

3. A testing system according to claim 2 wherein each individual conductor wire is suitably connected in series circuit relationship with a plurality of different value voltage limiting resistors that are selectively placed in operating series electrical circuit relationship with the respective conductor wires by a respective selector switch connected between each respective voltage limiting resistor and a constant current power supply terminal whereby any particular desired value voltage limiting resistor may be selectively connected in series circuit relationship with the respective electrical conductors by selective operation of the respective selector switches to thereby control the value of the electric potential supplied to the array of conductive wires.

4. A testing system according to claim 1 further including a second grid-like array of conductive wires lying in the same plane and spaced apart from the item under test on the side thereof opposite the first mentioned grid-like array of conductive wires and with said measuring means for selectively measuring the voltage drop acros the electro-luminescent plasma being responsive to the plasma produced between either of the respective grid-like arrays of conductive wires and the item under test or both.

5. A testing system according to claim 3 further including a second grid-like array of conductive wires lying in the same plane and spaced apart from the item under test on the side thereof opposite the first mentioned grid-like array of conductive wires and with said means for selectively measuring the voltage drop across the electro-luminescent plasma being responsive to the plasma produced between either of the respective grid-like arrays of conductive wires and the item under test or both.

6. A testing system according to claim 4 further including a commonly connected, conductive wire grid-like array excitation potential switching means connected in series circuit relationship between the constant current source of electric potential and both grid-like arrays of conductive wires for selectively controlling the application of excitation electric potential to either one or both grid-like arrays from said constant current source of potential.

7. A testing system according to claim 5 further including a commonly connected, conductive wire grid-like array excitation potential switching means connected in series circuit relationship between the constant current source of electric potential and both grid-like arrays of conductive wires for selectively controlling the application of excitation electric potential to either one or both arrays from said constant current source of potential.

8. An electro-optical testing apparatus according to claim 1 wherein the top of the gastight chamber is transparent and the conductor wires comprising the grid-like array of conductive wires are spaced-apart a sufficient distance between each other within the planar array and are sufficiently fine in cross section so that the array is substantially transparent and readily may be visually seen through and further including at least one electro-optical viewing instrument for viewing the item under test through the transparent top of the gastight chamber and scanning light areas on the surface of the item under test and deriving output electric signals representative of a characteristic electro-optical light pattern produced by the item under test for each setting of the movable probe.

9. An electro-optical testing apparatus according to claim 7 wherein the top and bottom of the gastight chamber are transparent and the conductor wires comprising the grid-like arrays of conductive wires are spaced-apart a sufficient distance between each other within the planar array and are sufficiently fine in cross section so that the array is substantially transparent and readily may be visually seen through and further including respective electro-optical viewing instruments viewing the upper and lower surfaces of the item under test through the respective transparent top and bottom of the gastight chamber for scanning light areas on the upper or lower surfaces of the item under test, or both, and deriving output electric signals representative of a characteristic electro-optical pattern produced by the item under test for each setting of the movable probe.

10. A testing system according to claim 1 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe and selective energization of the grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electro-luminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equals the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and for deriving an automatic output indication of the conductivity characteristics of the item under test.

11. A testing system according to claim 6 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe, automatic switching of the commonly connected conductive grid-like array selector switch to selectively energize either the upper or lower array of conductors, or both, and automatic energization of the selected grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electro-luminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equals the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and deriving an automatic output indication of the conductivity characteristics of the item under test.

12. A testing system according to claim 8 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe and selective energization of the grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electroluminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equals the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and deriving an automatic output indication of the conductivity characteristics of the item under test;

and said control computer being further responsive to the output from the electro-optical viewing instrument for comparing the output electric signals characteristic of the electro-optical light patterns for a preselected movable probe setting to thereby derive an output indication of the conformity of the light pattern to a prestored pattern as a measure of the conductivity characteristics of the item under test.

13. A testing system according to claim 9 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe, automatic switching of the commonly connected conductive array selector switch to selectively energize either the upper or lower grid-like array of conductors, or both, and automatic energization of the selected grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electroluminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equals the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and deriving an automatic output indication of the conductivity characteristics of the item under test;

and said control computer being further responsive to the output from either of the upper or lower electro-optical viewing instruments or both for comparing the output electric signals representative of the electro-optical light pattern to a preselected standard pattern stored in the control computer for the selected movable probe setting to thereby derive an output indication of the conformity of the light patterns to a prestored pattern as a measure of the conductivity characteristics of the item under test.

