Non-contact proximity switch

• US 4,771,359 A
• Filed: 12/24/1986
• Issued: 09/13/1988
• Est. Priority Date: 12/28/1985
• Status: Expired due to Term

• Current Assignee: Walter Link
• Original Assignee: Walter Link
• Inventors: Link, Walter
• Primary Examiner(s): Hix, L. T.
• Assistant Examiner(s): Porterfield, David
• Application Number:
  US06/946,065
• Time in Patent Office: 629 Days
• Field of Search: 361/179, 361/180
• US Class Current: 361/179
• CPC Class Codes: H03K 17/9537 in a resonant circuit

Abstract

A non-contact proximity switch with an oscillation circuit (L 1, C 1) which is activated in a step-like manner, has a reference voltage source (6) which produces at least one reference voltage level (U_ref) and has at least one comparator (5) which compares the amplitude of the transient response with the associated reference voltage level (U_ref) in order to be able to detect at least one value that is distinctive for the time curve of the decaying oscillation from at least one transient response of the oscillation circuit (L 1, C 1) after such an activation. At least one counter (7, 10) counts, at least within a portion of the decay period of the transient response, the number (DA) of the half-waves of the transient response, the peak of which deviated from the associated reference voltage level (U_ref) in one of the two directions.

Claims

1. A non-contact proximity switch with an oscillation circuit having a step-like activation, at least one switch element which affects the time curve of at least one transient response of the oscillation circuit in dependence on its distance from the oscillation circuit, and an evaluation circuit which detects at least one characteristic value for the time curve of the decaying oscillation from at least one transient response of the oscillation circuit after such an activation, comprising:

(a) a reference voltage source (6) producing at least one reference voltage level (U_ref),

(b) at least one comparator (5) which compares the amplitude of the transient response with an associated reference voltage level (U_ref), and

(c) at least one counter (7,

     10) which counts the number (DA) of those half-waves of the transient response at least within a portion of the decay period of the transient response, the peak value of which deviates from the associated reference voltage level (U_ref) in one of two directions.

2. A proximity switch according to claim 1, comprising at least one second counter (10) which is connected to the output of the comparator (5) like the first counter (7) and forms a digital value corresponding to the natural frequency of the transient response.

3. A proximity switch according to claim 2, wherein the second counter (10) is connected to the output of a gate circuit (8), the two inputs of which are connected with the output of the comparator (5) and with a frequency-stabilized clock generator (9) respectively, the repetition rate of which is greater than the natural frequency of the transient response.

4. A proximity switch according to claim 1, comprising a control stage (4) for a repeating step-like activation of the oscillation circuit and a setting of the counting processes of the counter (7, 10) to a certain number of transient responses.

5. A proximity switch according to claim 1, comprising switch element (11) having a magnetic and electrically conductive small metal plate, which influences the natural frequency (f_o) and the decay time constant (τ

) of the transient response.

6. A proximity switch according to claim 2, comprising switch element (11) having a magnetic and electrically conductive small metal plate, which influences the natural frequency (f_o) and the decay time constant (τ

) of the transient response.

7. A proximity switch according to claim 3, comprising switch element (11) having a magnetic and electrically conductive small metal plate, which influences the natural frequency (f_o) and the decay time constant (τ

) of the transient response.

8. A proximity switch according to claim 4, comprising switch element (11) having a magnetic and electrically conductive small metal plate, which influences the natural frequency (f_o) and the decay time constant (τ

) of the transient response.

9. A proximity switch according to claim 1, wherein the switch element consists of an electrically but not magnetically conductive material which essentially influences only the decay time constant (τ

) of the transient response.

10. A proximity switch according to claim 2, wherein the switch element consists of an electrically but not magnetically conductive material which essentially influences only the decay time constant (τ

) of the transient response.

11. A proximity switch according to claim 3, wherein the switch element consists of an electrically but not magnetically conductive material which essentially influences only the decay time constant (τ

) of the transient response.

12. A proximity switch according to claim 4, wherein the switch element consists of an electrically but not magnetically conductive material which essentially influences only the decay time constant (τ

) of the transient response.

