Metrological apparatus

• US 4,807,152 A
• Filed: 03/02/1987
• Issued: 02/21/1989
• Est. Priority Date: 03/04/1986
• Status: Expired due to Term

• Current Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Original Assignee: Rank Taylor Hobson Limited
• Inventors: Lane, Hugh R., Onyon, Peter D.
• Primary Examiner(s): MACDONALD, ALLEN R
• Application Number:
  US07/020,436
• Time in Patent Office: 722 Days
• Field of Search: 364/474, 364/475, 364/167-171, 364/513, 364/560, 901/9, 901/10, 901/44, 901/46, 318/568, 318/578, 33/1 M, 33/1 N, 33/169 R, 33/503
• US Class Current: 700/247
• CPC Class Codes: G01B 7/008 using coordinate measuring machines
• CPC Class Codes: G01B 7/282 for measuring roundness
• CPC Class Codes: G01B 7/345 for measuring evenness

Abstract

Metrological apparatus, particularly for measuring form, has a turntable 4 and a transducer 14 and associated stylus 12 mounted so that the tip 12a of the stylus is displaceable radially and vertically relative to the turntable 4. The problem of obtaining both high resolution and large range of operation is solved by using a transducer/stylus 12,14 having a resolution of 12 nanometers and a range of only 0.4 mm and mounting the transducer 14 on an arm 10 which is driven radially and/or vertically by a computer 30 in response to the output from the transducer 14 to cause the stylus 12 to follow the workpiece surface. High resolution data defining the rotary position of the turntable 4 and the radial and vertical position of the transducer 14 is provided by a photodetector/optical grating arrangement 23, 21, 31; 27, 19, 43 and associated interpolators 42, 44, 46. A novel computer architecture comprising a host 22, master 30 and slaves 33, 35, 37 provides an efficient system for controlling the apparatus and gathering data. Efficient gathering of data is further assisted by the provision of means to cause the stylus 12 to traverse the surface of the workpiece at a constant speed, particularly as a function of the radial position of the transducer.

Claims

1. Metrological apparatus comprising rotatable member means for receiving a workpiece;

first drive means for rotating said member means, sensor means for sensing the surface of a workpiece on the rotatable member means during rotation thereof, means for supporting said sensor for movement relative to said member means, second drive means for effecting said movement of said sensor means and digital computer means for receiving signals derived from said sensor, controlling relative movement between said workpiece and said sensor in response to said signals such that said sensor means follows curvature in said workpiece surface and said sensor traverses said workpiece surface at a speed which is substantially constant, and providing metrological data in dependence both on said signals and on said movement of said sensor.

2. Apparatus according to claim 1, wherein said supporting means includes means for supporting said sensor means for movement in a substantially radial direction relative to said rotatable member means.

3. Apparatus according to claim 2, wherein said sensor means includes means for sensing form of a workpiece in a radial plane relative to said rotatable member and said computer means includes means responsive to said signals derived from said sensor means for controlling said second drive means to move said sensor means in said substantially radial direction so that said sensor means follows said workpiece surface.

4. Apparatus according to claim 1, wherein said supporting means includes means for supporting said sensor means for movement in a substantially axial direction relative to said rotatable member means.

5. Apparatus according to claim 4, wherein said sensor means includes means for sensing form of a workpiece in a plane substantially parallel to the axis of said rotatable member and said computer means includes means for controlling said second drive means in response to said signals derived from said sensor means to move said sensor means in said substantially axial direction to cause said sensor means to follow said workpiece surface.

6. Apparatus according to claim 1, wherein said supporting means includes means for supporting said sensor means for movement in both substantially radial and substantially axial directions relative to said rotatable member means.

7. Apparatus according to claim 6, wherein said sensor means includes selectively operable means having a first condition and a second condition for sensing workpiece form in a radial plane in said first condition or sensing workpiece form in an axial plane in said second condition, and said computer means includes means for controlling the movement of the sensor means in the radial direction when said sensor means is in said first condition or in the axial direction when said sensor means is in said second condition.

8. Apparatus according to claim 7, wherein said sensor means comprises a stylus having a tip engageable with the workpiece surface and a transducer responsive to deflection of said stylus in a single plane to produce said signals, and means for rotating said transducer and stylus together for changing from said first condition to said second condition.

9. Apparatus according to claim 1, wherein said digital computer means includes means for controlling said first drive means in response to said signals derived from said sensor means such that said sensor follows said workpiece surface.

10. Apparatus according to claim 1, wherein said sensor means includes means for providing an output signal substantially linearly related to surface variations sensed thereby.

11. Apparatus according to claim 10, wherein said computer means includes means for controlling said second drive means to maintain said sensor means stationary until the output signal thereof exceeds a predetermined threshold.

12. Apparatus according to claim 10, wherein said computer means includes means for providing said metrological data by storing signals representing the position of the sensor means when the output thereof has a predetermined value.

13. Apparatus according to claim 1, wherein said sensor means has a resolution better than 20 nanometers.

14. Apparatus according to claim 13, wherein said sensor means can resolve to 12 nanometers.

15. Apparatus according to claim 14, wherein said sensor means is adapted to sense form variations of up to 0.4 mm.

16. Apparatus according to claim 1, wherein said computer means includes means for resolving the position of the sensor means in at least one direction to within 500 nanometers.

17. Apparatus according to claim 16, wherein the position of the sensor means in at least one direction is resolved to within 200 nanometers.

18. Apparatus according to claim 1, wherein said computer means includes means for resolving to within 5 arc seconds.

19. Apparatus according to claim 1, wherein the sensor means is adapted to resolve to less than 20 nanometers, and said computer means includes means for resolving the position of the sensor means in the radial and axial directions to within one micron and the rotary position of the workpiece receiving member means to within 100 arc seconds.

