Optical wave guide band edge sensor and method

• US 4,822,135 A
• Filed: 08/07/1987
• Issued: 04/18/1989
• Est. Priority Date: 08/07/1987
• Status: Expired due to Fees

• Current Assignee: George Seaver
• Original Assignee: George Seaver
• Inventors: Seaver, George
• Primary Examiner(s): Lee, John D.
• Application Number:
  US07/083,691
• Time in Patent Office: 620 Days
• Field of Search: 356/73.1, 350/96.29, 250/227, 250/231 R, 73/800
• US Class Current: 385/13
• CPC Class Codes: G01D 5/268 using optical fibres G01D5/28 - G01D5/38 take precedence
• CPC Class Codes: Y10S 359/90 Methods

Abstract

An optical wave guide sensor which comprises: a broad-band, radiant energy source; an optical wave guide, such as an optical fiber, rectangular slab or thin film, having a guiding interface and an inlet an outlet, the inlet receiving the radiant energy and the wave guide deformable from one part to another of the guide; and a spectral intensity detector at the wave guide outlet to measure the change in the wavelength of the energy critically reflected from the guiding interface on deformation of the wave guide. A method of measuring the deformation of an optical wave guide and/or a parameter causing such deformation, which method comprises: measuring the change in the mode band edge critical wavelength of the first, second or higher mode of the radiant energy throughput of the wave guide as a function of the deformation of the wave guide.

Claims

1. An optical guided wave band edge sensor for the determination of the deformation of an optical wave guide, which sensor comprises:

(a) an optical wave guide means which comprises an optical slab or film having an inlet and an outlet to provide a guided optical path for radiant energy and which wave guide means has a known guiding interface and wherein one part of said interface is physically deformable relative to another part of said interface;

(b) a broad-band, radiant energy means to provide radiant energy to the inlet of the optical wave guide means;

(c) means to deform physically the optical wave guide means; and

(d) detecting means to detect continuously the change in the mode critical wavelength of the first, second or higher order, mode from the output of the optical wave guide means in relationship to the change in physical deformation of the optical wave guide means.

2. The sensor of claim 1 wherein the optical wave guide means comprises a single mode optical guiding slab or film.

3. The sensor of claim 1 wherein the detecting means comprises means to measure continuously the change in spectral intensities with wavelength.

4. The sensor of claim 1 wherein the detecting means comprises a spectrographic detector means to measure the spectral intensities output from the wave guide means and which spectrographic detector means comprises a dispersing prism or a diffraction grating, a focusing lens means and a charged, coupled device wherein such means gives the spectral intensity output of the wave guide as a function of wavelength, said spectral intensities subsequently being divided by the input broad-band source spectral intensities, and the resulting normalized spectral intensity output exhibiting an abrupt change in intensity at a particular wavelength, such wavelength being the critical wavelength.

5. The sensor of claim 1 wherein the means to deform includes:

(a) a cam of increasing curvature;

(b) a diaphragm for measuring pressure in which the pressure acts upon said diaphragm;

(c) the diaphragm positioned on movement to deform the optical wave guide means against said cam to cause a change in the critical wavelength with a change in pressure and thereby providing a sensing means for measuring pressure.

6. The sensor of claim 1 wherein the means to deform includes:

(a) a jaw means containing teeth; and

(b) a diaphragm for measuring pressure in which the pressure acts upon the said diaphragm, the diaphragm positioned on movement to force the teeth of the jaw means against the optical wave guide means and to deform the optical wave guide means to cause change in the critical wavelength with a change in pressure thereby providing a sensing means for measuring pressure.

7. The sensor of claim 1 wherein the means to deform includes:

a bourdon tube means to measure pressure and wherein the bourdon tube means is positioned to deform the optical wave guide means and to change the critical wavelength with a change in pressure in the bourdon tube thereby providing a sensing means for measuring pressure.

8. The sensor of claim 1 wherein the means to deform includes:

a bimetallic means to measure temperature, the bimetallic means positioned to affect deformation of the optical wave guide means when the bimetallic means changes position due to changes in temperatures thereby providing a means to measure the temperature by the change in the critical wavelength with the change in temperature.

9. The sensor of claim 1 wherein the means to deform includes:

(a) a cam of monotonically changing radius of curvature and wherein said radiant energy source means is secured to and launched into said optical wave guide means at the inlet end and acts as a pendulum; and

(b) wherein the optical wave guide means is threaded over the said cam, which cam acts as the pivot of said pendulum and wherein the outlet end of the optical wave guide means is secured to the detecting means whereby as the cam rotates from a vertical and horizontal alignment the optical wave guide means is deformed to cause a change in the critical wavelength thereby providing a sensing means for measurement of the angle of inclination to the vertical.

10. A sensor apparatus for the determination of selected parameters, which apparatus comprises:

(a) an optical wave guide means which comprises a single mode optical fiber having an inlet and an outlet to provide a guided optical path for radiant energy and having a known guiding interface and wherein one part of said optical fiber and said interface is physically deformable relative to another part;

(b) a broad-band radiant energy means to provide radiant energy to the inlet of the optical wave guide means;

(c) moveable means to deform physically the optical wave guide, the movement of said means related to a selected parameter to be measured; and

(d) detecting means to detect continuously from the output of the optical wave guide means the change in the critical wavelength of the radiant energy through the change in physical deformation of the optical wave guide means and thereby to measure the selected parameter to be measured.

11. A method for measuring the extent of physical deformation of an optical wave guide which provides a guided optical path for radiant energy and having a known guiding interface and an inlet and an outlet for the radiant energy which method comprises:

(a) passing radiant energy through the optical wave guide from the inlet to the outlet;

(b) deforming physically at least a portion of the optical wave guide and the guiding interface to provide a change in the critical wavelength of the radiant energy in the optical wave guide; and

(c) detecting continuously the change in the critical wavelength at the outlet of the optical wave guide as a function of the physical deformation of the optical wave guide.

12. The method of claim 11 wherein the optical wave guide comprises a single mode optical fiber and which includes measuring the change in the critical wavelength caused by the change in the curvature of the optical fiber.

13. The method of claim 11 which includes detecting the change in the critical wavelength by measuring the change in the spectral intensity of the wavelengths from the output of the optical wave guide.

14. The method of claim 11 which includes placing the optical wave guide in a mechanical relationship with a mechanical means to measure a defined parameter and measuring the extent of physical deformation of the optical wave guide due to the change in mechanical position between the optical wave guide and the mechanical means as a determination of the parameter to be measured, thereby allowing the conversion of mechanical measurement systems to a remotely detected optical system.

15. The method of claim 14 which includes employing as the mechanical means a bimetallic element for the measurement of temperature and detecting the change in critical wavelength as a measure of the change in temperature.

16. The method of claim 14 which includes:

employing as the mechanical means a diaphragm or bourdon tube element to measure pressure and detecting the change in critical wavelength as a measure of the change in pressure.

17. The method of claim 14 which includes:

employing as the mechanical means a cam of changing radius of curvature and detecting the change in critical wavelength as a measure of the angle of the optical wave guide inclination to the vertical.

18. The method of claim 11 wherein the optical wave guide comprises a single mode optical fiber.