X-ray imaging particularly adapted for low Z materials

• US 4,799,247 A
• Filed: 06/20/1986
• Issued: 01/17/1989
• Est. Priority Date: 06/20/1986
• Status: Expired due to Term

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Annis, Martin, Bjorkholm, Paul J.
• Primary Examiner(s): Fields, Carolyn E.
• Assistant Examiner(s): Hynds, Joseph A.
• Application Number:
  US06/876,632
• Time in Patent Office: 942 Days
• Field of Search: 378/86, 378/87, 378/88, 378/89, 378/99, 378/90, 378/57, 378/62
• US Class Current: 378/87
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G21K 5/10 with provision for relative movement of beam source and object to be irradiated

Abstract

An imaging device for increasing the ability to recognize, in x-ray produced images, materials of low atomic number. A flying spot scanner illuminates an object to be imaged in a raster pattern; the flying spot repeatedly sweeps a line in space, and the object to be imaged is moved so that the illuminating beam intersects the object. At least a pair of x-ray detectors are employed, each pair associated with signal processing apparatus and a display. The two detectors employed (and the associated electrons and display) are selected from a set of three which includes a transmitted detector located at the line in space which is repeatedly traversed by the pencil beam, a forward scatter detector which is located further from the x-ray beam than the object to respond to photons scattered by the object being illuminated out of the path of the beam, and a back scatter detector which is located closer to the x-ray source than the object being imaged and also arranged to detect photons scattered out of the beam path by the object. In another embodiment of the invention all three detectors and their associated electronics/displays are employed.

Claims

1. A projection imaging system for inspecting objects for highlighting low Z materials comprising:

(a) a source of penetrating radiation,

(b) means for forming radiation emitted by said source into a beam of predetermined cross-section and for repeatedly sweeping said beam across a line in space,

(c) means for moving said object to be imaged relative to said source in a direction perpendicular to said line in space,

(d) first radiant energy detector means located to be responsive to radiant energy penetrating said object and emerging from said object, substantially unchanged in direction, for producing first electrical signals,

(e) second radiant energy detector means located further from said source than said object and responsive to radiant energy scattered by said object for producing second electrical signals,

(f) third radiant energy detector means located closer to said source than said object and responsive to radiant energy scattered by said object for producing third electrical signals,

(g) display means responsive to at least a pair of said electrical signals for separately, independently and simultaneously displaying said pair of electrical signals as a function of time.

2. The system of claim 1 in which said display means is responsive to all said electrical signals to separately, independently and simultaneously display said electrical signals as a function of time.

3. The system of claim 1 or 2 in which said first radiant energy detector means includes a radiant energy detector with a dimension of an effective active region substantially identical to one dimension of said beam cross-section, and in which either said second or third radiant energy detector means includes a radiant energy detector with all dimensions of an effective active region substantially larger than any dimension of said beam cross-section.

4. The system of claim 3 in which both said second and third radiant energy detector means include radiant energy detectors with all dimensions of effective active regions substantially larger than any dimension of said beam cross-section.

7. The system of any of claims 1, 5 or 6 in which said source has an intensity within a range of about 30 Kev to about 100 Kev.

8. The system of any of claims 1, 5 or 6 which further includes record/playback means coupled between any of said radiant energy detector means and said display means for recording signals produced by any of said radiant energy detector means at one time to generate a record and for playing back said record to drive said display means at another time.

5. A projection imaging system for inspecting objects for highlighting low Z materials comprising:

(a) a source of penetrating radiation,

(b) means for forming radiation emitted by said source into a beam of predetermined cross-section and for repeatedly sweeping said beam across a line in space,

(c) means for moving said object to be imaged relative to said source in a direction perpendicular to said line in space,

(d) first radiant energy detector means located further from said source than said object and responsive to radiation energy scattered by said object for producing first electrical signals,

(e) second radiant energy detector means located closer to said source than said object and responsive to radiant energy scattered by said object for producing second electrical signals,

(f) display means responsive to said electrical signals for separately, independently and simultaneously displaying said first and second electrical signals as a function of time.

6. The system of claim 5 wherein both said first and second radiant energy detector means include radiant energy detectors with dimensions of effective active regions substantially larger than any dimension of said beam cross-section.