Inspection apparatus including photodetection and scanning apparatus

• US 4,797,558 A
• Filed: 04/28/1987
• Issued: 01/10/1989
• Est. Priority Date: 04/28/1986
• Status: Expired due to Term

• Current Assignee: SIRA Limited South Hill Chislehurst Kent BR7 5EH England
• Original Assignee: Siram SPA (Veolia Environnement SA)
• Inventors: West, Robert N.
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Allen, Stephone B.
• Application Number:
  US07/043,654
• Time in Patent Office: 623 Days
• Field of Search: 250/234-236, 250/563, 250/572, 350/6.7, 350/6.8, 356/431, 356/444
• US Class Current: 250/559.01
• CPC Class Codes: G01N 21/8901 Optical details; Scanning details per se G02B

Abstract

An inspection apparatus for inspecting, for example, sheet material, in which a beam of radiation 12 is scanned across a sheet 13 by means of a first facet 41 of a rotating mirror drum 22. Scattered radiation from the sheet is received by a second facet 46 and 2 is passed to a photodetector 49 for analysis.

Claims

1. Inspection apparatus comprising:

a radiation source;

a rotatable mirror scanner having a plurality of facets so that, as the mirror scanner rotates, it scans a beam of radiation from the radiation source across an object to be inspected by reflection from a suitably disposed facet of the mirror scanner; and

a plurality of radiation detector means, one of the radiation detector means receiving the central part of the beam of radiation, after it has been influenced by the object, via said suitably disposed facet of the mirror scanner, and another of the radiation detector means being positioned to receive radation scattered by the object and reflected by another facet of the mirror scanner.

2. Apparatus as claimed in claim 1 further including retroreflective material positioned so that the beam of radiation after scanning across said object is intercepted by said retroreflector material and retrorefracted back to the object and back to the mirror scanner.

3. Inspection apparatus for inspecting an object, comprising:

a laser for outputting a beam;

beam shaping means for shaping said beam from said laser;

a mirror scanner having a plurality of facets, the mirror scanner being rotable about an axis;

a plurality of optical focusing means; and

a plurality of photodetector means, wherein the beam shaping means is passed to a suitably disposed facet of the mirror scanner and rotation of said mirror scanner causes said facet to scan said beam across an object to be inspected, radiation influenced by the object and forming a central part of the returning beam being passed back from the object to the mirror scanner and being reflected by said suitably disposed facet to a first one of the plurality of optical focusing means and thence to a first one of the plurality of photodetector means, and radiation scattered by the object being passed back from the object to the mirror scanner and reflected by another facet of said mirror scanner to a second one of the plurality of optical focusing means and thence to a second one of the plurality of photodetector means.

4. Inspection apparatus comprising:

a radiation source;

a mirror scanner having a plurality of facets for scanning a beam of radiation from the radiation source across an object to be inspected by reflection from a suitably disposed facet of the mirror scanner;

retroreflector means positioned to receive radiation influenced by the object and to reflect said radiation back to the object so that the radiation is influenced again by the object, said radiation which has been twice influenced by the object being returned to the mirror scanner and being reflected by another facet; and

first radiation detector means positioned to receive radiation reflected by said another facet.

5. Apparatus as claimed in claim 4, further comprising second radiation detector means for receiving radiation influenced by the object, passed to the retroreflector, reflected from the retroreflector, and influenced again by the object, and reflected by said suitably disposed facet of the mirror scanner.

6. Apparatus as claimed in claim 5, further comprising second optical focusing means and second photodetector means, said second optical focusing means and said second photodetector means receiving radiation from the object reflected by said suitably disposed facet.

7. Inspection apparatus for inspecting an object, comprising:

a laser;

beam shaping means for shaping a beam from said laser and outputting a shaped beam;

a mirror scanner having a plurality of facets, the mirror scanner being rotatable about an axis;

first optical focusing means;

first photodetector means;

wherein the shaped beam is passed to a suitably disposed facet of the mirror scanner and rotation of said mirror scanner causes said facets successively to scan the beam across an object to be inspected; and

retroreflector means positioned to receive radiation influenced by the object, said retroreflector means reflecting the radiation back to the object and thence back to the mirror scanner, reflected radiation being reflected by another facet of the mirror scanner to the optical focusing means and thence to the first photodetector means.

8. Apparatus as claimed in claim 7, further comprising second optical focusing means and second photodetector means, said second optical focusing means and second photodetector means receiving radiation from the object reflected by said suitably disposed facet.