Current limited epld array
First Claim
Patent Images
1. An erasable programmable logic device comprising:
- a plurality of memory cells coupled to vrious input signal lines;
a first bit line coupled to a first side of each of said memory cells;
a second bit line coupled to a second side of each of said memory cells;
a sensing amplifier coupled to said first bit line such that said sensing amplifier monitors current flow on said first bit line;
current controlling means coupled to said second bit line wherein total current flow through said plurality of memory cells also flows through said sensing amplifier and said current controlling means;
said current controlling means also coupled to said sensing amplifier such that said current flow determines a drive of said current controlling means for maintaining a predetermined current limit on said current flow.
3 Assignments
0 Petitions
Accused Products
Abstract
An improved architecture for an EPROM PAL utilizing two bit lines is disclosed. The drains of the EPROM cells of a given column of an array are coupled together to a first bit line. The first line is coupled to a sensing circuit. The sources of the EPROM cells are coupled together to a second bit line which is then coupled through a current limiting transistor. The gate of the transistor is coupled to the first bit line to receive a feedback signal for controlling the current on the bit lines. The current limiting feature provides for shorter transition periods between "on" and "off" states which results in an improved speed performance of the device.
-
Citations
7 Claims
-
1. An erasable programmable logic device comprising:
-
a plurality of memory cells coupled to vrious input signal lines; a first bit line coupled to a first side of each of said memory cells; a second bit line coupled to a second side of each of said memory cells; a sensing amplifier coupled to said first bit line such that said sensing amplifier monitors current flow on said first bit line; current controlling means coupled to said second bit line wherein total current flow through said plurality of memory cells also flows through said sensing amplifier and said current controlling means; said current controlling means also coupled to said sensing amplifier such that said current flow determines a drive of said current controlling means for maintaining a predetermined current limit on said current flow. - View Dependent Claims (2, 3)
-
-
4. An erasable programmable logic device having a plurality of electrically programmable read only memory (EPROM) cell transistors, comprising:
-
a sensing amplifier coupled to a voltage source; a first bit line coupled to said sensing amplifier and to drains of said EPROM cells; a second bit line coupled to sources of said EPROM cells; a current limiting transistor coupled in series between said second bit line and a return for said voltage source wherein total current flow through said plurality of memory cell transistors also flows serially through said sensing amplifier and said current limiting transistor; said current limiting transistor having its gate coupled to said sensing amplifier for receiving a feedback signal which determines a gate drive of said current limiting transistor such that said current limiting transistor maintains a predetermined current limit of said current flow to control discharge of said first bit line which provides for a faster response speed of said memory cell transistors. - View Dependent Claims (5, 6)
-
-
7. In an erasable programmable logic device having a plurality of electrically programmable read only memory having a plurality of cells arranged in a row and column matrixed array wherein each column having cell transistors which have first sides coupled to a bit line which is coupled to a sensing amplifier and gates coupled to various input lines and improvement comprising:
a current controlling transistor coupled serially between second sides of said cell transistors and ground and having its gate drive coupled to monitor current flow on said bit line such that said current controlling transistor limits maximum value of said current flow on said bit line to a predetermined value, wherein control of said maximum value of said current controls discharge of said bit line which provides for a faster response speed of said cell transistors.
Specification