Process and device for the generation of a linearly dependent measurement signal

• US 4,815,847 A
• Filed: 03/09/1987
• Issued: 03/28/1989
• Est. Priority Date: 03/08/1986
• Status: Expired due to Fees

• Current Assignee: Gruen Optik Wetzlar GmbH
• Original Assignee: Gruen Optik Wetzlar GmbH
• Inventors: Oberheim, Wolfgang, Hadeishi, Tetsuo
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US07/023,497
• Time in Patent Office: 750 Days
• Field of Search: 356/307, 356/308, 356/310, 356/326, 356/328, 356/315, 356/319
• US Class Current: 356/307
• CPC Class Codes: G01N 2021/3111 using Zeeman split
• CPC Class Codes: G01N 21/3103 Atomic absorption analysis

Abstract

A process which extends the measurement range of Zeeman atomic absorption spectroscopy by linearization of the calibration curve in the region of relatively high sample concentration. The intensities of the Zeeman components Iπo, Iσo, Iπ and Iσ are measured before entry into the measurement cell and after absorption by the measurement sample and are associated according to the formula ##EQU1##

Claims

1. A process for the generation of a measurement signal, which is a linear function of the numerical density Nx of absorbing atoms or molecules in a sample volume, with a Zeeman atomic absorption spectrometer, in which the spectral lamp generating the measurement beam is disposed in a magnetic field, comprising the steps of:

(a) splitting the measurement beam in the magnetic field into Zeeman components π and

σ

;

(b) isolating partial beams from the measurement beam before entry into the sample volume and measuring the intensities Iπ

o and Iσ

o of the Zeeman components from said partial beams;

(c) after passage of the measurement beam through the sample volume measuring from said measurement beam the intensities Iπ and

Iσ

of the Zeeman components;

(d) generating a measurement signal from the measured intensities Iπ

o, Iσ

o, Iπ and

Iσ

according to one of the following formulas (1) and (2);

##EQU6##

2. A process as recited in claim 1 wherein said measurement signal is Mx defined as ##EQU7## and said process further includes the steps of, performing steps (a)-(d) without a sample in the sample volume wherein the resulting measurement signal is defined as Mo and

performing steps (a)-(d) with a sample of known numerical density wherein the resulting measurement signal is defined as Mc.

3. A measuring device for the generation of a measurement signal Mx, which is a linear function of the numerical density Nx of absorbing atoms or molecules in a sample volume, with a Zeeman atomic absorption spectrometer, in which the spectral lamp generating the measurement beam is disposed in a magnetic field, comprising:

(a) first means, disposed in a path of the measurement beam prior to said sample volume for isolating partial beams of π and

σ

polarization components generated by the magnetic field;

(b) second means, disposed after the measurement beam passes through said sample volume for splitting the measurement beam into partial beams of π and

σ

polarization components;

(c) a photoelectric detector, associated with each of the partial beams, for generating a signal as a function of the intensity of each associated partial beam;

(d) circuit means for generating logarithmic ratio signals formed as a logarithmic ratio for pairs of said intensity signals; and

(e) a difference circuit connected to receive said logarithmic ratio signals for generating an output signal Mx which is a linear function of the numerical density Nx in the sample volume.

4. A measuring device as recited in claim 3, wherein said circuit means includes:

(a) first circuit means for generating a signal proportional to ln(Iπ

o/Iσ

o) where Iπ

o and Iσ

o are the intensity signals corresponding to the partial beams of said first means, and

(b) second circuit means for generating a signal proportional to ln(Iπ

/Iσ

) where Iπ and

Iσ

are the intensity signals corresponding to the partial beams of said second means, and

wherein said difference circuit generates Mx defined as ##EQU8##

5. A measuring device as recited in claim 3, wherein said circuit means includes:

(a) first circuit means for generating a signal proportional to ln(Iσ

/Iσ

o) where Iσ

o and Iσ

are the intensity signals of the σ

components corresponding to the partial beams of said first and second means respectively, and

(b) second circuit means for generating a signal proportional to ln(Iπ

/Iπ

o) where Iπ

o and Iπ

are the intensity signals of the π

components corresponding to the partial beams of said first and second means respectively, and

wherein said difference circuit generates Mx defined as ##EQU9##