14. An improved testing system employing gaseous discharge within a sealable substantially gastight chamber for electrical testing of items such as printed circuit boards, and ceramic substrates for continuity and other electrical conductivity characteristics;

said chamber having a readily opened and closed access opening for placement of items under test therein;

automatically controlled means for purging and introducing a gaseous atmosphere capable of electro-luminescence at low pressures into the sealable chamber with an item to be tested in place;

automatically controlled movable probe means disposed within the sealable chamber for coupling one terminal of a variably controlled constant current source of electric potential to desired test points located on a surface of an item under test;

a grid-like array of conductive wires lying in the same plane within the sealable chamber and spaced-apart from the item under test;

automatically controlled means for coupling a remaining opposite polarity potential terminal of said constant current source of electric potential to the grid-like array of conductive wires whereby electro-luminescent plasma is produced in the gaseous atmosphere within the sealable chamber around test points contacted by said movable probe means and around all conductive points on the item under test having electrical continuity therewith which are exposed to the gaseous atmosphere;

measuring means for measuring the differences in voltage drop produced across the electroluminescent plasma for respective settings of the movable probe;

a central control computer having a display;

said control computer being responsive to the opening and closing of the access opening for automatically controlling a means for purging and refilling the gastight chamber with ionizable gas;

said control computer also being responsive to the position of the movable probe means and automatically controlling its repositioning at selected new settings in accordance with a predetermined schedule;

said control computer further serving automatically to control the timing of application and current value of the constant current source of potential to the array of conductive wires, and said control computer being further responsive to the measuring means for automatically deriving an indication of the electro-luminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance=Voltage/Current and for comparison of the derived Plasma Resistance value to a standard value for the particular setting of the movable probe for further deriving an automatic output indication of the conductivity characteristics of the item under test at that setting.

15. A testing system according to claim 14 wherein the grid-like array of conductive wires is comprised by a plurality of individual, spaced-apart, parallel, extremely fine exposed conductors whose conductive surfaces are directly contacted by the gaseous atmosphere with all of the conductors in the array lying within the same plane that is substantially parallel with a planar surface of an item under test and all the conductors being maintained at substantially the same electrical potential and wherein each individual conductor in the array is connected in series electrical circuit relationship with at least one respective voltage limiting resistor that is physically located outside the sealable gastight chamber.

16. A testing system according to claim 15 wherein each individual conductor wire is suitably connected in series circuit relationship with a plurality of different value voltage limiting resistors that are selectively placed in operating series electrical circuit relationship with the respective conductor wires by a respective selector switch connected between each respective voltage limiting resistor and the constant current power supply terminal with the settings of the selector switches being automatically controlled by said control computer whereby any particular desired value voltage limiting resistor may be selectively connected in series circuit relationship with the respective electrical conductors by selective operation of the respective selector switches automatically by the control computer pursuant to a desired program to thereby control the value of the electric potential supplied to the grid-like array of conductive wires.

17. A testing system according to claim 14 further including a second grid-like array of conductive wires lying in the same plane and spaced apart from the item under test on the side thereof opposite the first mentioned grid-like array of conductive wires and with said means for selectively measuring the voltage drop across the electro-luminescent plasma being responsive to the plasma produced between either of the respective grid-like arrays of conductive wires and the item under test or both.

18. A testing system according to claim 16 further including a second grid-like array of conductive wires lying in the same plane and spaced apart from the item under test on the side thereof opposite the first mentioned grid-like array of conductive wires and with said means for selectively measuring the voltage drop across the electro-luminescent plasma being responsive to the plasma produced between either of the respective grid-like arrays of conductive wires and the item under test or both.

19. A testing system according to claim 18 further including a commonly connected, conductive wire grid-like array excitation potential switching means connected in series circuit relationship between the constant current source of electric potential and both grid-like arrays of conductive wires for selectively controlling the application of excitation electric potential to either one or both grid-like arrays from said constant current source of potential with said commonly connected switching means being controlled by said control computer.

