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Signal processing method for an electromagnetic induction test

  • US 4,823,082 A
  • Filed: 02/11/1987
  • Issued: 04/18/1989
  • Est. Priority Date: 02/18/1986
  • Status: Expired due to Fees
First Claim
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1. A signal processing method in an electromagnetic induction test for detecting defects, physical quantities and geometric quantities in a surface of a test object in which said test object is subjected to an electromagnetic induction by use of N(N≧

  • 1) kinds of test frequencies to obtain M(M≦

    2N) kinds of phase detection outputs corresponding to respective states of the test object said method comprising the steps of;

    sampling the phase detection outputs at a plurality of measuring points, so that when there exists n(n<

    M) kinds of disturbance factors of which a portion contribute to the electromagnetic induction test, said phase detection outputs have a variance due to said defects, physical quantities and geometric quantities greater than a variance of a target parameter of the test object and contribute to the electromagnetic induction test;

    determining a first coordinate axis Z1 in a direction in which said variance of said phase detection outputs approaches a maximum in an M-dimensional space formed from coordinate axes associated with the M kinds of the phase detection outputs;

    determining a second coordinate axis Z2 in a direction in which said variance of said phase detection outputs approaches a maximum in a space orthogonal to the coordinate axis Z1 of the multi-dimensional space;

    similarly determining a third coordinate axis Z3, a fourth coordinate axis Z4, . . . , and an M-th coordinate axis Zm in directions in which said variance of said phase detection outputs approaches a maximum in a space orthogonal to the previously named axis of the multi-dimensional space; and

    determining a presence or an absence of a defect, a physical quantity and a geometric quantity on a surface or in the vicinity of the test object related to the coordinate of the Zn+1 axis for each measuring point.

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