Packages for hybrid integrated circuit high voltage isolation amplifiers and method of manufacture

• US 4,780,795 A
• Filed: 11/17/1987
• Issued: 10/25/1988
• Est. Priority Date: 04/28/1986
• Status: Expired due to Term

• Current Assignee: Burr-Brown Corporation (Texas Instruments, Inc.)
• Original Assignee: Burr-Brown Corporation (Texas Instruments, Inc.)
• Inventors: Meinel, Walter B.
• Primary Examiner(s): Kucia, R. R.
• Application Number:
  US07/122,595
• Time in Patent Office: 343 Days
• Field of Search: 174/52 FP, 174/52 PE, 361/328, 361/329, 361/397, 361/402, 361/403, 361/406, 361/323, 361/433 W, 357/80
• US Class Current: 361/765
• CPC Class Codes: H01F 17/062 Toroidal core with turns of coil around it
• CPC Class Codes: H01G 4/012 Form of non-self-supporting electrodes
• CPC Class Codes: H01G 4/38 Multiple capacitors, i.e. structural combinations of fixed capacitors
• CPC Class Codes: H01L 2224/05554 being square
• CPC Class Codes: H01L 2224/05599 Material
• CPC Class Codes: H01L 2224/45099 Material
• CPC Class Codes: H01L 2224/48137 the bodies being arranged next to each other, e.g. on a common substrate
• CPC Class Codes: H01L 2224/48247 connecting the wire to a bond pad of the item
• CPC Class Codes: H01L 2224/48257 connecting the wire to a die pad of the item
• CPC Class Codes: H01L 2224/49171 Fan-out arrangements
• CPC Class Codes: H01L 23/642 Capacitive arrangements H01L23/49589, H01L23/645, H01L23/647, H01L23/66 take precedence; capacitive effects between wiring layers on the semiconductor body H01L23/5222
• CPC Class Codes: H01L 24/48 of an individual wire connector
• CPC Class Codes: H01L 24/49 of a plurality of wire connectors
• CPC Class Codes: H01L 25/165 Containers
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/00014 the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
• CPC Class Codes: H01L 2924/01005 Boron [B]
• CPC Class Codes: H01L 2924/01006 Carbon [C]
• CPC Class Codes: H01L 2924/01013 Aluminum [Al]
• CPC Class Codes: H01L 2924/01028 Nickel [Ni]
• CPC Class Codes: H01L 2924/0105 : Tin [Sn]
• CPC Class Codes: H01L 2924/01057 : Lanthanum [La]
• CPC Class Codes: H01L 2924/01074 : Tungsten [W]
• CPC Class Codes: H01L 2924/01078 : Platinum [Pt]
• CPC Class Codes: H01L 2924/01079 : Gold [Au]
• CPC Class Codes: H01L 2924/014 : Solder alloys
• CPC Class Codes: H01L 2924/14 : Integrated circuits
• CPC Class Codes: H01L 2924/15787 : Ceramics, e.g. crystalline carbides, nitrides or oxides
• CPC Class Codes: H01L 2924/181 : Encapsulation
• CPC Class Codes: H01L 2924/19041 : being a capacitor
• CPC Class Codes: H01L 2924/30105 : Capacitance
• CPC Class Codes: H01L 2924/30107 : Inductance
• CPC Class Codes: H05K 1/0306 : Inorganic insulating substrates, e.g. ceramic, glass
• CPC Class Codes: H05K 1/162 : incorporating printed capacitors
• CPC Class Codes: H05K 2201/09236 : Parallel layout
• CPC Class Codes: H05K 2201/10946 : Leads attached onto leadless component after manufacturing the component

Abstract

A dual cavity semiconductor package containing a high voltage (greater than 1500 volts) isolation amplifier includes a ceramic substrate with tungsten metalization thereon defining die bonding and wire bonding sites and interconnections in the two cavities for input and output circuitry of the isolation amplifier, respectively. The metalization also defines a pair of precisely matched planar fringe capacitors forming a high voltage small signal isolation barrier located between the two cavities. A layer of ceramic having apertures therein defining the two cavities is laminated over the substrate. The assembly is cofired at about 2,000° Centrigrade, causing ceramic to fill the gaps between the conductors of the fringe capacitors, providing very high voltage isolation therebetween. Separate tungsten sealing rings are provided around the peripheries of the cavities on the top surface of the second layer. In another embodiment of the invention, a single large cavity has spaced separate regions for input and output circuitry of the isolation amplifier.