20. An electro-optical testing system according to claim 14 wherein the top of the gastight chamber is transparent and the conductor wires comprising the grid-like array of conductive wires are spaced-apart a sufficient distance between each other within the planar array and are sufficiently fine in cross section so that the array is substantially transparent and readily may be visually seen through and further including at least one electro-optical scanning photometer detector viewing the item under test through the transparent top of the gastight chamber for scanning light areas on the surface of the item under test and deriving output electric signals representative of characteristic electro-optical light patterns produced by the item under test for each setting of the movable probe.

21. An electro-optical testing system according to claim 19 wherein the top and bottom of the gastight chamber are transparent and the conductor wires comprising the grid-like arrays of conductive wires are spaced-apart a sufficient distance between each other within the planar array and are sufficiently fine in cross section so that the array is substantially transparent and readily may be visually seen through and further including respective electro-optical scanning photometer detectors viewing the upper and lower surfaces of the item under test through the respective transparent top and bottom of the gastight chamber for scanning light areas on the upper and lower surfaces of the item under test and deriving output electric signals representative of characteristic electro-optical patterns produced on the item under test for each setting of the movable probe.

22. A method of testing conductivity characteristics of ceramic substrates, and printed circuit boards which have electrically conductive interconnected parts, pads, pathways, vias and their conductive surfaces for the existence of discontinuities (breaks), undesired conductive areas (shorts) or other irregularities in size or shape using a testing system employing an electro-luminescent plasma produced in a gaseous atmosphere contained within a sealable, substantially gastight test chamber within which an item under test is supported;

the testing system further including a grid-like array of parallel conductor wires lying in substantially the same plane and arrayed within the sealable chamber over an item under test and spaced apart therefrom, and movable probe means for contacting selected test points on an item under test to produce an excitation electric field across the gaseous atmosphere and induce the formation of electro-luminescent plasma therein;

said method comprising;

introducing an item to be tested into the interior of the test chamber and sealing it closed in a substantially gastight manner;

introducing a gaseous atmosphere capable of electro-luminescence at low pressure into the interior of the test chamber along with the item under test;

coupling one terminal of a constant current source of excitation electric potential with the movable probe means to selected test points located within an x-y plane on the surface of a item under test;

coupling an opposite polarity potential terminal of the variably controlled constant current source of electric potential to the grid-like array of parallel conductor wires whereby electro-luminescent plasma is produced within the chamber around the test points contacted by the movable probe means and around all conductive points on the item under test having electrical continuity therewith which are exposed to the gaseous atmosphere; and

measuring differences in voltage drop produced across the electro-luminescent plasma for respective settings of the movable probe means for comparison to a standard and use as a measure of the continuity and other electrical conductivity characteristics of the item under test.

23. A testing method according to claim 22 wherein the grid-like array of conductive wires is comprised by a plurality of individual, spaced-apart, parallel, extremely fine exposed conductors whose conductive surfaces are directly contacted by the gaseous atmosphere with all of the conductors in the array lying within the same plane that is substantially parallel with the planar surface of an item under test with all the conductors in the array and being maintained at substantially the same electrical potential and wherein each individual conductor in the array is connected in series electrical circuit relationship with at least one respective voltage limiting resistor that is physically located outside the sealable gastight chamber.

24. A method system according to claim 23 wherein each individual conductor wire is suitably connected in series electrical circuit relationship with a plurality of different value voltage limiting resistors that are selectively placed in operating series electrical circuit relationship with the respective conductor wires by a respective selector switch connected between each respective voltage limiting resistor and the constant current power supply terminal whereby any particular desired value voltage limiting resistor may be selectively connected in series circuit relationship with the respective electrical conductors by selective operation of the respective selector switches to thereby control the value of the electric potential supplied to the array of conductive wires.

25. A testing method according to claim 22 further including a second grid-like array of conductive wires lying in the same plane and spaced apart from the item under test on the side thereof opposite the first mentioned grid-like array of conductive wires and with said means for selectively measuring the voltage drop across the electro-luminescent plasma being responsive to the plasma produced between either of respective grid-like arrays of conductive wires and the item under test or both.

