Circumferentially compensating eddy current probe with alternately polarized transmit coils and receiver coils

• US 4,808,924 A
• Filed: 02/19/1987
• Issued: 02/28/1989
• Est. Priority Date: 02/19/1987
• Status: Expired due to Term

• Current Assignee: Atomic Energy of Canada Limited (Government of Canada)
• Original Assignee: Atomic Energy of Canada Limited (Government of Canada)
• Inventors: Cecco, Valentino S., Sharp, F. Leonard, McIlquham, Richard
• Primary Examiner(s): Strecker, Gerard R.
• Application Number:
  US07/016,752
• Time in Patent Office: 740 Days
• Field of Search: 324/219-221, 324/225, 324/232, 324/242, 324/243
• US Class Current: 324/220
• CPC Class Codes: G01N 27/9006 Details, e.g. in the structure or functioning of sensors
• CPC Class Codes: G01N 27/904 with two or more sensors

Abstract

An eddy current probe capable of detecting defects independent of orientation, with complete circumferential coverage in tubes, tubes under support plates, etc., is disclosed. The probe employs multiple coils, operating in transmit-receive mode, in which alternate coils are electromagnetically polarized in opposite directions. The probe detects localized defects and eliminates concentric variations.

Claims

1. A circumferentially compensating eddy current probe for detecting localized flaws in a tube having a central axis and made of an electrically conductive material, while compensating for circumferential structural variations therein, comprising

a first coil assembly and second coil assembly;

the said first coil assembly having an even number of substantially identical first coils to be located adjacent to the tube under inspection and symmetrically about and in a first plane perpendicular to the central axis, the said first coils having axes which form an angle θ

₁, with the said central axis and alternate first coils being electromagnetically polarized in two opposite directions along their axes;

transmitter energizing means coupled to said first coil assembly for energizing the said first coil assembly;

the said second coil assembly having the same even number of substantially identical second coils to be located adjacent to the tube under inspection and symmetrically about and in a second plane perpendicular to the central axis, the said second coils having axes which form an angle θ

₂ with the said central axis and alternate second coils being electromagnetically polarized in two opposite directions along their axes; and

receiver sensing means coupled to said second coil assembly for sensing current generated in the said second coil assembly;

the said first coil assembly and the said second coil assembly being angularly displaced from each other about the said axis to position each of the coils in one of the coil assemblies at midpoint of two adjacent coils in the other of the coil assemblies;

so that when energized, the said first coil assembly generates magnetic fields in the tube in the said two opposite directions of the coils and the said second coil assembly senses distortions in the magnetic fields and produces a circumferentially compensated output indicating essentially the presence of localized flaws in the tube.

2. The eddy current probe according to claim 1 wherein:

the angles θ

₁ and θ

₂ are each selected from a group of angles consisting of 0° and

90°

.

3. The eddy current probe according to claim 1 wherein:

the angle θ

₁ is selected from a group consisting of 0° and

90°

; and

the angle θ

₂ is an angle between approximately 30° and

60°

.

4. The eddy current probe according to claim 2 wherein:

the said first and the said second planes are axially spaced from each other by a predetermined distance d₁ selected from a group of distances expressed by d₁ =0 and d₁ ≧

d₀ where d₀ is the diameter of the larger of the first coils and the second coils.

5. The eddy current probe according to claim 2 wherein:

the said first and the said second planes are axially spaced from each other by a predetermined distance d₁, and partial magnetic shield means of a thickness t is provided therebetween, the distance d₁ ≧

d₀ +t where d₀ is the diameter of the larger of the first coils and the second coils and t is substantially equal to the standard depth of penetration δ

of the generated magnetic fields.

6. The eddy current probe according to claim 3 wherein:

the said first and the said second planes are axially spaced from each other by a predetermined distance d₁ expressed by d₁ ≧

2 d₀, where d₀ is the diameter of the larger of the first and the second coils.

7. The eddy current probe according to claim 4 wherein:

the said even number of the first and the second coils is a number selected from a group consisting of 2, 4, and 6; and

the first and the second coil assemblies are provided on a probe housing to be freely movable along the central axis inside the tube.

8. The eddy current probe according to claim 5 wherein:

the said even number of the first and the second coils is a number selected from a group consisting of 2, 4, and 6; and

the first and the second coil assemblies are provided on a probe housing to be freely movable along the central axis inside the tube.

9. The eddy current probe according to claim 6 wherein:

the said even number of the first and the second coils is a number selected from a group consisting of 2, 4, and 6; and

the first and the second coil assemblies are provided on a probe housing to be freely movable along the central axis inside the tube.

10. The eddy current probe according to claim 7 further comprising:

a second pair of coil assemblies including third and fourth coil assemblies;

the said second pair being identical to the first pair but spaced axially therefrom by a distance d₁ greater than 2 d₀ and rotated about the central axis with respect to the first pair.

11. The eddy current probe according to claim 8 further comprising:

a second pair of coil assemblies including third and fourth coil assemblies;

the said second pair being identical to the first pair but spaced axially therefrom by a distance d₁ greater than 2 d₀ and rotated about the central axis with respect to the first pair.

12. The eddy current probe according to claim 9 further comprising:

a second pair of coil assemblies including third and fourth coil assemblies;

the said second pair being identical to the first pair but spaced axially therefrom by a distance d₁ greater than 2 d₀ and rotated about the central axis with respect to the first pair.