Claims

1. In a hybrid integrated circuit, a planar capacitor comprising in combination:

(a) first and second coplanar metal film conductors, the first and second metal film conductors each having a plurality of closely, precisely spaced parallel portion and together forming a planar first fringe capacitor;

(b) dielectric material including (1) a first portion disposed directly on and entirely coating the parallel portions of the first and second metal film conductors and (2) a second portion bounding both a first cavity and a second cavity substantially spaced from the first cavity;

(c) end portions of the first and second metal film conductors extending into the first and second cavity, respectively, to form first and second terminals of the first fringe capacitor, the second portion of the dielectric material being sufficiently thick that the first and second cavities are large enough to contain first and second integrated circuit chips, respectively, the first and second integrated circuit chips including first and second bonding pads, respectively, and a first conductor connecting the first bonding pad to the end portion of the first metal film conductor, and a second conductor connecting the second bonding pad to the end portion of the second metal film conductor, the separation between the first and second metal film conductors being sufficiently high that the first fringe capacitor forms a high voltage isolation barrier between the first and second integrated circuit chips, the spacing between the first and second cavities being great enough to provide a high voltage electrical isolation between the first and second integrated circuit chips.

2. In a hybrid integrated circuit, the planar capacitor of claim 1 wherein the dielectric layer includes a layer of thick film glass.

3. In a hybrid integrated circuit, the planar capacitor of claim 1 wherein the first and second metal film conductors are refractory metal, and the dielectric layer includes a ceramic layer confired with the ceramic substrate and the refractory metal to fill the space between the parallel portions of the first and second metal film conductors with ceramic.

4. In a hybrid integrated circuit, the planar capacitor of claim 1 wherein the parallel portions of the first and second metal film conductors, respectively, define a pair of spaced spiral traces, the ends of which are rounded to prevent electrical arcing.

5. In a hybrid integrated circuit, the planar capacitor of claim 4 wherein the first and second metal film conductors are approximately ten mils wide and wherein the spacing therebetween is greater than 20 mils to provide electrical isolation between the first and second terminals of at least 1500 volts.

6. A hybrid integrated circuit comprising in combination:

(a) a ceramic substrate;

(b) a first planar capacitor including first and second coplanar metal film conductors on the ceramic substrate each having a first portion closely and precisely spaced from and parallel to the other and having a predetermined capacitive coupling to the other;

(c) a dielectric layer on the first parallel portions and on the substrate between the first parallel portions of the first and second metal film conductors, the dielectric layer including first and second openings exposing first and second areas, respectively, of the ceramic substrate and defining first and second cavities, respectively;

(d) a first terminal of the first planar capacitor including an exposed portion of the first metal film conductor extending into the first cavity and a second terminal of the first planar capacitor including an exposed portion of the second metal film conductor extending into the second cavity, the first palnar capacitor forming a high voltage isolation barrier between the first and second terminals;

(e) input integrated circuit chip means for producing a first pulse signal on the first terminal in response to an input signal, the first pulse signal being coupled across the isolation barrier to produce a second pulse signal to the second terminal; and

(f) output integrated circuit chip means for producing an output signal in response to the second pulse signal on the second terminal, the dielectric layer being sufficiently thick that (1) the first cavity is deep enough to contain the input integrated circuit chip means and a bonding wire bonded at one end to a bonding pad on the input integrated circuit chip means and bonded at another end to the exposed portion of the first metal film conductor and (2) the second cavity is deep enough to contain the output integrated circuit chip means and a bonding wire bonded at one end to a bonding pad on the output integrated circuit chip means and bonded at another end to the exposed portion of the second metal film conductor.

7. The hybrid integrated circuit of claim 6 including a second planar capacitor including third and fourth coplanar metal film conductors on the ceramic substrate, each having a second portion closely and precisely spaced from and parallel to the other and having the predetermined capacitive coupling to the other, a third terminal of the second planar capacitor including an exposed portion of the third metal film conductor extending into the first cavity and a fourth terminal of the second planar capacitor including an exposed portion of the fourth metal film conductor extending into the second cavity, the second planar capacitor being included in the high voltage isolation barrier.

