Method and apparatus for measuring the monocrystal diameter and the melt level during crucible drawing in the Czochralski process
First Claim
1. A method of measuring the diameter of monocrystals and controlling the melt level during crucible drawing of the Czochralski type wherein the brightness profile at the melt/monocrystal change-over point is determined by an optical system having an observation axis under an acute angle to an axis of the monocrystal and the spatial position of the brightness profile in relation to a reference point on a display device is indicated, said method comprising the steps of:
- optically scanning the melt-monocrystal change-over point by rotating a mirror about a horizontal axis;
applying the optical beam reflected by the rotating mirror to a row of photo-sensitive elements in parallel with the horizontal axis;
periodically retrieving the measured values from the row of photo-sensitive elements in synchronism with the rotation of the mirror thereby to produce a plurality of scan lines;
analyzing the outputs corresponding to the brightness profile in each scan line to determine intensity maxima of the scan line that corresponds to the direction of view onto a diameter of the monocrystal that passes through the melt-monocrystal change-over point, the distance between said intensity maxima in the selected scan line representing the said crystal diameter;
applying the analyzed output signals for at least said selected scan line to the display device; and
controlling the level of the molten material in the crucible by comparing the position of the selected scan line with a predetermined position and providing a signal proportional to the difference to a crucible-lifting mechanism for reducing said difference.
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Abstract
A method and apparatus for measuring the diameter of a monocrystal during crucible drawing determines the brightness profile at the melt/monocrystal change-over point. The spacial position of maxima in the brightness profile in relation to a reference point indicates the diameter. The brightness profile is obtained by optically scanning the melt/monocrystal change-over point with a mirror rotating about a horizontal axis, applying the optical beam reflected by the rotating mirror to a row of photosensitive elements in parallel with the axis, and analyzing the outputs corresponding to the brightness profile for determining the diameter.
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Citations
14 Claims
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1. A method of measuring the diameter of monocrystals and controlling the melt level during crucible drawing of the Czochralski type wherein the brightness profile at the melt/monocrystal change-over point is determined by an optical system having an observation axis under an acute angle to an axis of the monocrystal and the spatial position of the brightness profile in relation to a reference point on a display device is indicated, said method comprising the steps of:
optically scanning the melt-monocrystal change-over point by rotating a mirror about a horizontal axis;
applying the optical beam reflected by the rotating mirror to a row of photo-sensitive elements in parallel with the horizontal axis;
periodically retrieving the measured values from the row of photo-sensitive elements in synchronism with the rotation of the mirror thereby to produce a plurality of scan lines;
analyzing the outputs corresponding to the brightness profile in each scan line to determine intensity maxima of the scan line that corresponds to the direction of view onto a diameter of the monocrystal that passes through the melt-monocrystal change-over point, the distance between said intensity maxima in the selected scan line representing the said crystal diameter;
applying the analyzed output signals for at least said selected scan line to the display device; and
controlling the level of the molten material in the crucible by comparing the position of the selected scan line with a predetermined position and providing a signal proportional to the difference to a crucible-lifting mechanism for reducing said difference.
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2. A method of controlling the melt level and measuring the diameter of the monocrystal being drawn vertically from the melt in a Czochralski type crystal drawing process in a crucible wherein the brightness profile at the melt/monocrystal change-over point is observed, the position of the melt/monocrystal change-over point changing as the monocrystal is drawn from the melt, and the spatial position of maxima in the brightness profile is determined in relation to a reference point for measuring the diameter of the monocrystal indicated thereby, said method comprising the steps of:
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optically scanning at least one of the monocrystal and melt at least to the melt/monocrystal change-over points; positioning only one row of photo-sensitive elements horizontally to receive the optical scanning; intermittently obtaining the response of the row of photo-sensitive elements to the optical scanning, thereby producing a plurality of scan lines; processing the responses of the row of photo-sensitive elements in each scan line to identify a scan line corresponding to the direction of view onto a diameter of the monocrystal that passes through the melt/monocrystal change-over point, and the responses of the individual photo-sensitive elements in the identified scan line of the row to identify maxima therein; and controlling the level of the molten material in the crucible by comparing the position of the selected scan line with a predetermined position and providing a signal proportional to the difference to a crucible-lifting mechanism for reducing said difference; whereby the spatial position of the individual photo-sensitive elements producing the maxima in the identified scan line indicates the diameter at the melt/monocrystal change-over point without variation from the position of melt/monocrystal change-over point and whereby the position of the selected scan line indicates the level of the molten material. - View Dependent Claims (3, 4, 5, 6, 7, 8, 9, 10)
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11. Apparatus for controlling the melt level and measuring the diameter of a monocrystal being drawn vertically from the melt in a crucible using the Czochralski process, wherein the brightness profile at the melt/monocrystal change-over point is observed, the position of the melt/monocrystal change-over point changing as the monocrystal is drawn from the melt, and wherein the spatial position of maxima in the brightness profile is determined for measuring the diameter of the monocrystal indicated thereby, said apparatus comprising:
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only one horizontal row of photo-sensitive elements; means for directing an optical scan of at least the monocrystal change-over point onto the row of photo-sensitive elements; means for intermittently obtaining the responses of the row of photo-sensitive elements to the optical scan, thereby producing a plurality of scan lines; means for processing the response of the row of photo-sensitive elements to identify a scan line corresponding to the direction of view onto a diameter of the monocrystal that passes through the melt/monocrystal change-over point and the responses of the individual photo-sensitive elements in the identified scan line of the row to identify intensity maxima therein; and means for controlling the level of the molten material in the crucible by comparing the position of the identified scan line with a predetermined position and providing a signal proportional to the difference to a crucible-lifting mechanism for reducing said difference; whereby the spatial position of the individual photo-sensitive elements producing the maxima in the identified scan line indicates the diameter at the melt-monocrystal change-over point without variation from the position of melt/monocrystal change-over point and whereby the position of the selected scan line indicates the level of the molten material. - View Dependent Claims (12, 13, 14)
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Specification