Fabry-perot interferometer

• US 4,825,262 A
• Filed: 06/11/1987
• Issued: 04/25/1989
• Est. Priority Date: 10/16/1985
• Status: Expired due to Term

• Current Assignee: British Telecommunications (BT Group Plc) (BT Group PLC)
• Original Assignee: British Telecommunications PLC (BT Group PLC)
• Inventors: Mallinson, Stephen R.
• Primary Examiner(s): Willis, Davis L.
• Assistant Examiner(s): Koren, Matthew W.
• Application Number:
  US07/080,468
• Time in Patent Office: 684 Days
• Field of Search: 356/352, 356/345, 73/655, 73/657, 73/205
• US Class Current: 356/454
• CPC Class Codes: G01D 5/266 by interferometric means G01D5/353 takes precedence
• CPC Class Codes: G01J 3/26 using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
• CPC Class Codes: G02B 26/001 based on interference in an adjustable optical cavity interference filters G02B5/28; devices or arrangements using multiple reflections in spectrometry or monochromators G01J3/26
• CPC Class Codes: G02B 6/2817 using reflective elements to split or combine optical signals
• CPC Class Codes: G02B 6/29358 Multiple beam interferometer external to a light guide, e.g. Fabry-Pérot, etalon, VIPA plate, OTDL plate, continuous interferometer, parallel plate resonator G02B6/29347, G02B6/29349, G02B6/2935, G02B6/29361 take precedence; resonator evanescently coupled to light guide G02B6/29335
• CPC Class Codes: G02B 6/32 having lens focusing means positioned between opposed fibre ends with lens being an integral part of the single fibre end G02B6/262
• CPC Class Codes: G02B 6/3516 the reflective optical element moving along the beam path, e.g. controllable diffractive effects using multiple micromirrors within the beam
• CPC Class Codes: G02B 6/357 Electrostatic force electrostatic forces controlling reflecting elements in general G02B26/0841
• CPC Class Codes: G02B 6/3803 Adjustment or alignment devices for alignment prior to splicing
• CPC Class Codes: G02B 6/423 using guiding surfaces for the alignment
• CPC Class Codes: H01S 3/1055 one of the reflectors being constituted by a diffraction grating
• CPC Class Codes: H01S 5/141 using a wavelength selective device, e.g. a grating or etalon H01S5/146 takes precedence
• CPC Class Codes: Y10S 359/90 Methods

Abstract

A Fabry-Perot interferometer comprises a single crystal silicon substrate (1) with an integrally formed diaphragm (6) supported between walls (2-5). A glass superstrate (14) is mounted adjacent the substrate (1) with a spacer (13) sandwiched therebetween. Facing surfaces (12, 16) of the diaphragm (6) and superstrate (14) are polished and suitably coated to define reflective surfaces and the position of the diaphragm may be altered to vary the response of the interferometer.

Claims

1. A Fabry-Perot interferometer having two reflective surfaces in which one of the reflective surfaces is provided on a diaphragm mounted by a hinge assembly to a support wherein the diaphragm and the hinge assembly are integral with the support, and the support, diaphragm and hinge assembly are made form a single crystal.

2. An interferometer according to claim 1, wherein the crystal is silicon.

3. An interferometer according to claim 1, further comprising control means responsive to control signals to cause the diaphragm to move relatively to the support towards and away from the other reflective surface.

4. An interferometer according to claim 3, wherein the control means comprises a pair of electrodes for connection in a control circuit for generating an electrostatic field.

5. An interferometer according to claim 1 or 2 wherein the other reflective surface is formed on a superstrate adjacent a substrate on which said diaphragm is formed.

6. An interferometer according to claim 5, wherein a spacer is positioned between the substrate and superstrate.

7. An interferometer according to claim 5, wherein the superstrate comprises glass.

8. A method of modulating a beam of radiation, the method comprising causing the beam to impinge on a Fabry-Perot interferometer according to claims 1 or 2 and causing the diaphragm to oscillate between two positions in response to control signals, whereby in one position the beam is transmitted through the interferometer while in the other position the beam is not transmitted.

9. An interferometer according to claim 2 wherein the hinge assembly comprises four bridges defining an aperture of substantially square cross section within which the diaphragm is suspended.

10. An interferometer according to claim 5 further comprising control means responsive to control signals to cause the diaphragm to move relatively to the support towards and away from the other reflective surface.

11. A Fabry-Perot interferometer comprising:

a first partially reflective member;

a second partially reflective member disposed parallel to the first member and adjustably disposed with respect thereto so as to permit variable dimensioning of an optical Fabry-Perot interferometer cavity formed therebetween; and

an at least partially transparent electrode means disposed on each of said members for electrostatically controlling said variable dimensioning as a function of an electrical signal impressed across said electrode means.

12. An interferometer as in claim 11 wherein said second partially reflective member comprises a single crystal substrate having:

a reflective diaphragm integrally and hingedly connected within a central aperture to outer surrounding walls.

13. An interferometer as in claim 12 wherein said first partially reflective member comprises:

a superstrate bonded to said walls and located opposite said diaphragm.

14. An interferometer as in claim 13 wherein said superstrate is bonded to said walls via an intermediately located spacer.

15. An interferometer as in claim 11 further comprising an electrical contact pad electrically connected to each of said electrodes and also electrically connected to control said variable dimensioning in response to provided control signals.