8. The hybrid integrated circuit of claim 7 wherein the input circuit means produces a third pulse signal on the third terminal in response to the input signal, the third pulse signal being coupled across the isolation barrier to produce a fourth pulse signal on the fourth terminal, the output circuit means producing the output signal in response to the fourth pulse signal on the fourth terminal.

9. The hybrid integrated circuit of claim 8 wherein the predetermined capacitive coupling is approximately three picofarads.

10. The hybrid integrated circuit of claim 8 wherein the first closely, precisely spaced parallel portion includes spiral portions of the first and second metal film conductors.

11. The hybrid integrated circuit of claim 10 wherein the end portions of the first and second metal film conductors are rounded to avoid electrical arcing.

12. The hybrid integrated circuit of claim 7 wherein the first and second cavities are disposed on opposite sides of the isolation barrier.

13. The hybrid integrated circuit of claim 8 wherein the dielectric layer includes a layer of thick film glass.

14. A hybrid integrated circuit package comprising in combination:

(a) a ceramic substrate;

(b) first and second coplanar metal film conductors on the substrate, the first and second metal film conductors each having a closely, precisely spaced parallel portion and forming a planar first fringe capacitor;

(c) a dielectric layer on the parallel portions and on the substrate between the parallel portions;

(d) first and second openings in the dielectric layer exposing first and second areas, respectively, of the substrate, the first and second openings defining first and second cavities, respectively; and

(e) an end portion of the first metal film conductor extending into the first cavity, an end portion of the second metal film conductor extending into the second cavity, the dielectric layer being sufficiently thick that the first and second cavities each are deep enough to contain an integrated cirucit chip and a wire bond including a piece of bonding wire having one end bonded to a bonding pad on the integrated circuit chip and another end bonded to the metal film end portion in that cavity when a flat cover is placed on the dielectric layer over that cavity.

15. The hybrid integrated circuit package of claim 14 wherein the first and second cavities are approximately 40 mils deep.

16. The hybrid integrated circuit package of claim 14 wherein the capacitive coupling between the metal film conductors is approximately 3 picofarads and the spacing between them is greater than approximately 20 mils, to produce at least 1500 volts of electrical isolation between the end portions of the first and second metal film conductors extending into the first and second cavities, respectively.

17. A hybrid integrated circuit comprising in combination:

(a) a ceramic substrate;

(b) a first planar capacitor including first and second coplanar metal film conductors on the ceramic substrate each having a first portion closely and precisely spaced from and parallel to the other and having a predetermined capacitive coupling to the other;

(c) a dielectric layer on the first parallel portions and on the substrate between the first parallel portions of the first and second metal film conductors;

(d) a first terminal of the first planar capacitor including an exposed portion of the first metal film conductor extending beyond one side of the dielectric layer and a second terminal of the first planar capacitor including an exposed portion of the second metal film conductor extending beyond an opposite side of the dielectric layer, the first planar capacitor forming an isolation barrier between the first and second terminals;

(e) input circuit means for producing a first pulse signal on the first terminal in response to an input signal, the first pulse signal being coupled across the isolation barrier to produce a second pulse signal on the second terminal;

(f) output circuit means for producing an output signal in response to the second pulse signal on the second terminal; and

(g) a toroidal transformer disposed on the dielectric layer and having a primary winding coupled to the output circuit and a secondary winding coupled to the input circuit, wherein the primary winding includes a plurality of elongated strips of thin film metal on the ceramic substrate adjacent to the output circuit means and a plurality of wire bond loops each wire bonded to and looping from one end of one of the elongated thin film metal stripes over an adjacent portion of the toroidal transformer to the opposite end of an adjacent thin film metal stripe and wire bonded thereto to form the primary winding of the toroidal transformer, and also includes a plurality of elongated thin film metal film stripes adjacent to the input circuit means, a plurality of wire bond loops each wire bonded to and looping from one end of one of those metal film stripes over an adjacent portion of the toroidal transformer to the opposite end of an adjacent thin film metal stripe and wire bonded thereto to form the secondary winding of the toroidal transformer, wherein the first capacitor is located beneath the region bounded by the toroidal core.

18. The hybrid transformer of claim 17 wherein the toroidal transformer is a square toroidal transformer.

19. The hybrid integrated circuit of claim 17 wherein the ceramic substrate is suspended between first and second lead frame members, and wherein the input circuit means and output circuit means are disposed on lead frame members on opposite sides of the ceramic substrate.