20. Apparatus according to claim 1, wherein the sensor is adapted to resolve to less than 20 nanometers, and said computer means includes means for resolving the position of the sensor in the radial direction to within 200 nanometers and in the axial direction to within 500 nanometers and the rotary position of the workpiece receiving member to within 5 arc seconds.

21. Apparatus according to claim 1, wherein said computer means includes means for recording positional data at substantially fixed time intervals during said substantially constant speed traverse.

22. Apparatus according to claim 1, including detector means for detecting respectively the rotary position of the workpiece receiving member and the position of the sensor, said computer means further being responsive to said detector means.

23. Apparatus according to claim 22, including interpolator means responsive to said detector means for deriving from said detector means positional data having a resolution higher than that provided by said detector means.

24. Apparatus according to claim 1, wherein said computer means comprises a plurality of slave computer means each for controlling a respective different said drive means, and master computer means for supplying instructions to said slave computers.

25. Apparatus according to claim 24 wherein said computer means includes an additional computer means for transferring information between said master computer means and said slave computer means.

26. Apparatus according to claim 24, wherein said computer means includes manually operable data input means for receiving manually input data and host computer means connected to said data input means for supplying to said master computer means instructions to perform specified measuring operations in response to data input by said manually operable data input means.

27. Apparatus according to claim 24, wherein said computer means comprises a further computer means for recording said metrological data.

28. Apparatus according to claim 1, wherein said computer means includes means for performing a cylindricity measurement by causing the sensor to traverse a helical path or paths over a workpiece.

29. Apparatus according to claim 1, wherein said computer means includes means for performing a conicity measurement by causing said sensor to traverse a spiral path over a workpiece surface.

30. Apparatus according to claim 1, wherein said computer means including means for performing a flatness measurement by causing said sensor to traverse a spiral path over a workpiece surface.

31. Metrological apparatus comprising workpiece support means for supporting a workpiece, sensor means for sensing the surface of a workpiece on said support means and providing data, a plurality of drive means for effecting relative movement between a workpiece on said support means and said sensor means so that said sensor means traverses the surface of the workpiece, host computer means having data input means for the input of instructions for performing a required measuring operation, said host computer means including means for performing calculations on data obtained with the aid of said sensor means, master computer means for receiving from said host computer instructions defining a metrological operation to be performed, and a plurality of slave computer means for controlling respective different ones of said drive means, said master computer means including means for sending to said slave computers instructions, dependent upon the metrological operation to be performed, to control said drive means for the performance of said operation.

32. Apparatus according to claim 31, further including additional computer means for logging data obtained during said metrological operation and for transmitting said logged data to said host computer means.

33. Apparatus according to claim 31, wherein said master computer means includes means for receiving information from the sensor means and information as to the position of the sensor.

34. Metrological apparatus comprising a rotatable member means for receiving a workpiece, first drive means for rotating said member means, sensor means for sensing the surface of a workpiece on the rotatable member means during rotation thereof, means for supporting said sensor means for movement relative to said workpiece receiving member means, second drive means for effecting said movement of said sensor, and digital computer means for receiving signals derived from said sensor means, providing metrological data and controlling said drive means in response to said signals derived from said sensor means to cause said sensor means to traverse the surface of the workpiece at a substantially constant speed.

35. Metrological apparatus comprising support means for supporting a workpiece, sensor means for sensing the surface of a workpiece on the support, drive means for effecting relative movement between the workpiece support and the sensor means so that the workpiece surface is traversed by the sensor means, means connected to the sensor for providing metrological data, and control means connected to the sensor and the drive means for controlling the drive means, said control means including means responsive to signals derived from the sensor means to effect a variation in speed of the drive means so that the sensor means follows curvature in the workpiece surface, said control means further including means for varying the speed of operation of said drive means so that the speed at which the sensor means traverses said surface is maintained substantially constant.

36. Metrological apparatus comprising:

a first support and means for supporting a workpiece on said first support;

a second support;

means for mounting said first and second supports for relative rotation about an axis of rotation through said first support;

a third support carried by said second support and movable relative to said second support;

further drive means for effecting movement of said third support relative to said second support;

a transducer;

a stylus carried by said transducer for actuation thereof, said stylus having a tip, said tip being disposed substantially on a radius relative to said axis of rotation, said moement of said third support means relative to said second support means providing movement of said tip in directions parallel to and radially of said axis of rotation;

rotary means for mounting said transducer on said third support for arcuate movement relative thereto between a first operative position in which said stylus extends substantially parallel to said axis of rotation and a second operative position in which said stylus extends substantially transverse to said axis of rotation, said arcuate movement being substantially centered at said stylus tip so that said tip is in substantially the same position for each of the operative positions of said transducer for a given position of said third support; and

computer means for controlling said drive means to cause said apparatus to perform a metrological operation in which said stylus tip traverses a portion of a workpiece surface.

37. Apparatus according to claim 36, wherein said rotary means includes an element mounted on said third support for pivotal movement about a pivot axis at substantially 45°

to a plane which is normal with respect to said axis of rotation, said transducer being carried by said element at a position spaced from said pivot axis so that pivotal movement of said element about said pivotal axis through 180°

moves said transducer from said first operative position to said second operative position.

38. Apparatus according to claim 36, wherein said transducer includes means for sensing deflection of said stylus in a single plane relative to said transducer and wherein said transducer is rotatable to adjust the orientation of said single plane relative to a workpiece on said first support means.