13. A proximity switch according to claim 1, wherein the switch element consists of a ferrite material and essentially influences only the natural frequency (f_o) of the transient response.

14. A proximity switch according to claim 2, wherein the switch element consists of a ferrite material and essentially influences only the natural frequency (f_o) of the transient response.

15. A proximity switch according to claim 3, wherein the switch element consists of a ferrite material and essentially influences only the natural frequency (f_o) of the transient response.

16. A proximity switch according to claim 4, wherein the switch element consists of a ferrite material and essentially influences only the natural frequency (f_o) of the transient response.

17. A proximity switch according to claim 8, further including a digital memory contained in the activation and evaluation stage (1, 101) for a correction of the determined digital values by means of a selected tabulated assignment in the memory.

18. A proximity switch according to claim 9, containing hysteresis behavior curves for all detectable discrete distance positions, which curves are digitally programmed with regard to path dependency, in that at a given number (DA 1) of half-waves counted by the counter (7, 107), the switch is set to On, and at another number (DA 2) different from the mentioned number (DA 1), the switch is set to off.

19. A non-contact proximity switch, comprising:

at least one switch element (111) in which is arranged an oscillation circuit having a spool (L1) and condensor (C1) which have step-like activation, and an evaluation circuit (101), in which is provided an activation and evaluation spool (L0), said switch element (111) affects the time curve of at least one transient response of the oscillation circuit (L1, C1) in dependence on its distance from the activation and evaluation spool (L0) and said evaluation circuit (101) detects at least one characteristic value for the time curve of the decaying oscillation from at least one transient response of the oscillation circuit (L1, C1) after such an activation;

a spool (115) arranged in the switch element (111) magnetically coupled with the activation and evaluation spool (L0) and delivering the operating voltage to the circuit arranged in the switch element (111);

a reference voltage source (6) producing at least one reference voltage level (U_ref);

at least one comparator (5) which compares the reference voltage level (U_ref) with a voltage induced in the activation and evaluation spool (L0) by the oscillation circuit (L1, C1) and corresponding to the transient response; and

at least one counter (7,10) which counts the number (DA) of those half-waves of the transient response at least within a portion of the decay period of the transient response, the peak value of which deviates from the associated reference voltage (U_ref) in one of two directions.

20. A proximity switch according to claim 19, wherein a spool (115) of the switch element (111) delivers the operating voltage for an integrated circuit (114) in the switch element (111) by means of an inductive coupling to the spool (L0) of the activation and evaluation stage and the integrated circuit (114) actively influences the transient response of the switch element (111) by advantageously short-circuiting the spool (L1) after a given number of completed decay process repetitions.

21. A proximity switch according to claim 20, wherein the circuit (114) contains an electrically programmable and erasable fixed value memory in which a characteristic switch function can be stored for the identification of the switch element condition.

22. A proximity switch according to claim 19, comprising at least one second counter (10) which is connected to the output of the comparator (5) like the first counter (7) and forms a digital value corresponding to the natural frequency of the transient response.

23. A proximity switch according to claim 22, wherein said second counter is connected to the output of a gate circuit (8), the two inputs of which are connected with the output of the comparator (5) and with a frequency-stabilized clock generator (9), respectively, the repetition rate of which is greater than the natural frequency of the transient response.

24. A proximity switch according to claim 22, comprising a control stage (4) for a repeating step-like activation of the oscillation circuit and a setting of the counting processes of the counter (7,10) to a certain number of transient responses.

25. A proximity switch according to claim 19, further including a digital memory contained in the activation and evaluation stage (101) for a correction of the determined digital values by means of a selected tabulated assignment in the memory.

26. A proximity switch according to claim 19, wherein a spool (115) of the switch element (111) delivers the operating voltage for an integrated circuit (114) in the switch element (111) by means of an inductive coupling to the spool (L0) of the activation and evaluation stage and the integrated circuit (114) actively influences the transient response of the switch element (111) by advantageously short-circuiting the spool (L1) after a given number of completed decay process repetitions.