26. A testing method according to claim 24 further including a second grid-like array of conductive wires lying in the same plane and spaced apart from the item under test on the side thereof opposite the first mentioned grid-like array of conductive wires and with the means for selectively measuring the voltage drop across the electro-luminescent plasma being responsive to the plasma produced between either of the respective grid-like arrays of conductive wires and the item under test or both.

27. A testing method according to claim 25 further including commonly connected, conductive wire grid-like array excitation potential switching means connected in series circuit relationship between the constant current source of electric potential and both grid-like arrays of conductive wires for selectively controlling the application of excitation electric potential to either one or both grid-like arrays from said constant current source of potential.

28. A testing method according to claim 26 further including commonly connected, conductive wire grid-like array excitation potential switching means connected in series circuit relationship between the constant current source of electric potential and both grid-like arrays of conductive wires for selectively controlling the application of excitation electric potential to either one or both grid-like arrays from said constant current source of potential.

29. An electro-optical testing method according to claim 22 wherein the top of the gastight chamber is transparent and the conductor wires comprising the grid-like array of conductive wires are spaced-apart a sufficient distance between each other within the planar array and are sufficiently fine in cross section so that the array is substantially transparent and readily may be visually seen through and further including at least one electro-optical viewing instrument for viewing the item under test through the transparent top of the gastight chamber for scanning light areas on the surface of the item under test and deriving output electric signals representative of characteristic electro-optical light patterns produced by the item under test for each setting of the movable probe.

30. An electro-optical testing method according to claim 28 wherein the top and bottom of the gastight chamber are transparent and the conductor wires comprising the grid-like arrays of conductive wires are spaced-apart a sufficient distance between each other within the planar array and are sufficiently fine in cross section so that the array is substantially transparent and readily may be visually seen through and further including respective electro-optical viewing instruments viewing upper and lower surfaces of the item under test through the respective transparent top and bottom of the gastight chamber for scanning light areas on the upper and lower surfaces of the item under test and deriving output electric signals representative of characteristic electro-optical patterns produced by the item under test for each setting of the movable probe.

31. A testing method according to claim 22 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe and selective energization of the grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electroluminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equals the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and for deriving an automatic output indication of the conductivity characteristics of the item under test.

32. A testing method according to claim 27 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe, automatic switching of the commonly connected conductive grid-like array selector switch to selectively energize either the upper or lower grid-like array of conductors, or both, and automatic energization of the selected grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electroluminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equal the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and deriving an automatic output indication of the conductivity characteristics of the item under test.

33. A combined electrical and electro-optical testing method according to claim 29 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe and selective energization of the grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electroluminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equal the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and deriving an automatic output indication of the conductivity characteristics of the item under test;

and said control computer being further responsive to the output from the electro-optical viewing instrument for comparing the output electric signals characteristic of the electro-optical light patterns produced at a preselected movable probe setting to thereby derive an output indication of the conformity of the light pattern to a prestored pattern as a further measure of the conductivity characteristics of the item under test.

34. A combined dual sided electrical and electro-optical testing method according to claim 30 further including a central control computer having a display for automatically controlling operation of the sealable gastight chamber including automatic purging and recharging of the ionizable gas after placement of a new item to be tested in the gastight chamber, automatic positioning of the movable probe, automatic switching of the commonly connected conductive grid-like array selector switch to selectively energize either the upper or lower grid-like arrays of conductors, or both, and automatic energization of the selected grid-like array of conductive wires from the variably controlled constant current source of electric potential at a preselected current setting, said control computer being responsive to the measuring means for automatically deriving an indication of the electro-luminescent plasma resistance at each movable probe setting pursuant to the relation Plasma Resistance equal the Voltage supplied by the source of electric potential divided by the Current for comparison to a standard resistance value for the setting stored in the computer and deriving an automatic output indication of the conductivity characteristics of the item under test;

and said control computer being further responsive to the output from either the upper or lower electro-optical viewing instrument or both for comparing the output electric signals characteristic of the electro-optical light patterns to a preselected standard pattern stored in the control computer for the selected movable probe setting to thereby derive an output indication of the conformity of the light patterns to a prestored pattern as a further measure of the conductivity characteristics of the item under test.