Probe for sensing contact via acceleration

• US 4,780,963 A
• Filed: 04/12/1987
• Issued: 11/01/1988
• Est. Priority Date: 12/17/1984
• Status: Expired due to Fees

• Current Assignee: Nikon Corporation, Nikon Systems Inc. (Nikon Corporation)
• Original Assignee: Renishaw PLC
• Inventors: McMurtry, David R.
• Primary Examiner(s): Martin, Jr., William D.
• Application Number:
  US07/084,142
• Time in Patent Office: 569 Days
• Field of Search: 33/558, 33/561, 33/555, 33/556, 33/503, 33/504, 33/172 E, 33/169 R
• US Class Current: 33/558
• CPC Class Codes: G01B 7/002 Constructional details of contacts for gauges actuating one or more contacts G01B7/016 takes precedence
• CPC Class Codes: G01B 7/012 Contact-making feeler heads therefor

Abstract

A contact sensing probe is disclosed for use with a measuring machine or machine tool for measuring the dimensions of a workpiece. The probe comprises a housing within which a stylus holder is mounted on a kinematic support. A spring urges the stylus holder into a rest position on the support and yieldingly resists tilting or lifting of the stylus holder from the support when the stylus engages a workpiece. A sensing device in the form of an accelerometer is supported within the housing on the stylus holder to sense one of the effects of stylus engagement with the workpiece, and to produce a signal which is used to stop the machine and read the signal and read the coordinates of the instantaneous stylus position. The effects sensed in different embodiments of the invention are, sudden lifting of the stylus holder due to physical displacement of the stylus, or the shockwave produced in the stylus on contact with the workpiece. A piezo-electric pressure transducer is used as a sensitive accelerometer for measuring the shock wave in a preferred embodiment.

Claims

1. A contact-sensing probe for use in apparatus for measuring the dimensions of a workpiece, comprising:

a fixed part adapted to be mounted in the apparatus;

a first movable part, including a stylus for engaging said workpiece during a measuring operation;

support means for supporting the first movable part in a rest position on the fixed part;

bias means for urging the first movable part into said rest position, the first movable part being displaceable from the rest position by a displacing force in opposition to the bias means, the bias means acting to return the first movable part to the rest position upon cessation of the displacing force;

a second movable part movable with respect to the first movable part, the second movable part bearing against the first movable part so as to allow transmission from the first movable part to the second movable part of a pressure wave caused by engagement of the stylus with said workpiece during a measuring operation; and

sensing means on the second movable part for sensing said engagement, said sensing means being sensitive to said pressure wave.

2. A contact-sensing probe according to claim 1, wherein the second movable part bears against the first movable part at a single point.

3. A contact-sensing probe according to claim 2, wherein the second movable part has a point which bears in a recess in the first movable part.

4. A contact-sensing probe according to claim 1, wherein the sensing means comprises a piezo-electric element.

5. A contact-sensing probe according to claim 1, wherein the urging force of said bias means is transmitted to the first movable part through the second movable part.

6. A contact-sensing probe according to claim 5, wherein the sensing means comprises a piezo-electric element and said urging force is transmitted through the piezo-electric element.

7. A contact-sensing probe according to claim 4, wherein the second movable part comprises two components and the piezo-electric element is sandwiched between said two components.

8. A contact-sensing probe according to claim 6, wherein the second movable part comprises two components and the piezo-electric element is sandwiched between said two components.